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Silvaco 新闻与新闻稿
自 2019 年 1 月以来,Silvaco 已发布 77 篇新闻稿,内容涵盖客户、合作伙伴、产品和公司动态。最近一篇于 2026 年 8 月 18 日发布,宣布与 Dassault Systèmes 建立合作伙伴关系。
Silvaco 最新新闻
客户采用、合作伙伴关系、产品发布和公司公告,无论您关注的是 AI
驱动制造还是 AI 驱动设计业务,都可在此获取相关信息。
季度业绩和 SEC 申报文件同样属于 Silvaco 新闻。这些内容可在
investors.silvaco.com 查看,其中 2026 年第二季度财务业绩于 2026 年 8 月 6 日发布。
869 篇文章
October 2, 2026
未分类
Market energized by demand from hybrid & electric vehicles, power supplies and photovoltaic inverters. By Richard Eden, Omdia Research The emerging market…
June 30, 2026
Simulation Standard
1200 V垂直型氮化镓FinFET晶体管的TCAD击穿仿真
本文利用Silvaco Victory工具套件,对一颗1200 V垂直型氮化镓(GaN)FinFET晶体管进行了TCAD工艺仿真、网格生成及器件仿真。
June 3, 2026
Webinars
May 29, 2026
未分类
Silvaco at DAC 2026
Silvaco邀您相约DAC 2026 2026年7月26日-29日 地点:长滩会议中心 | 展位号:1155 Silvaco诚邀您莅临DAC展会,与我们一同见证半导体设计领域的创新实践。欢迎光临我们的展位,了解我们在AI驱动设计、建模及IP解决方案方面的最新进展与突破。 特色技术 Utmost — AI 驱动的 SPICE 模型提取与特征化工具 快速生成精确、可直接用于设计的紧凑模型,大幅缩短开发周期。 Utmost能将工艺与器件数据高效转入可靠的SPICE模型,确保仿真与实际硅片特性高度一致,同时显著减少人工调参、降低模型不确定性,并避免成本高昂的重复流片。 Jivaro / Viso — AI 驱动的寄生参数与模拟分析解决方案…
May 19, 2026
News
May 15, 2026
Webinars
May 8, 2026
News
April 27, 2026
Simulation Standard
利用AI驱动的FTCO加速下一代功率技术发展
我们最新一期的 Simulation Standard 探讨了Silvaco的AI驱动型制造技术协同优化 (FTCO™) 平台通过结合规模化仿真、智能实验设计和机器学习代理模型,如何变革功率器件开发工作流程,并以pGaN HEMTs、垂直型GaN和SiC DMOS技术为实例进行演示讲解。
April 20, 2026
News
April 9, 2026
Webinars
March 30, 2026
News
March 19, 2026
Simulation Standard
叠层有机发光二极管的有机输运模型
下一代显示技术正采用叠层有机发光二极管拓扑结构来提升面板性能。
March 12, 2026
News
March 10, 2026
News
March 5, 2026
Webinars
February 3, 2026
未分类
SURGE Virtual Event Japan 2026
SURGE Virtual Event Japan 2026 Archive Now Available Silvaco SURGE unites the semiconductor development and design community to explore how Silvaco’s simulation…
January 21, 2026
Simulation Standard
赋能下一代高压功率器件:从仿真到系统的氧化镓沟槽肖特基二极管
β-Ga₂O₃有望彻底变革高压功率转换领域,其超低损耗和高临界电场特性使之成为下一代功率器件的理想选择[1],能够为AI数据中心供电、可再生能源系统[2]、高压断路器和静电放电保护[3]提供1–6 kV、0.5–0.8 kA范围内的三相高压直流的AC/DC和DC/AC转换方案。
January 21, 2026
未分类
SURGE Virtual Event North America 2026
SURGE Virtual Event North America 2026 Archive Now Available Silvaco SURGE unites the semiconductor development and design community to explore how Silvaco’s…
January 13, 2026
未分类
SURGE Virtual Event EMEA 2026
SURGE Virtual Event EMEA 2026 Archive Now Available Silvaco SURGE unites the semiconductor development and design community to explore how Silvaco’s simulation…
December 18, 2025
Simulation Standard
Victory TCAD 2025 软件版本发布
凭借四十余年的深厚积淀,Silvaco 发布的 Victory TCAD™ 2025 版本,再次引领 TCAD 领域的创新浪潮。该版本在仿真引擎、求解器性能、物理模型以及面向大规模 3D 应用的多物理场工作流程方面均实现了重大提升。
November 20, 2025
News
November 18, 2025
Simulation Standard
基于物理的数字孪生,加速面向AI工厂的800V高压直流垂直型GaN功率器件开发
我们将讨论基于物理的数字孪生,加速面向AI工厂的800V高压直流垂直型GaN功率器件开发
November 18, 2025
POST
November 12, 2025
News
Silvaco Reports Third Quarter 2025 Financial Results
November 12, 2025
November 10, 2025
News
October 27, 2025
News
October 23, 2025
Webinars
September 21, 2025
Simulation Standard
功率MOSFET动态测试
本文演示了如何应用Silvaco TCAD工具套件,对平面型碳化硅MOSFET(DMOS)实现从工艺制程到电路分析的全流程仿真。
September 19, 2025
News
September 4, 2025
Webinars
September 4, 2025
News
Silvaco Names Chris Zegarelli as Chief Financial Officer
September 4, 2025
August 22, 2025
News
Silvaco Announces CEO Transition
