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Silvaco 新闻与新闻稿

自 2019 年 1 月以来,Silvaco 已发布 77 篇新闻稿,内容涵盖客户、合作伙伴、产品和公司动态。最近一篇于 2026 年 8 月 18 日发布,宣布与 Dassault Systèmes 建立合作伙伴关系。

Silvaco 最新新闻

客户采用、合作伙伴关系、产品发布和公司公告,无论您关注的是 AI
驱动制造还是 AI 驱动设计业务,都可在此获取相关信息。

季度业绩和 SEC 申报文件同样属于 Silvaco 新闻。这些内容可在
investors.silvaco.com 查看,其中 2026 年第二季度财务业绩于 2026 年 8 月 6 日发布。

869 篇文章
May 29, 2026
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Silvaco at DAC 2026

Silvaco邀您相约DAC 2026 2026年7月26日-29日 地点:长滩会议中心 | 展位号:1155 Silvaco诚邀您莅临DAC展会,与我们一同见证半导体设计领域的创新实践。欢迎光临我们的展位,了解我们在AI驱动设计、建模及IP解决方案方面的最新进展与突破。 特色技术 Utmost — AI 驱动的 SPICE 模型提取与特征化工具 快速生成精确、可直接用于设计的紧凑模型,大幅缩短开发周期。 Utmost能将工艺与器件数据高效转入可靠的SPICE模型,确保仿真与实际硅片特性高度一致,同时显著减少人工调参、降低模型不确定性,并避免成本高昂的重复流片。 Jivaro / Viso — AI 驱动的寄生参数与模拟分析解决方案…
April 27, 2026
Simulation Standard

利用AI驱动的FTCO加速下一代功率技术发展

我们最新一期的 Simulation Standard 探讨了Silvaco的AI驱动型制造技术协同优化 (FTCO™) 平台通过结合规模化仿真、智能实验设计和机器学习代理模型,如何变革功率器件开发工作流程,并以pGaN HEMTs、垂直型GaN和SiC DMOS技术为实例进行演示讲解。
February 3, 2026
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SURGE Virtual Event Japan 2026

SURGE Virtual Event Japan 2026 Archive Now Available Silvaco SURGE unites the semiconductor development and design community to explore how Silvaco’s simulation…
January 21, 2026
Simulation Standard

赋能下一代高压功率器件:从仿真到系统的氧化镓沟槽肖特基二极管

β-Ga₂O₃有望彻底变革高压功率转换领域,其超低损耗和高临界电场特性使之成为下一代功率器件的理想选择[1],能够为AI数据中心供电、可再生能源系统[2]、高压断路器和静电放电保护[3]提供1–6 kV、0.5–0.8 kA范围内的三相高压直流的AC/DC和DC/AC转换方案。
January 21, 2026
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SURGE Virtual Event North America 2026

SURGE Virtual Event North America 2026 Archive Now Available Silvaco SURGE unites the semiconductor development and design community to explore how Silvaco’s…
January 13, 2026
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SURGE Virtual Event EMEA 2026

SURGE Virtual Event EMEA 2026 Archive Now Available Silvaco SURGE unites the semiconductor development and design community to explore how Silvaco’s simulation…
December 18, 2025
Simulation Standard

Victory TCAD 2025 软件版本发布

凭借四十余年的深厚积淀,Silvaco 发布的 Victory TCAD™ 2025 版本,再次引领 TCAD 领域的创新浪潮。该版本在仿真引擎、求解器性能、物理模型以及面向大规模 3D 应用的多物理场工作流程方面均实现了重大提升。
September 21, 2025
Simulation Standard

功率MOSFET动态测试

本文演示了如何应用Silvaco TCAD工具套件,对平面型碳化硅MOSFET(DMOS)实现从工艺制程到电路分析的全流程仿真。
August 15, 2025
Simulation Standard

阻抗场与低信号噪声

低信号电气噪声不可避免,其成因在于器件内部过程的随机波动,例如热波动导致的载流子密度微观变化,以及产生-复合速率的统计波动。 此类噪声可能干扰电路预期行为,因此建模器件产生的噪声至关重要。了解噪声在器件中的具体产生位置亦具有重要意义,这有助于设计低噪声器件。Victory Device采用阻抗场法进行噪声计算。
August 15, 2025
Simulation Standard

在 Victory Process 的蒙特卡洛离子注入中使用 Trajectory Replication

Victory Process中的蒙特卡洛离子注入是固体结构的工艺仿真中实现物理上精确的浓度分布的重要工具。该蒙特卡洛算法通过模拟粒子从注入窗口进入用户所定义的结构后的运动路径进行建模工作。粒子在结构内移动时,通过与材料相互作用不断损失能量,直至停止运动或发生背散射。要获得统计波动较小且浓度分布连续(平滑)的结果,通常需要耗费大量计算时间。Trajectory Replication的目标是通过将粒子在结构某区域的运动路径复制到其他区域,在保持浓度分布平滑度的同时有效减少总体计算时间。为实现物理上精确的结果,复制操作必须满足明确定义的条件,本文将对相关条件进行阐述。在具体介绍复现流程的细节之前,我们将先讨论蒙特卡洛离子注入程序中的若干重要概念。
January 28, 2025
Simulation Standard

虚拟量测新工具简介:Victory Extract

Victory Extract是Silvaco在2024基准版本软件中推出的一个新工具,它统一了几款软件中的提取工具(DeckBuild的extract、Victory Process的extract3d和Victory Mesh的extract3d),并引入了一些新的量测功能。
September 23, 2024
Simulation Standard

基于双脉冲法的IGBT开关仿真

我们将在本期为您介绍一种基于DPT的仿真方法,来研究IGBT器件的瞬态开关特性。文章还提供了一套使用Silvaco TCAD仿真工具评估功率器件开关特的标准模板和方法,所用的仿真代码可参考2024基准版本的示例Silicon_Power_ex17。
August 28, 2024
Simulation Standard