August 21, 2025
August 15, 2025
Simulation Standard
阻抗场与低信号噪声
低信号电气噪声不可避免,其成因在于器件内部过程的随机波动,例如热波动导致的载流子密度微观变化,以及产生-复合速率的统计波动。 此类噪声可能干扰电路预期行为,因此建模器件产生的噪声至关重要。了解噪声在器件中的具体产生位置亦具有重要意义,这有助于设计低噪声器件。Victory Device采用阻抗场法进行噪声计算。
August 15, 2025
Simulation Standard
在 Victory Process 的蒙特卡洛离子注入中使用 Trajectory Replication
Victory Process中的蒙特卡洛离子注入是固体结构的工艺仿真中实现物理上精确的浓度分布的重要工具。该蒙特卡洛算法通过模拟粒子从注入窗口进入用户所定义的结构后的运动路径进行建模工作。粒子在结构内移动时,通过与材料相互作用不断损失能量,直至停止运动或发生背散射。要获得统计波动较小且浓度分布连续(平滑)的结果,通常需要耗费大量计算时间。Trajectory Replication的目标是通过将粒子在结构某区域的运动路径复制到其他区域,在保持浓度分布平滑度的同时有效减少总体计算时间。为实现物理上精确的结果,复制操作必须满足明确定义的条件,本文将对相关条件进行阐述。在具体介绍复现流程的细节之前,我们将先讨论蒙特卡洛离子注入程序中的若干重要概念。
August 13, 2025
News
August 11, 2025
News
August 6, 2025
News
Silvaco Reports Second Quarter 2025 Financial Results
August 6, 2025
August 4, 2025
News
July 29, 2025
News
July 24, 2025
News
July 14, 2025
Webinars
July 2, 2025
News
June 27, 2025
News
June 24, 2025
News
June 3, 2025
News
May 13, 2025
News
May 7, 2025
News
May 6, 2025
News
May 1, 2025
News
April 29, 2025
News
April 11, 2025
POST
April 1, 2025
Custom Webinars
如何使用 Viso 检查、分析和解决复杂的寄生问题
视频回放已上线
April 1, 2025
News
March 25, 2025
News
March 24, 2025
News
Silvaco Announces Departure of Chief Financial Officer
March 21, 2025
March 6, 2025
News
February 26, 2025
Simulation Standard
A New CMOS Simulation Template: Addressing Advanced Diffusion and Annealing Effects
As the scaling of CMOS devices continues, the accuracy requirements for simulating ion implantation and diffusion processes have become increasingly stringent.
February 4, 2025
POST
January 28, 2025
Simulation Standard
虚拟量测新工具简介:Victory Extract
Victory Extract是Silvaco在2024基准版本软件中推出的一个新工具,它统一了几款软件中的提取工具(DeckBuild的extract、Victory Process的extract3d和Victory Mesh的extract3d),并引入了一些新的量测功能。
January 14, 2025
News
December 20, 2024
News
Micon Global and Silvaco Announce New Partnership
December 20, 2024
December 19, 2024
News
December 4, 2024
News
November 28, 2024
POST
November 13, 2024
News
Silvaco Reports Third Quarter 2024 Financial Results
November 12, 2024
October 25, 2024
News
October 16, 2024
News
September 30, 2024
News
September 23, 2024
Simulation Standard
基于双脉冲法的IGBT开关仿真
我们将在本期为您介绍一种基于DPT的仿真方法,来研究IGBT器件的瞬态开关特性。文章还提供了一套使用Silvaco TCAD仿真工具评估功率器件开关特的标准模板和方法,所用的仿真代码可参考2024基准版本的示例Silicon_Power_ex17。
September 23, 2024
News
September 18, 2024
News
Silvaco Announces Expected Addition to Three US Russell Indexes
September 16, 2024
September 9, 2024
POST
August 28, 2024
Simulation Standard
2024 TCAD基准版本软件发布
第一部分:Victory Process——2024基准版本中的新功能 第二部分:Victory Device——2024基准版本中的新功能 第三部分:Victory DoE——2024基准版本中的新功能
August 7, 2024
Webinars
August 7, 2024
News
Silvaco Reports Second Quarter 2024 Financial Results
August 7, 2024
July 5, 2024
Webinars
将人工智能应用于FTCO<sup>TM</sup>
TCAD Webinars
2024年7月25日 FTCO基于实际生产工艺中的物理和化学机制,利用人工智能(AI)和机器学习(ML)生成精确的TCAD数字模型(数字孪生)。对于这种数字孪生模型,可以采用DoE方法进行测试和分析,而无需真实流片,从而大大节省了制造相关的时间和费用。
June 21, 2024
News
Silvaco Reports First Quarter 2024 Financial Results
June 20, 2024
June 11, 2024
News
Silvaco Announces Initiatives to Enhance Workforce Development in Semiconductor Industry
TCAD News
June 12, 2024
June 10, 2024
Simulation Standard
How Can I Re-Use Individual Monte-Carlo 3D Implant Profiles?
It is often the case that a design of experiments (DOE) is required to optimize the performance of a particular device. Sometimes…
May 23, 2024
Simulation Standard
Comparison of Models for Fluorine Effect on Dopant Diffusion in CMOS Processes
Recently a new diffusion model was introduced to Victory Process: the CMOS model. This model aims at taking on the challenges brought…
May 8, 2024
Custom News
Silvaco Announces Pricing of Initial Public Offering
Library NewsSPICE NewsTCAD NewsVariation News
May 8, 2024
April 29, 2024
Custom News
Silvaco Announces Launch of Initial Public Offering
Modeling NewsSIPware NewsSPICE NewsTCAD NewsVariation News
April 30, 2024
April 16, 2024
Custom News
Silvaco Announces Expanded Partnership with Micron Technology
Foundation IP NewsLibrary NewsModeling NewsParasitics+Netlist NewsSIPware NewsSPICE NewsTCAD NewsVariation News
April 16, 2024
April 1, 2024
Simulation Standard
Setting up the Wafer Orientation: Applications to Ion Implantation
Properly setting the wafer orientation in Victory Process (VP) is critical for various processes such as ion implantation, etching, and deposition. For…
March 11, 2024
Simulation Standard
Optoelectronic Component Design for Photonic Integrated Circuits
Photonic integrated circuits (PICs) are a key enabling technology for a broad range of current and next-generation products. Combining semiconductor materials and…
February 27, 2024
POST
意法半导体:如何使用Silvaco TCAD研究表面缺陷点对SiC器件短路现象的影响
TCAD Webinars
2024年3月28日 在打开和关闭SiC器件时,器件容易出现异常过载,因此在一些应用中对器件“鲁棒性”有要求,例如需进行短路测试和UIS测试。在本次研讨会中,来自意法半导体的研发人员将为大家介绍如何使用Silvaco TCAD软件对SiC器件短路现象进行研究。
February 27, 2024
Simulation Standard
Advanced TCAD Modeling of HfO2-based ReRAM: Coupling Redox Reactions and Thermal Effects
This paper presents a TCAD modeling approach for HfO2-based ReRAM (Resistive Random Access Memory). For describing the switching and retention behaviors of…
February 6, 2024
Custom News
Silvaco Expands Sales Channel in Asia – Appoints Vietnam and India Distributors
Modeling NewsSIPware NewsSPICE NewsTCAD NewsVariation News
February 8, 2024
January 11, 2024
POST
Silvaco TCAD解决方案助力GaN功率器件的设计和开发
TCAD Webinars
2024年2月29号 我们将举例说明Silvaco仿真工具如何帮助研究人员设计、预测和分析垂直和横向GaN功率器件的电特性。
January 10, 2024
POST
Si、GaN和SiC功率器件的SPICE建模
Modeling WebinarsTCAD Webinars
2024年2月8号 我们将为您介绍不同制造工艺的功率器件,包括Si、GaN和SiC器件,分析它们的特点和优势,并分享其SPICE建模的各种方法和挑战。
December 20, 2023
Custom News
Silvaco Successfully Concludes Its Global Users Event (SURGE) With Over 1000 End-Users and Prospects in Attendance
Modeling NewsParasitics+Netlist NewsSIPware NewsSPICE NewsVariation News
December 21, 2023
September 1, 2023
Simulation Standard
Numerical Algorithm to Perform Viscoelastic Analysis
Numerical Algorithm to Perform Viscoelastic Analysis Viscous materials exhibit both viscous and elastic characteristics when undergoing deformation. The response of such materials…
August 2, 2023
Simulation Standard
2023 TCAD Baseline Release
New Features in the 2023 Baseline Release: Section 1: Process Simulation – New Features in 2023 Baseline Release Section 2: Device Simulation…
July 3, 2023
Custom News
June 6, 2023
News
May 23, 2023
News
Join Us at DAC 2023
May 24, 2023
April 24, 2023
TCAD Training
Learn How to Use Victory Process TCAD Geometric Etch Models in FinFET and Memory Applications
TCAD Webinars
May 18, 2023 In this webinar, we present geometric etch models in the context of FinFET and memory applications. We demonstrate techniques…
April 19, 2023
Simulation Standard
Simulation Framework for Device-packaging Co-design for Power Electronics
The past several years has seen a fast deployment of wide-bandgap power devices in fast chargers, electric vehicles, data centers and renewable…
March 7, 2023
Simulation Standard
Understanding of Geometrical Boundary Conditions in Victory Process
It is common to run the process simulation for the part of a larger structure just to reduce the computation time. To…
March 7, 2023
POST
Learn About Advanced TFT-Based Flat Panel Design with SmartSpice
SPICE Webinars
March 23, 2023 In this webinar, we will present the benefits of adopting SmartSpice’s unique 4-terminal TFT compact model, and we describe…
February 9, 2023
Simulation Standard
Automatic Grid Refinement for Thin Material Layer Etching in Process TCAD Simulations
The utilization of thin material layers is common in modern semiconductor device fabrication. Subsequent etching steps require an accurate modeling of these…
January 23, 2023
POST
Learn How TCAD is a Key Enabler for Photodiode Development
TCAD Webinars
February 23, 2023 In this webinar, Sungwon Kong will discuss these technologies and how TCAD can be broadly applied to multiple detector…
January 23, 2023
POST