2024 TCAD基准版本软件发布

第一部分:Victory Process——2024基准版本中的新功能 第二部分:Victory Device——2024基准版本中的新功能 第三部分:Victory DoE——2024基准版本中的新功能
July 5, 2024
Webinars

将人工智能应用于FTCO<sup>TM</sup>

TCAD Webinars
2024年7月25日 FTCO基于实际生产工艺中的物理和化学机制,利用人工智能(AI)和机器学习(ML)生成精确的TCAD数字模型(数字孪生)。对于这种数字孪生模型,可以采用DoE方法进行测试和分析,而无需真实流片,从而大大节省了制造相关的时间和费用。
January 10, 2024
POST

Si、GaN和SiC功率器件的SPICE建模

Modeling WebinarsTCAD Webinars
2024年2月8号 我们将为您介绍不同制造工艺的功率器件,包括Si、GaN和SiC器件,分析它们的特点和优势,并分享其SPICE建模的各种方法和挑战。
September 1, 2023
Simulation Standard

Numerical Algorithm to Perform Viscoelastic Analysis

Numerical Algorithm to Perform Viscoelastic Analysis Viscous materials exhibit both viscous and elastic characteristics when undergoing deformation. The response of such materials…
August 2, 2023
Simulation Standard

2023 TCAD Baseline Release

New Features in the 2023 Baseline Release: Section 1: Process Simulation – New Features in 2023 Baseline Release Section 2: Device Simulation…
July 29, 2022
Simulation Standard

2022 TCAD Baseline Release

New Features in the 2022 Baseline Release: Section 1: Process Simulation – New Features in 2022 Baseline Release Section 2: Device Simulation…
June 17, 2022
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Join Us at DAC 2022

Join Us at DAC 2022 Join us at 2022 Design Automation Conference where we will highlight the company’s wide range of semiconductor…
October 20, 2021
Silvaco

Strategic Account Manager

Location: Seattle/Bellevue, WA - Boston, MA - Phoenix/San Diego, CA As a Strategic Account Manager at Silvaco, you will be responsible for…
July 22, 2021
Simulation Standard

2021 TCAD Baseline Release

New Features in 2021 Baseline Release: Section 1: Process Simulation Section 2: Device Simulation Section 3: Victory Mesh Section 4: Parasitic Extraction
May 12, 2021
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2021 TSMC Worldwide Technology Symposium

Welcome! Thank You for visiting our virtual booth at the 2021 TSMC Worldwide Technology Symposium. We hope you found the information useful…
March 4, 2021
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GOMAC 2021

Welcome! Thank You for visiting our booth at GOMAC 2021. We hope you found the information useful and informative. Enter drawing to…
February 24, 2021
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RF Algorithm Engineer

Location: Moscow, Kiev Ukraine, UK, Grenoble Silvaco is one of a few providers of highly sophisticated software for electronic circuit simulation. With…
January 12, 2021
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Etching & Deposition Software Engineer

Location: United Kingdom, Grenoble France, Vienna Austria, Germany, Boston, MA, Duluth, GA, and Santa Clara, CA. As a member of the TCAD…
October 28, 2020
Custom Blogs

Customer Interview: Why I Rely on SmartSpice

SPICE Blogs
Martin Mallinson is an experienced analog circuit designer with multiple patents. Over his 40-year career, his audio designs have been used in…
October 26, 2020
POST

Application Engineer, SPICE Modeling

Location Atlanta, GA Silvaco seeks an experienced Application Engineer with a strong background in electrical device measurement and characterization, and in SPICE…
October 26, 2020
POST

Simulate 40X Faster with SmartSpice HPP

SPICE Webinars
In this webinar, we describe how SmartSpice HPP takes advantage of the modern multicore hardware platforms to speed up all internal aspects of transient…
October 1, 2020
Simulation Standard

TCAD Simulation of CBRAM Devices

Conductive Bridge Random Access Memory (CBRAM) is a non-volatile memory device technology that can operate by consuming very low power. Another advantage…
May 21, 2020
POST

Using SmartSpice Compact Models

Modeling WebinarsSPICE Webinars
June 11, 2020 | 10:00 am – 10:30 am (PDT) This webinar will provide a guide to developing Compact Models in SmartSpice…
March 30, 2020
POST

Accelerating Design with the Victory TCAD Suite

TCAD Blogs
The Simulation Standard, Silvaco’s technical journal for semiconductor process and device engineers is beginning its 30th year of publication. The latest issue…
February 26, 2020
Technical Libraries

Nanoscale Devices

Nanoscale DevicesTCAD Published Papers
Nanoscale Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. P. Blaise,1,2 “Ab Initio…
February 26, 2020
Technical Libraries

Solar Cells

Solar CellsTCAD Published Papers
Solar Cells The full text for most of these papers may be found at the IEEE website at www.ieee.org. Samy Almosni,[a,b] Ludmila Cojocaru,[a] Debin Li,[c] Satoshi…
February 26, 2020
Technical Libraries

MEMS

MEMSTCAD Published Papers
MEMS The full text for most of these papers may be found at the IEEE website at www.ieee.org. Yonghyun Shim, Member, IEEE, Jean-Pierre…
February 26, 2020
Technical Libraries

Memory Devices

TCAD Published Papers
Memory Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. Daewoong Kang, Hyungcheol Shin,…
February 26, 2020
Technical Libraries

Optoelectronics

OptoelectronicsTCAD Published Papers
Optoelectronics The full text for most of these papers may be found at the IEEE website at www.ieee.org. H. Matsuura, S. Sakurai, Y.…
February 26, 2020
Technical Libraries