Learn How SilTerra Uses Cello and Viola for Standard Cells and I/O Library Optimization and Characterization
SIPware Webinars
February 16, 2023 In this webinar, we will share the challenges of optimizing and validating different libraries, and demonstrate how Cello, Viola,…
January 13, 2023
Simulation Standard
How to Search, View and Use Default Parameters from the Silvaco Material DataBase SMDB with DeckBuild
Silver, DeckBuild’s material database viewer, can be used to examine the default parameters in the Silvaco Material DataBase (SMDB) and to generate…
January 10, 2023
POST
Learn About the Latest Advances in Device Modeling Using Silvaco Utmost IV
Modeling Webinars
January 26, 2023 In this webinar, we will introduce the Corner and Retargeting Module, the most recent addition to our modeling software…
December 13, 2022
Simulation Standard
3D TCAD Simulation of Gallium Nitride Tri-gate Junction HEMT
The GaN high electron mobility transistor (HEMT) has been commercialized as a power device with performance superior to Si devices in the…
November 1, 2022
News
October 27, 2022
Simulation Standard
Writing an Impurity Activation Model with the Open Model Library
Accuracy of Impurity Activation is essential in correctly modeling and simulating Silicon Carbide devices. For high concentrations of dopants, it is well…
September 16, 2022
Simulation Standard
User Probes and Arbitrary Parameter Sweeps in Victory Device
One of the new features in Victory Device is the ability to add user managed parameters to a log file. This can…
August 30, 2022
POST
Learn About Victory Visual, Silvaco’s New Graphical Visualization Solution for TCAD
TCAD Webinars
September 22, 2022 In this webinar we will introduce Victory Visual, a new graphical post-processing tool for use with all Silvaco TCAD…
August 23, 2022
Simulation Standard
Quantum Transport Simulation at Atomistic Accuracy of a Nanowire FET
The FET physical dimensions continue to shrink to five nm node and below, characterized by new types of architectures with nanosheet (NS)…
August 16, 2022
POST
Learn How Victory Atomistic TCAD Solution Can Help You Succeed at Prototyping Atomistic Nanoscale Devices
TCAD Webinars
September 8, 2022 In this webinar, we present how ultra-scaled Field-Effect Transistor (FET) technology requires simulations at the atomic scale for designing the most advanced…
July 29, 2022
Simulation Standard
2022 TCAD Baseline Release
New Features in the 2022 Baseline Release: Section 1: Process Simulation – New Features in 2022 Baseline Release Section 2: Device Simulation…
July 8, 2022
POST
Learn How to Efficiently Achieve Accurate Experimental Etch Profiles in FinFET and Memory Applications with Victory TCAD Solution
TCAD Webinars
August 11, 2022 In this webinar, we present these geometric etch models in the context of FinFET and memory applications. We demonstrate…
June 17, 2022
未分类
Join Us at DAC 2022
Join Us at DAC 2022 Join us at 2022 Design Automation Conference where we will highlight the company’s wide range of semiconductor…
June 14, 2022
Simulation Standard
Simulation of the High Temperature Performance of InGaN ‘Topping’ Cells
This work reports on the design of a high efficiency InGaN-based two junction (2J) tandem solar cell via numerical simulation, operating at…
June 13, 2022
POST
Learn How Silvaco Flow Helps Designing and Simulating Pixel Arrays in Flat Panel Displays and Detectors
SPICE WebinarsTCAD Webinars
June 30, 2022 In this webinar, we highlight how leading display and detector companies exploit the capabilities of Silvaco tools for schematic…
May 19, 2022
Custom Webinars
How to Eliminate Image Retention Issues with SmartSpice Flex Modeling
SPICE Webinars
June 9, 2022 In this webinar, we will introduce a solution to the long-standing issue in the display community of Image Retention…
May 3, 2022
Simulation Standard
Investigation of Self-Heating Effects in SOI MOSFETs with Silvaco Numerical Simulation
Self-heating effect may cause over-heated damage and degradation for silicon-on-insulator (SOI) devices, so numerical counting heat generated, and distribution can optimize the…
April 26, 2022
POST
Learn About Silvaco’s AMBA AHB Subsystems and How to Customize, Secure, and Verify
SIPware Webinars
May 12, 2022 In this webinar, we will provide an overview of the AMBA AHB subsystems and products offered by Silvaco. Some…
April 11, 2022
Custom Webinars
Learn How to Improve TFT-Based Flat Panel Designs with the Unique SmartSpice 4-Terminal TFT Model
SPICE Webinars
April, 28, 2022 (PDT) In this webinar, we will describe SmartSpice’s 4-terminal TFT compact model. Unique in the market, we present some of…
April 1, 2022
Simulation Standard
How Can I Remesh a Structure Using a Custom Volume Mesh in Victory Mesh?
Victory Mesh support for line statements lets the user customize the volume mesh used by conformal remesh schemes. The volume mesh data…
March 9, 2022
POST
Learn How mqSemi AG Developed 3D Power Devices Proof of Concept with Silvaco TCAD Simulations
TCAD Webinars
March 24, 2022 | 10:00 am – 10:30 am (PDT) In this Webinar, we will introduce mqSemi and the 3D TCAD models…
March 3, 2022
Simulation Standard
Simulation of AlGaInP Multiple Quantum Well LED for Micro Display
The flat panel display industry has been growing rapidly for recent years in mobile display, car display, AR/VR applications, and large-scale TVs…
March 1, 2022
POST
How Silvaco TCAD is at the Heart of Innovation in RF Devices
TCAD Webinars
March 17, 2022 | 10:00 am – 10:30 am (PDT) In this Webinar, Silvaco’s TCAD Victory Device simulation tool is used to…
February 28, 2022
News
February 22, 2022
POST
How to Optimize and Boost Your Device Modeling and Characterization with Utmost IV
Modeling Webinars
March 10, 2022 | 10:00 am – 10:30 am (PST) In this webinar we will examine some of the key features and…
February 1, 2022
Simulation Standard
Relating Platinum Diffusion to Minority Carrier Lifetime Control in PiN Diode: Coupled TCAD Process and Device Simulation
Platinum and gold are widely used as an effective method to control lifetime in silicon-based devices [1, 2, 3]. Platinum and gold…
January 21, 2022
TCAD Training
How to Use Device Simulation as a Tool for Understanding GaN HEMTs
TCAD Webinars
February 24, 2022 | 10:00 am – 10:30 am (PST) This webinar will illustrate through specific published examples of how TCAD device…
January 21, 2022
Custom Webinars
How to Improve Physical Verification Productivity with SmartDRC/LVS
February 17, 2022 | 10:00 am – 10:30 am (PST) Physical Verification is the most critical stage of microchip design. This webinar…
January 6, 2022
Simulation Standard
Enabling the Rapid Development of SiC Superjunction-MOSFETs in Collaboration with mi2-factory
Introduction Super-junction based devices are a key enabling technology for power devices. Adjacent columns of p and n-type doped material with optimized…
December 13, 2021
Custom News
Colin Shaw of Silvaco Named Si2 Pinnacle Award Winner
Foundation IP NewsLibrary NewsModeling NewsParasitics+Netlist NewsSIPware NewsSPICE NewsTCAD NewsVariation News
December 12, 2021
November 1, 2021
Simulation Standard
TCAD Modeling of Amorphous Selenium-based Avalanche Photon Detectors
Abstract— Silvaco TCAD simulations are employed to identify relevant current carrying mechanisms in amorphous selenium (a-Se) based detectors, using parameters obtained from…
October 20, 2021
Silvaco
Strategic Account Manager
Location: Seattle/Bellevue, WA - Boston, MA - Phoenix/San Diego, CA As a Strategic Account Manager at Silvaco, you will be responsible for…
October 1, 2021
Simulation Standard
Singular Point Source MOS Cell Concept (S-MOS) Implemented on a Narrow Mesa Trench IGBT
Abstract— A Singular Point Source MOS (S-MOS) cell concept suitable for power MOS based devices is presented. The S-MOS differs from a…
September 16, 2021
Simulation Standard
Singular Point Source MOS Cell Concept (S-MOS) Implemented on a Narrow Mesa Trench IGBT
Abstract— A Singular Point Source MOS (S-MOS) cell concept suitable for power MOS based devices is presented. The S-MOS differs from a…
September 16, 2021
Simulation Standard
A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification
Abstract—During the last few years, oxide-based ReRAM technology has attracted intense industrial and scientific research interest. Therefore, we have performed an in-depth…
September 2, 2021
News
August 17, 2021
POST
Designing with Silvaco’s Octal SPI Memory Controller with Advanced Memory Support for IoT Systems
SIPware Webinars
September 9, 2021 | 10:00 am – 10:30 am (PDT) This webinar will focus on a specific class of memory devices –…
July 27, 2021
POST
Silvaco SmartSpice 2021 – Top 10 New Features in the Baseline Release
SPICE Webinars