Radiation, SEU and Reliability

Radiation, SEU and ReliabilityTCAD Published Papers
Radiation, SEU and Reliability The full text for most of these papers may be found at the IEEE website at www.ieee.org. Takashi Kameshima,…
February 26, 2020
Technical Libraries

Power Device Simulation

Power Devices SimulationTCAD Published Papers
Power Device Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Viviana Cerantonio, Marcello…
February 26, 2020
Technical Libraries

ESD Simulation

ESD SimulationTCAD Published Papers
ESD Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Guido Notermans, Olivier Quittard,…
February 26, 2020
Technical Libraries

Organic Device Technology

Organic Device TechnologyTCAD Published Papers
Organic Device Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. Debin Li, “Recent…
February 26, 2020
Technical Libraries

Interconnect Simulation

Interconnect SimulationTCAD Published Papers
Interconnect Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Keh-Jeng Chang, Jyh-Jeng Chou,…
February 26, 2020
Technical Libraries

SOI Technology

TCAD Published Papers
SOI Technology The full text most of these papers may be found at the IEEE website at www.ieee.org. Ali A. Orouji, Hamid Amini…
February 26, 2020
Technical Libraries

TFT Technology

TCAD Published PapersTFT Technology
TFT Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. Yu-Shien Shiah1, Kihyung Sim1, Yuhao…
February 26, 2020
Technical Libraries

Compound Devices

Compound DevicesTCAD Published Papers
Compound Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. N. Seoane1, M. Aldegunde1,…
February 26, 2020
Technical Libraries

CMOS Technology

CMOS TechnologyTCAD Published Papers
CMOS Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. T Uchino1, 2, E Gili1,…
February 26, 2020
Technical Libraries

Process Simulation

Process SimulationTCAD Published Papers
Process Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Guriqbal Singh Josan, Archana…
December 14, 2019
POST

TCAD Recommended Textbooks

TCAD Textbooks
CMOS: Mixed-Signal Circuit Design, Second Edition R. Jacob Baker. Published Wiley-IEEE Press, 2nd Edition. Published 2009, pp. 330 ISBN 978-0-470-29026-2 Understanding Modern…
December 12, 2019
POST

IP Solutions for Secure Autonomous Driving

SIPware Webinars
IP Solutions for Secure Autonomous Driving This webinar will present the risks and necessary countermeasures for securing cyber-physical vehicle systems. Manufacturers are…
October 25, 2019
POST

How TCAD Can Optimize Power Electronics

TCAD Blogs
The power electronics (PE) market is growing rapidly, driven by the accelerating demand of EV and HEV vehicles. Power devices lend themselves…
October 24, 2019
Custom Blogs

SmartSpice Does It Smart

By this definition, any SPICE simulator qualifies as a smart design tool, but what about versatility? SmartSpice has had over 30 years…
July 11, 2019
POST

Silvaco SIPware Automotive IP

SIPware Webinars
Silvaco SIPware Automotive IP Silvaco has partnered with semiconductor leaders like NXP, Infineon and TI to offer a comprehensive portfolio of automotive…
April 6, 2019
Custom Blogs

Six-Sigma Analysis of Digital Standard Cells

library of digital standard cells implements both Boolean logic and sequential storage functions. These foundation IPs are used extensively and repeatedly within…
April 1, 2019
Technical Libraries

Bipolar Technology

Bipolar TechnologyTCAD Published Papers
Bipolar Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. A. S. Zoolfakar, N.…
January 15, 2019
Webinars for Display Week

TCAD Solution for Flexible Display

TCAD Webinars
January 15, 2018 In this webinar, we review the basic elements of device design for flexible displays, including the key factors affecting…
January 1, 2019
Simulation Standard

3D TFT Simulation of Grains and Grain Boundaries

Introduction Low-temperature polycrystalline silicon (LTPS) thin-film transistors have been widely applied to AMOLED (Active Matrix Organic Light Emitting Diode) as the most…
December 11, 2018
POST

Bandstructure Effects in Nano Devices

TCAD Webinars
Bandstructure Effects in Nano Devices&Examples Using NEMO5 As semiconductor device and circuit engineers we traditionally think of band edges and effective masses…
December 6, 2018
POST

SPICE Modeling for Flexible Electronics

Modeling WebinarsTCAD Webinars
SPICE Modeling for Flexible Electronics Flexible electronics has an exciting potential for enabling bendable, rollable and foldable displays, smart product labeling as…
November 29, 2018
POST

MIPI I3C

SIPware Webinars
MIPI I3C LEARN ABOUT MIPI I3C ALLIANCE STANDARD This webinar will provide a discussion of a new a standard from the MIPI…
October 1, 2018
Simulation Standard

Dynamic Analysis of Liquid Crystal Pixels

We have demonstrated in previous articles the static electrical and optical simulation of LC cells [1][2]. The last piece of the function…
August 21, 2018
POST

How FPD Designers Can Improve Productivity

TCAD Webinars
This webinar will provide a discussion about new features of Silvaco’s Layout Editor tool (Expert) for improving design productivity on FPD layout.
July 12, 2018
Custom Webinars

Standard Cell Layout Migration and Optimization

Library Webinars
Standard Cell Layout Migration and Optimization This webinar will present an efficient methodology for migrating and optimizing standard cell libraries. Foundation IP…
April 12, 2018
POST

Subsystem Insight

SIPware Webinars
Subsystem Insight Debugging Silvaco Subsystems with IAR Embedded Workbench Silvaco and IAR Systems have teamed up to provide software solutions for Silvaco’s…
February 18, 2018
POST

SPI vs SPI

SIPware Webinars
SPI vs SPI This webinar will provide a discussion of Silvaco’s SPI, QSPI, and OSPI IP products and how they are useful…
October 1, 2017
Simulation Standard