August 19, 2021 | 10:00 am – 10:30 am (PDT) In this webinar, we present the top 10 new features and improvements…
July 22, 2021
Simulation Standard
2021 TCAD Baseline Release
New Features in 2021 Baseline Release: Section 1: Process Simulation Section 2: Device Simulation Section 3: Victory Mesh Section 4: Parasitic Extraction
July 12, 2021
POST
100X Faster Nano Device Atomistic TCAD Simulation with Victory Atomistic
TCAD Webinars
August 5, 2021 | 10:00 am – 10:30 am (PDT) In this webinar you will learn about 100X Faster Nano Device Atomistic…
June 23, 2021
POST
Simulation of Silicon and Perovskite Based Tandem Solar Cells Using TCAD
TCAD Webinars
July 15, 2021 | 10:00 am – 10:35 am (PDT)
In this webinar you will learn Simulation of Silicon and Perovskite Based…
June 15, 2021
Simulation Standard
An Introduction to Meshing in Victory Process
Victory Process (VP) uses two types of mesh to represent the structure: • The geometry mesh, which is used to represent the…
June 10, 2021
Custom Webinars
Achieve Your Display Design Performance Edge Through Precision Parasitic Extraction
TCAD Webinars
June 29, 2021 | 10:00 am – 10:30 am (PDT) In this webinar you will learn how Silvaco Hipex-FS can help designers…
June 3, 2021
POST
Achieving Extreme Low Power IoT Designs with Silvaco’s 55LPx Foundation IP Solution
SIPware Webinars
June 24, 2021 | 10:00 am – 10:30 am (PDT)
In this webinar you will learn how Silvaco Foundation IP helps you…
May 28, 2021
POST
Oxide Semiconductor LSI Technology and SPICE Model for Ultra Low Power LSI
Modeling Webinars
May 12, 2021 | 13:00-13:40 (JST) In this webinar, we will introduce CAAC-IGZOⓇ FET (c-axis aligned crystalline indium-gallium-zinc oxide FET) developed by…
May 21, 2021
Simulation Standard
Compact Multi-Level Digital-to-Analog Conversion Using Thin-Film Multimodal Transistors
Unlike conventional ohmic contact thin-film transistors (TFTs), contact-controlled TFTs [1], [2] rely on source energy barriers to produce a range of benefits…
May 12, 2021
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2021 TSMC Worldwide Technology Symposium
Welcome! Thank You for visiting our virtual booth at the 2021 TSMC Worldwide Technology Symposium. We hope you found the information useful…
May 12, 2021
POST
Development & Delivery of Complete IO & ESD Library in 5 Weeks
SIPware Webinars
June 3, 2021 | 10:00 am – 10:30 am (PDT)
In this webinar, you will learn development & delivery of complete IO…
May 11, 2021
News
May 7, 2021
POST
GaN-Based LEDs – Combining Process and Device TCAD to Optimize Substrate Patterning and Maximize Light Extraction Efficiency
TCAD Webinars
May 20, 2021 | 10:00 am – 10:30 am (PDT)
In this webinar, a workflow that combines process and device TCAD to…
April 29, 2021
Custom Webinars
How to Model and Simulate Flat Panel Pixel Arrays
Modeling WebinarsSPICE Webinars
May 13, 2021 | 10:00 am – 10:35 am (PDT) In this webinar we will look at some of the effects to…
April 19, 2021
Simulation Standard
Investigation and Explanation of PiPiN Avalanche Photo-Diode Characteristics
In this article, the operation of avalanche photo-diodes in the medium gain, continuous operation mode is investigated. In other words, we are…
April 19, 2021
POST
How to Modify Material and Modeling Properties with Silvaco Victory TCAD Solution
TCAD Webinars
May 6, 2021 | 10:00 am – 10:35 am (PDT) In this webinar we will demonstrate how to set models for simulations,…
April 14, 2021
Custom News
April 5, 2021
Custom Webinars
How to Accelerate Post-layout Parasitics Analysis and Avoid Wasted Simulation Cycles
SPICE Webinars
April 20, 2021 | 10:00 am – 10:30 am (PDT) In this webinar we will show how to accelerate post-layout parasitics analysis…
March 25, 2021
POST
How to Build a New Diffusion Model with Silvaco Victory TCAD Solution
TCAD Webinars
April 8, 2021 | 10:00 am – 10:30 am (PDT) In this webinar we will demonstrate how to create a custom diffusion…
March 4, 2021
Simulation Standard
How do I create complex shapes with fixed cross sections in Victory Mesh?