W-element Field Solvers

In connection with the reduction in the size of electronic elements and the increase in operating frequencies, it becomes necessary to transmit…
October 1, 2017
Simulation Standard

SmartSpice Shared Mode API

SmartSpice API, shared mode, was developed in order to provide an easy to use solution for products requiring the analog SPICE core…
October 1, 2017
Simulation Standard

TCAD Simulation of GaN-based Vertical FETs (HEMTs)

Gallium nitride (GaN)-based devices have entered the power electronics market and are showing excellent progress in the medium power conversion application [1]-[5].…
July 1, 2017
Simulation Standard

TCAD Simulations of TFET and Tunneling Diode

Researchers and designers are looking into a future of ultra-low power and ultra-low voltage (ULV) devices and designs. Portable devices, nodes, and…
July 1, 2017
Simulation Standard

TFT Panel Simulation Using SmartSpice Pro

TFT panels have already gained their undisputable reputation in a variety of professional and commercial applications. High quality, ease of customization, and…
May 16, 2017
POST

Accelerating TFT and FPD Design

TCAD Webinars
Accelerating TFT and FPD Design This webinar will provide an overview of different techniques for TFT and FPD design enabled by the…
March 23, 2017
Custom Webinars

Secrets of Parasitic Extraction Unveiled

Secrets of Parasitic Extraction Unveiled! Parasitic extraction is a mandatory step for physical design sign off, and at advanced nodes, parasitics substantially…
January 1, 2017
Simulation Standard

Thermo-mechanical Stress in Through-Silicon-Vias

During the last several years, the enhancement of integrated circuits (ICs) performance and power consumption have contributed to the continual scaling down…
April 1, 2016
Simulation Standard

Soft Error

A soft error in the context of this article, can be defined as an unintended change in electrical state of a device…
January 1, 2016
Simulation Standard

Blue LED Simulation

It is very important to understand the operation and underlying physics of InGaN/GaN materials based electronic device in modern display industry such…
January 1, 2016
Simulation Standard

a-IGZO TFT Simulation

The flat panel device for active matrix liquid crystal displays (AMLCDs) and active matrix organic light-emitting diode displays (AMOLEDs) has utilized a…
December 16, 2015
POST

Solar cell modeling using TCAD and SPICE

Modeling WebinarsSPICE WebinarsTCAD Webinars
Solar Cell Modeling Using TCAD and SPICE In this webinar a review of the TCAD-to-SPICE simulation flow of solar cells and solar…
September 29, 2015
Custom Webinars

Power Integrity and Reliability Analysis

Power Integrity and Reliability Analysis This webinar will provide an overview of Silvaco’s power integrity and reliability analysis tool, InVar. InVar’s concurrent…
September 29, 2015
Custom Webinars

Power Integrity and Reliability Analysis

Power Integrity and Reliability Analysis This webinar will provide an overview of Silvaco’s power integrity and reliability analysis tool, InVar. InVar’s concurrent…
July 1, 2015
Simulation Standard

Electrical Simulation of Liquid Crystals

Liquid Crystals (LCs) are state of matter intermediate between that of a crystalline and a liquid. The optical, mechanical, electrical and magnetic…
October 1, 2014
Simulation Standard

Mixed Mode Radiation Event Detector

A reversed biased PIN diode acts as a radiation event detector, sensing the occurrence of an ionizing radiation pulse, which is connected…
October 1, 2014
Simulation Standard

Displacement Damage

Two fundamental damage mechanisms take place when devices are exposed to particle fluences: ionization and lattice displacement or just displacement damage. Ionization…
March 27, 2014
POST

Leakage Current TCAD Calibration in a-Si TFTs

TCAD Webinars
Leakage Current TCAD Calibration in a-Si TFTs This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors…
July 1, 2013
Simulation Standard

2D IBC-SHJ Solar Cell Simulation and Optimization

Interdigitated back contact silicon heterojunction (IBC-SHJ) combines the advantages of interdigitated back contact (IBC) and silicon heterojunction (SHJ) solar cells. Having all…
April 1, 2013
Simulation Standard

The Extended Gaussian Disorder Model in Atlas

In this article the various enhancements to the organic device modeling that have been implemented recently in Atlas are presented. Following the…
April 1, 2012
Simulation Standard

3D TFT Simulation

Both flexible and touch panel displays have become popular for portable applications. To meet various functional requirements, system-on-panel (SOP) design has become…
October 1, 2010
Simulation Standard

How to Mesh in 2D TCAD

Meshing for process in ATHENA or electrical characterisation in ATLAS is one of the biggest challenges that a user faces. Poor meshing…
April 1, 2009
Simulation Standard

Simulating SiGe and Impurity Dependent Stress

The simulation of stress during device fabrication is becoming increasingly important and is often now deliberately introduced during fabrication to enhance device…
April 1, 2009
Simulation Standard

SONOS/SANOS Simulation in ATLAS

Semiconductor-Oxide-Nitride-Oxide-Semiconductor (SONOS) Non-Volatile memory structures can be simulated using ATLAS. The basic principle of these devices is the use of a charge…
November 1, 2006
Simulation Standard

Advanced Quantum Effects Simulation in Atlas

Introduction The trend toward smaller MOSFET devices with thinner gate oxide and greater doping is resulting in the increased importance of quantum…
June 1, 2005
Simulation Standard

Expert’s Netlist Driven Layout

Expert features a powerful Netlist Driven Layout (NDL) function to assist the user in creating a layout. It increases the productivity of layout…
June 1, 2005
Simulation Standard

Expert Parametric Wires

Expert Parametric Wire (Pwire) is a complex group of objects containing, a single wire named master wire, any number of subparts such as…
March 1, 2005
Simulation Standard

Expert: Wiring

The wiring tool in Expert automatically creates the shortest wire connecting two points specified by the user. The created wire goes around any existing…
March 1, 2005
Simulation Standard

Expert: Layout Versus Layout (LVL) Comparison

Introduction The functionality Silvaco’s Layou Editor, Expert, has recently been expanded with the new feature called Layout Versus Layout comparison (LVL). LVL is…
March 1, 2005
Simulation Standard

New Parasitic Capacitance Modeling in Hipex-C

In deep submicron technology, conduction layers have widths much smaller than their thicknesses (see Figure 1). This makes edge parasitic capacitance effects…
December 1, 2004
Simulation Standard

Cross-Sectional Viewer

Cross-Sectional Viewer is a tool in the Expert layout editor that simulates the cross-sections of ICs along an arbitrary drawn cut-line on the layout.…
October 1, 2004
Simulation Standard

A Sophisticated Verilog-A Debugger

During the elaboration of a Verilog-A model, debugging a module can be very useful for detecting non-physical behavior or fine-tuning the model. The SILVACO Verilog-A debugger…
October 1, 2004
Simulation Standard

Noise Simulations

If the MOS model file has the parameters: noia, noib, noic, Af, Kf and nlev=0 will SmartSpice ignore the BSIM III noise parameters (noia,…
September 1, 2004
Simulation Standard

EDIF Conversion Flow on Gateway

EDIF has been a vital part of the Electronic Design Automation (EDA) industry for many years and Gateway allows users to convert…
September 1, 2004
Simulation Standard

Hipex-CRC Parasitic RC-Network Reducer

Design of large scale chips requires precise knowledge of interconnect delays. However, detailed analysis of interconnects may quickly become computationally too expensive…
July 1, 2004
Simulation Standard

Silvaco’s RFIC Design Suite

This article focuses on the use of Silvaco’s RFIC Design Suite including PDK, SmartSpice-RF, and Gateway.
July 1, 2004
Simulation Standard

A Family Portrait of the BSIM Models

1. Introduction BSIM1, the first model of the BSIM series was released about ten years ago. Some major improvements have been made…
June 1, 2004
Simulation Standard

New Features in Expert Node Probing

Expert’s Node Probing is powerful tool for inspection of netlist components on layout. It is designed for highlighting layout objects electrically connected…
April 1, 2004
Simulation Standard

IBIS Models Now Supported in SmartSpice

Expert Parametric Wire (Pwire) is a complex group of objects containing, a single wire named master wire, any number of subparts such as…
March 1, 2004
Simulation Standard

Hierarchical Layout versus Schematic

A new Hierarchical Layout versus Schematic (HLVS) system that provides significant improvement in verification of huge circuits is described. Other of LVS…
March 1, 2004
Simulation Standard

Resistance Calculation Approach in Hipex-NET

Hipex-NET uses two techniques to calculate resistor values. First method of resistance extraction, which is usual for full chip netlist extractors and uses…
January 1, 2004
Simulation Standard

Remote ALTER processing

A new parallelization method has been implemented into SmartSpice. Now .ALTERs can be destributed not only over several CPUs (by using -P option),…
January 1, 2004
Simulation Standard

New SmartLIb Library of Models

In all previous versions of SmartSpice the model code (BSIM, diode etc.) was included in the one executable (SmartSpice ). This means any updates to…
January 1, 2004
Simulation Standard

BSIM4 Model Verilog-A Implementation

The Verilog-A hardware description language opens many areas to SPICE users in the field of compact models, allowing manufacturers and universities to…
January 1, 2004
Simulation Standard

Stress Effect Model in BSIM3v3 Model

Stress effect models are now implemented in major models such as BSIM4 or HiSIM. The need for evermore accurate models with a…
December 1, 2003
Simulation Standard

Guardian DRC vs. Other DRC Systems, I

1. Introduction This article begins a series of articles that describe the compatibility of Guardian DRC system[1] in terms of functionality: command set, syntax…
December 1, 2003
Simulation Standard

Schematic Driven Layout

Expert schematic driven layout (SDL) is a CAD tool which increases the productivity of layout design by automating cell generation and providing visual…
December 1, 2003
Simulation Standard

Interactive P-cell Generation

1. Abstract Parameterized cells (P-cells) significantly increase the productivity of layout designers. Silvaco International’s tool Expert has been designed to aid layout designers through…
October 1, 2003
Simulation Standard

IBIS Models in SmartSpice

The Input/Output Buffer Information Specification (IBIS) is a standard for electronic behavioral models based on I/V and V/T curve data. It is…
October 1, 2003
Simulation Standard

New Features in SmartSpice 2.3.4.C

A powerful new feature “Stop-Continue” has been added to SmartSpice to allow the user to suspend a transient simulation and investigate the…
October 1, 2003
Simulation Standard

Spectre® Replacement in the Cadence Flow

Silvaco has always supported the Solaris based Cadence design environment for seemless SmartSpice integration. To accommodate new customer demands to support the…
September 1, 2003
Simulation Standard

Parasitic Resistor Extraction with HIPEX-R

HIPEX-R is part of HIPEX software package for physical verification of multimillion transistor designs. It is a hierarchical full chip parasitic resistance…
September 1, 2003
Simulation Standard

Measurement of Spacing Checks in Guardian DRC

In previous versions of Guardian DRC there were only two ways of measuring the distance between two segments: the ordinary, Euclidean metric,…
June 1, 2003
Simulation Standard

Guardian DRC Edge Layer Operations

Recent versions of Guardian DRC introduce operations that involve edge layers, either on input or on output. An edge layer is a layer…
June 1, 2003
Simulation Standard

Guardian LVS: New Platform-Independent GUI

We introduce a platform-independent version of Guardian LVS. An important feature of any tool is its capability to operate on various platforms…
April 1, 2003
Simulation Standard