Victory Mesh versions 1.7.2.C and later include two new commands that can be used for complex shape genera-tion. The path and follow…
March 4, 2021
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GOMAC 2021
Welcome! Thank You for visiting our booth at GOMAC 2021. We hope you found the information useful and informative. Enter drawing to…
February 24, 2021
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RF Algorithm Engineer
Location: Moscow, Kiev Ukraine, UK, Grenoble Silvaco is one of a few providers of highly sophisticated software for electronic circuit simulation. With…
February 16, 2021
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Learn How Silvaco’s SmartSpice is Getting Faster
When: March 4, 2021 Where: Online Time: 10:00am-10:20am-(PST) Language: English Register to Win!! Enter drawing to win an Amazon gift card Learn…
February 3, 2021
Simulation Standard
Parabolic Grading of a PHEMT Channel Composition for Ultra-High and Broad OIP3 Peak
We detect a local maximum in the design space of a pseudomorphic-channel high electron mobility transistor (PHEMT). The design has an OIP3 …
January 20, 2021
News
Silvaco Acquires Physical Verification Solution Provider POLYTEDA CLOUD LLC
Modeling NewsModeling PressSPICE News
January 21, 2021
January 18, 2021
POST
Accelerating Wireless IOT SoC Implementation with Silvaco AMBA® Subsystem IP
SIPware Webinars
January 28, 2021 | 10:00 am – 10:30 am (PST) In this webinar you will learn how Rafael Microelectronics has deployed Silvaco’s…
January 17, 2021
POST
How to Design Wide Band-Gap Power Devices using Silvaco TCAD Solution
TCAD Webinars
February 11, 2021 | 10:00 am – 10:20 am (PST) This webinar will provide an overview of the design of wide bandgap…
January 17, 2021
POST
How To Remesh with Victory Mesh for an Optimized TCAD Device Simulation
TCAD Webinars
February 18, 2021 | 10:00 am – 11:00 am (PST) In this webinar, the attendees will learn the basics of Victory Mesh,…
January 17, 2021
POST
How to Design Ultra-low Power Embedded Memories with Silvaco Memory Compilers
SIPware Webinars
February 23, 2021 | 10:00 am – 10:30 am (PST) This webinar presents Silvaco’s Embedded Memory offerings as part of a complete…
January 15, 2021
Custom Webinars
Learn How Silvaco’s SmartSpice is Getting Faster
SPICE Webinars
March 4, 2021 | 10:00 am – 10:20 am (PST) In this Webinar, we present (1) a general overview of SmartSpice, our…
January 14, 2021
POST
How to Quickly Achieve Accurate SPICE Models with Utmost IV
Modeling WebinarsSPICE Webinars
March 16, 2021 | 10:00 am – 10:20 am (PST) This webinar will review the various Silvaco SPICE modeling solutions. This includes…
January 13, 2021
POST
How to Simulate Semiconductor Materials Stress and Deformation with Silvaco Victory TCAD Solution
TCAD Webinars
March 18, 2021 | 10:00 am – 10:30 am (PST) In this webinar we will cover the capabilities and usage of Victory…
January 12, 2021
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Etching & Deposition Software Engineer
Location: United Kingdom, Grenoble France, Vienna Austria, Germany, Boston, MA, Duluth, GA, and Santa Clara, CA. As a member of the TCAD…
January 4, 2021
Simulation Standard
TCAD Investigation of Total Ionizing Dose (TID) Effects on Gallium Nitride HEMTs
Gallium Nitride (GaN) based devices such as the High Electron Mobility Transistors (HEMTs) find wide applications in RF and Power domain due…
December 14, 2020
POST
Reducing the Layout Development Cycle Time for Standard Cells
SIPware Webinars
January 14, 2021 | 10:00 am – 10:20 am (PST) In this webinar, Sharmistha Sinha and Anand Mishra share their analysis and…
December 8, 2020
Custom Webinars
Good News – The Silvaco Analog Custom Design Flow
SPICE Webinars
December 17, 2020 | 10:00 am – 10:15 am (PST) In this webinar, we describe Silvaco’s Analog Custom Design solution and how…
December 2, 2020
Simulation Standard
Obtaining Spectral Sweeps from 3D Plasmonic Structures
In the simulation standard article, “Plasmonic Light Trapping Transforming Thin-Film Photovoltaics” from 2015, the finite difference time domain (FDTD) algorithm was used…
November 24, 2020
Corporate Blog
Worldwide Success for Virtual Silvaco UseRs Global Events (SURGE)
In late October and early November 2020, Silvaco held its fourth annual series of UseRs Global Events (SURGE). Because of the current…
November 24, 2020
News
November 18, 2020
Corporate Blog
Silvaco Presents at 13th International MOS-AK Virtual Workshop, Dec. 10 – 11
The 13th International MOS-AK Workshop will be hosted virtually on December 10 and 11, 2020, and Silvaco R&D will be presenting. The MOS-AK Workshop aims…
November 12, 2020
News
Silvaco Acquires Memory Compiler Technology of Dolphin Design SAS
SIPware News
November 12, 2020 Silvaco Inc., a leading supplier of EDA software and design IP, today announced that it has completed the acquisition…
October 28, 2020
Custom Blogs
Customer Interview: Why I Rely on SmartSpice
SPICE Blogs
Martin Mallinson is an experienced analog circuit designer with multiple patents. Over his 40-year career, his audio designs have been used in…
October 28, 2020
Corporate Blog
Silvaco’s Babak Taheri Speaking @ MEMS World Summit Shanghai, Nov. 17
MEMS World Summit is the world’s foremost annual meeting and business platform for engaging with political, business, financial, research and industry leaders…
October 26, 2020
POST
Application Engineer, SPICE Modeling
Location Atlanta, GA Silvaco seeks an experienced Application Engineer with a strong background in electrical device measurement and characterization, and in SPICE…
October 26, 2020
POST
Simulate 40X Faster with SmartSpice HPP
SPICE Webinars
In this webinar, we describe how SmartSpice HPP takes advantage of the modern multicore hardware platforms to speed up all internal aspects of transient…
October 1, 2020
Simulation Standard
Optimizing a 2um, 1,500 Volt SiC Superjunction Trench-MOS Device Using TCAD
In this paper the critical design features of a SiC superjunction trench MOS device were optimized using CAD to obtain a high…
October 1, 2020
Simulation Standard
TCAD Simulation of CBRAM Devices
Conductive Bridge Random Access Memory (CBRAM) is a non-volatile memory device technology that can operate by consuming very low power. Another advantage…
October 1, 2020
Simulation Standard
TCAD Mixed-Mode Simulation for GaN Power HEMTs in Unclamped Inductive Switching
The qualification of GaN power high-electron-mobilitytransistors (HEMTs) must consider the device ruggedness against out-of-SOA (safe operating area) events [1- 3].