RPI VCSEL Model Released in SmartSpice

RPI VCSEL model was developed by Professor Michael Shur and his team from the Rensselaer Polytechnic Institute (RPI) [1]. A release of…
April 1, 2003
Simulation Standard

BSIM3v3 Model Verilog-A Implementation

Berkeley University BSIM3v3 model is the industry-standard, physics-based, deep-submicron MOSFET model for digital and analog circuit designs. This makes BSIM3v3 model a…
April 1, 2003
Simulation Standard

New Device Model Card Approach

Normally a single active device model is extracted to cover a range of device geometries and temperature. Sometimes this single scalable model…
March 1, 2003
Simulation Standard

Complex Parallel-Series Reduction

Silvaco’s Guardian LVS tool compares two circuits that are defined by their netlists. The comparison is based strictly on the topological structure…
March 1, 2003
Simulation Standard

Expert Editor Settings and Layer Cleaning

I generated some layers in Expert by DRC script run, and after that, derived layers can not be cleaned by "Tools\Derived Layers\Clean…
February 1, 2003
Simulation Standard

Exact2: Interconnect Parasitic Capacitance Simulator

Exact2 from Silvaco is a sophisticated, physically-based simulation tool for calculating semiconductor interconnect capacitance values. Its purpose is to build a capacitance…
February 1, 2003
Simulation Standard

Optical Lithography Models in ATHENA

ATHENA’s Optolith module is designed to simulate the 3 basic lithography technologies; contact printing, proximity and projection lithography. The imaging calculations within…
December 1, 2002
Simulation Standard

Real-time DRC Verification by DRC Guard

DRC Guard Performs "real-time" DRC on Expert Layout Editor. DRC Guard’s real-time design rule check (DRC) verifies entered or modified objects after the…
December 1, 2002
Simulation Standard

Actual Examples of Creating Parameterized Cells

Silvaco’s Expert tool is an extremely powerful layout-editing tool that supports features related to parameterized cells. Parameterized cells, often called P-cells, increase…
December 1, 2002
Simulation Standard

Connectivity Operations in Guardian DRC

The article "Connectivity options for DRC spacing check operations in Guardian" (Simulation Standard, vol. 11, no. 12) [1] describes layout netlist connectivity…
September 1, 2002
Simulation Standard

Expert Wiring Tool: Router at Hand

Modern complex circuit designs require automatic router functionality in circuit layout editors. In multi-layer hierarchical design, it is often necessary to build…
September 1, 2002
Simulation Standard

C++ Language Interface for Expert Layout Editor

The C++ interface for Silvaco’s Expert layout tool, is now an exclusive customization language that expands the tool’s handling of high-level customization,…
August 1, 2002
Simulation Standard

Simulating Boron Diffusion in Silicon Germanium

The silicon germanium heterojunction bipolar transistor (SiGe HBT) is a promising technology for combining the operating speed of compound material devices with…
June 1, 2002
Simulation Standard

Advanced Layout Editing Using XI-scripts

To provide uniform etching of metal, dummy metal rectangles can be placed over an unused area of the chip. The following script…
May 1, 2002
Simulation Standard

ATLAS Simulation of a Schottky Contact

ATLAS allows the user to define a contact with a number of different boundary conditions; ohmic, Schottky, current controlled, floating or reflecting. The…
April 1, 2002
Simulation Standard

Verilog-A Release in SmartSpice

We give in this article an introduction to the Verilog-A SmartSpice interface. This new feature in SmartSpice allows the user to write…
April 1, 2002
Simulation Standard

Multiple Linear Solvers Introduced in SmartSpice

Acknowledging the need for more flexibility, SmartSpice now provides three numerical methods for linear system solution. The additional solvers provide for greater…
April 1, 2002
Simulation Standard

BSIM4 RF CMOS Modeling with UTMOST III

The BSIM4 model provides a RF CMOS modeling capability. Prior to the BSIM4 model the RF modeling was accomplished by using macro…
March 1, 2002
Simulation Standard

Antenna Rule Checks in Savage

Antenna rules is a common name for rules that check ratios of amounts of material in two layers from the same node.…
March 1, 2002
Simulation Standard

Add Custom Commands to Expert’s Menu

A simple way to add custom commands to Expert's menu is implemented. It is possible to add menu items that execute xi-commands…
February 1, 2002
Simulation Standard

QUEST: Frequency-Dependent RLCG Extractor

Signals propagated in actual and future IC's interconnections are spreading, in terms of spectrum frequency, from DC to microwave domain because of…
December 1, 2000
Simulation Standard

Optimal Packing of Orthoblocks For ULSI Floorplanning

Virtually all latest and prospective enhancements of Expert Layout processor (for example, semi-automatic floorplanning) are based on sophisticated geometrical models. In some…
October 1, 2000
Simulation Standard

BSIM4_U ( BSIM4 Universal Routine )

This routine is a multitarget/geometry routine used to extract all kind of characteristics. There is the possibility to trace three different targets.…
September 1, 2000
Simulation Standard

Cross-Sectional Viewer in Expert

Cross-Sectional Viewer is a tool within Expert to simulate the cross sectional view of ICs along an arbitrary drawn cut-line on the layout. Cross-sectional Viewer is a…
July 1, 2000
Simulation Standard

UFSOI: Process-Based Compact SOI MOSFET Models

SOI technology appears now to have become an advantageous, viable option for low-voltage and high-performance CMOS integrated circuits in digital, analog, and…
June 5, 2000
Simulation Standard

Hints, Tips, and Solutions June 2000

Q: To simplify netlist extraction, I specify one kind of diffusion resistors in my layout by means of a special resistor definition layer.…
June 4, 2000
Simulation Standard

Parametric-Cells Implementation in Expert

A parameterized cell (P-Cell) is a cell with user-specified parameters. It is possible to create customized p-cell instances with different composition according…
June 3, 2000
Simulation Standard

Dragon DRC: Performance Improvement Techniques

Dragon DRC is a new advanced hierarchical DRC system. The design principles this system is based on are carefully selected to ensure that Dragon DRC…
June 2, 2000
Simulation Standard

Maverick and Guardian – Enhancements

The latest release of Layout versus Schematic tools from CELEBRITY CAD suite (Maverick full-chip parametric netlist extractor and Guardian hierarchical netlist comparator) delivers a number of significant…
June 1, 2000
Simulation Standard

Design Version Control System for Expert

The DVCS subsystem of CELEBRITY CAD suite provides significant improvement in management of complex designs, design reuse and teamwork management. The most important features…
May 4, 2000
Simulation Standard

Hints, Tips, and Solutions February 2000

Q. When I simulate my process flow the simulated profile is always lower than the SRP measurements. What could be causing this? A.…
April 28, 2000
Simulation Standard

Hints, Tips, and Solutions April 2000

Q. How can I extract VBIC bipolar model parameters using UTMOST III? A. UTMOST III Bipolar module can be utilized to extract and optimize the VBIC…
April 3, 2000
Simulation Standard

NEW RF MOSFET Small Signal SPICE Model

With the advent of ever increasing operation frequencies, Silvaco is introducing a new high frequency model for MOSFETs that will be implemented…
April 2, 2000
Simulation Standard

JFET/MESFET TRIQUINT Models (Level=5 and level=7)

Until now, SmartSpice has supported the TriQuint model designated TOM using the Level=5 model parameter. SmartSpice now supports the TriQuint-2 MESFET model designated TOM-2. This model…
March 3, 2000
Simulation Standard

Hints, Tips, and Solutions March 2000

Q: Usually, when I want to change the display of a drawing in the Drawing window, I select the Window pull-down menu in…
March 2, 2000
Simulation Standard

Scholar – SmartSpice Interface

One of the most useful features of the Scholar schematic capture is tight integration with the SmartSpice simulator. In effect, Scholar makes it possible to automatically generate SmartSpice netlist on…
March 1, 2000
Simulation Standard

Inter-Tool Communication Within CAD CELEBRITY

One of the main features of modern complex Computer-Aided Design Systems is the ability to support the communication between concurrently executing applications…
February 4, 2000
Simulation Standard

Hints, Tips, and Solutions February 2000

Q. How can I ensure that the vertical Y.MESH spacing in my process simulation is adequate for my particular implant condition? A. A good…
January 3, 2000
Simulation Standard

Hints & Tips January 1999

A. UTMOST III SOI module has three routines for characterization of the parasitic BJTs of SOI devices. These routines are "IC/VCE", "Gummel" and "INT_BJT"…
December 2, 1999
Simulation Standard

Hints & Tips December 1999

Q: I tried to resize shapes using the DRC command and observed thin "cracks" appeared for polygons with holes (see the left shape…
November 5, 1999
Simulation Standard

Hints & Tips November 1999

A: ATLAS/S-Pisces and ATLAS/Blaze both have a small signal ac analysis capability built into them. This analysis is based upon the work of S.Laux [1] and…
November 4, 1999
Simulation Standard

Modeling Bidirectional Thyristors Using ATLAS

Thyristors are semiconductor devices that exhibit multi-stable or bi-stable electrical characteristics, and can be switched between a high-impedance OFF state and a…
October 3, 1999
Simulation Standard

Hints & Tips October 1999

A. It is likely that there may be some contact problems or defected devices during the data collection. This problem can occur when…
September 2, 1999
Simulation Standard

Hints & Tips September 1999

Q: How can I cut exactly the same hole in many layers? A: There are at least two ways to do this.…
August 4, 1999
Simulation Standard

Hints & Tips August 1999

A: Modeling of the increase in breakdown voltage at elevated temperatures requires a model to describe the temperature dependence of the impact ionization…
August 2, 1999
Simulation Standard

New Thermionic Emission and Tunneling Models in ATLAS

In order to simulate heterojunction devices accurately, both the thermionic emission and tunneling mechanisms must be considered when calculating transport across hetrojunctions.…
July 3, 1999
Simulation Standard

Hints & Tips July 1999

The "Binning" routine in UTMOST III MOS module has been greatly enhanced. The bin models can be generated much faster and the routine requires…
July 1, 1999
Simulation Standard

New SOI UTMOST Module

Bulk CMOS is currently the dominant technology for VLSI integrated circuits but its scaling constraints pose ever greater as device geometries shrink.…
June 4, 1999
Simulation Standard

Hints & Tips May 1999

A. Previous articles in the Simulation Standard have highlighted the diffusion models required for accurate simulation of shallow source/drain junction formation[1] and…
June 2, 1999
Simulation Standard

Hints & Tips June 1999

Q: I want to draw several long wires, with precise positioning of both ends. I am used to doing this as follows:
April 3, 1999
Simulation Standard

Hints & Tips April 1999

A. The BSIM3_MG routine in SOI module of UTMOST III can be used to extract SOI model parameters. The SOI BSIM3_MG routine operation is similar…
March 3, 1999
Simulation Standard

Hints & Tips March 1999

Q: I often use the temporary reference point, but I would like to see both absolute coordinates and relative coordinates, without toggling the…
January 5, 1999
Simulation Standard

Hints & Tips January 1999

A. Typically, UTMOST III s-parameter module is used to measure the FT versus IC (collector current) characteristic of bipolar transistors. The FT_CE routine can also…
December 3, 1998
Simulation Standard

HINTS & TIPS – December 1998

Q: I took the example file mux4.gds from Expert's installation and tried the Edit-in-place operation. I entered into an instance of mux1,…
December 2, 1998
Simulation Standard

LISA Powerful Script language for Expert

This article introduces the LISA (Language for Interfacing Silvaco Applications) command language and gives an overview of LISA features.
November 5, 1998
Simulation Standard

HINTS & TIPS – November 1998

Q: How can anti-reflective coatings be modeled when simulating photodetectors in ATLAS/Luminous? How can detection efficiency be plotted?A: Earlier version of ATLAS were able to handle…
November 4, 1998
Simulation Standard

New Model for High Energy Implants in ATHENA

In our earlier paper [1] a new Binary Collision Approximation (BCA) module was described. It was shown that models and algorithms implemented…
November 3, 1998
Simulation Standard

Calibrating a Typical Bipolar Process Flow

A common request from TCAD (Technology Computer Aided Design) users is advise on how to calibrate the process flow and device simulator…
November 2, 1998
Simulation Standard

Accurate, High Speed Physics in FastBlaze

FastBlaze uses novel device simulation techniques to simulate typical MESFET and HEMT characteristics in less than a minute. To be a truly useful…
October 5, 1998
Simulation Standard

HINTS & TIPS – October 1998

The HP4155/56 DC Analyzer can be configured with SMU and Pulse Generator expander box frame called HP41501A. The expander box can have…
October 4, 1998
Simulation Standard

SPAYN Recent Developments

An important aspect of statistical process control in IC production is the ability to predict circuit performance variation in the manufacturing process.…
October 3, 1998
Simulation Standard

Scholar

The debut of Silvaco's new schematic editor, Scholar, is drawing closer. Scholar is a sophisticated design tool which derives its power and flexibility from the…
October 2, 1998
Simulation Standard

PHILIPS Model 9

In collaboration with STMicroelectronics Central R&D at Crolles (France), a new routine has been developed in UTMOST III to provide a complete solution for…
October 1, 1998
Simulation Standard

Parallel .ALTER Statements in SmartSpice

The .ALTER statement is designed to allow a SPICE input deck to be re-run with a change in a single parameter. This feature is…
September 3, 1998
Simulation Standard

HINTS & TIPS – September 1998

I run DRC, find one-two violations, correct them, then I re-run DRC to check whether my corrections worked. However re-running on the…
September 1, 1998
Simulation Standard

Real-time DRC in Expert Layout Editor

In this paper we introduce one of the latest and most advanced features of Silvaco's Expert Layout processor for Windows NT ­ DRC Guard.…
August 4, 1998
Simulation Standard

HINTS & TIPS – August 1998

When using the analytical implant tables in ATHENA the default model for the lateral implant range assumes a gaussian profile with a standard deviation…
July 5, 1998
Simulation Standard

HINTS & TIPS – July 1998

The traditional Noise models in SPICE used two parameters (AF and KF) to model the noise level and the frequency dependency of…
July 4, 1998
Simulation Standard

UTMOST File Format Extension

Following the log file conversion tool for TonyPlot introduced with UTMOST 12.3.14.R1, new file formats have been added to UTMOST III's printing and plotting options to make…
July 3, 1998
Simulation Standard

SmartSpice v.1.5.5 Release Notes

The latest Berkeley BSIM3v3.2 model of June 16 1998 has been integrated into SmartSpice 1.5.5. The Silvaco implementation of the Berkeley BSIM3v3.2 model can…
June 3, 1998
Simulation Standard

HINTS AND TIPS – June 1998

Q: Can I draw tangents to circles in EXPERT? A: Expert supports several options for drawing sophisticated shapes. There are three ways to accomplish…
May 5, 1998
Simulation Standard

HINTS AND TIPS – May 1998

How can anti-reflective coatings be modeled when simulating photodetectors in ATLAS/Luminous? How can detection efficiency be plotted?
May 4, 1998
Simulation Standard

Low-Power Systems-on-a-Chip CAD

Mixed-signal systems-on-a-chip (SOC) integration of digital, analog, RF, and power components is emerging to meet demands for low-power, highly integrated systems in…
April 7, 1998
Simulation Standard

HINTS & TIPS – April 1998

Q. What is the typical method of measuring flicker noise using S3245A Noise Amplifier?
April 6, 1998
Simulation Standard

SPICE Model Validation

The importance of the MOS device SPICE model validation and the introduction of the validation routine in UTMOST III was presented in…
April 5, 1998
Simulation Standard

UTMOST Log File Conversion for TonyPlot

A new feature has recently been added to UTMOST: the ability to convert UTMOST log files into a format suitable for viewing in TonyPlot. This new…
April 2, 1998
Simulation Standard

Release of an Upgraded SmartSpice Interface to Cadence

The SmartSpice Interface to Cadence integrates the Analog Artist and Composer elements of the Cadence Design Framework II (DFII) with SmartSpice. This integration is accomplished,…
April 1, 1998
Simulation Standard

BSIM3SOI Level=25 Model Released in SmartSpice

The Berkeley BSIM3SOI model, released in December 1997, is now available within SmartSpice as the MOSFET level=25 model. This model incorporates three separate implementations:…
March 1, 1998
Simulation Standard

HINTS & TIPS – March 1998

Q: Is it possible to perform a DRC check on portions rather than on the whole circuit useful when only 2 or 3…
February 1, 1998
Simulation Standard

HINTS & TIPS – February 1998

Q: How can external tools be run inside of Silvaco's run-time environment DeckBuild? Is it possible to include UNIX commands along with simulator…
January 4, 1998
Simulation Standard

The SmartSpice Interface to Cadence (revisited)

The SmartSpice interface to the Cadence Design Framework II has been substantially improved in its latest release (version 1.0.8.R), following feedback from…
January 1, 1998
Simulation Standard

Hints, Tips, and Solutions – January 1998

Q: What is typical measurement set-up for the S3245A Noise Amplifier and what measurement equipment is used? A: Typical Measurement Set-Up

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