October 1, 2020
Simulation Standard
Using Victory Process Open Model Interface to Customize Etch Emulation Model – Example
Dry etching is commonly used in semiconductor processing to generate deep trenches with good anisotropy. Dry etching is applied to many semiconductor…
September 9, 2020
News
September 3, 2020
POST
Improvement of Parasitic Capacitance Extraction Rules for Large-Scale Layout and Its Accuracy Verification Method
Parasitics+Netlist Webinars
September 17, 2020 | 13:00 – 13:30 (JST) The accuracy of rule-based full-chip parasitic capacitance extraction tools including Silvaco's Hipex is highly…
September 3, 2020
POST
Choosing the Right DDR Memory Subsystem for Your Next SOC!
SIPware Webinars
October 13, 2020 | 10:00 am – 10:30 am (PST) As computation requirements continue to build and memory systems are operating at…
September 2, 2020
TCAD
Silvaco at Upcoming Solid-State Conferences – ESSDERC 2020 and SISPAD 2020
TCAD Blogs
Silvaco technologists and research partners will be participating in the ESSDERC/ESSCIRC 2020 joint conference for solid-state devices and circuits. Tutorial #8, Ab-initio…
August 25, 2020
News
July 31, 2020
Simulation Standard
2020 TCAD Baseline Release Section 1: Process Simulation – New Features in 2020 Baseline Release
2020 TCAD Baseline Release Section 1: Process Simulation – New Features in 2020 Baseline Release
July 31, 2020
Simulation Standard
2020 TCAD Baseline Release Section 2: Meshing – New Features in 2020 Baseline Release
2020 TCAD Baseline Release Section 2: Meshing – New Features in 2020 Baseline Release
July 31, 2020
Simulation Standard
2020 TCAD Baseline Release – Device Simulation – New Features in 2020 Baseline Release
2020 TCAD Baseline Release Section 3: Device Simulation – New Features in 2020 Baseline Release
July 25, 2020
POST
High speed Interface Design: Best Practices
SIPware Webinars
August 27, 2020 | 10:00 am – 10:30 am (PDT) This webinar will provide a presentation on challenges and solutions associated with…
July 20, 2020
Corporate Blog
CEO Perspective – Challenges and Opportunities for Global Semiconductor Businesses
by Babak Taheri, Silvaco CEO In 1966 Robert F. Kennedy delivered a speech that mentioned a curse, “May you live in interesting…
July 9, 2020
POST
How to Secure an AMBA AHB Subsystem for the ARM Cortex M3 Processor
SIPware Webinars
July 28, 2020 | 10:00 am – 10:30 am (PDT) This webinar will provide a discussion of common methods used to secure…
July 7, 2020
POST
Model Extraction Flow with Utmost IV for Vertically Stacked Nanosheets Using the Leti-NSP Model
Modeling Webinars
July 30, 2020 | 10:00 am – 10:30 am (PDT) This webinar will provide a discussion of common methods used to secure…
July 6, 2020
Corporate Blog
Replay of 2020 ESD Alliance CEO Outlook Panel
The ESD Alliance CEO Outlook was held on June 17, 2020. This year’s informative event, featuring six prominent industry CEOs, was conducted…
May 28, 2020
POST
Samsung Foundry and Silvaco Design IP: The Right Solution for Your Next SoC!
SIPware Webinars
May 28, 2020 | 10:00 am – 10:30 am (PDT) In this webinar, we will provide a thorough introduction to Samsung Foundry…
May 21, 2020
POST
Using SmartSpice Compact Models
Modeling WebinarsSPICE Webinars
June 11, 2020 | 10:00 am – 10:30 am (PDT) This webinar will provide a guide to developing Compact Models in SmartSpice…
May 21, 2020
POST
Resistive RAM Switching Analysis with Victory TCAD Solution
TCAD Webinars
June 4, 2020 | 10:00 am – 10:30 am (PDT) Conventional non-volatile memory technologies, such as Flash, are near their physical limits…
May 20, 2020
POST
Machine Learning in the EDA-Specific Domain – 20 Years in the Making
Modeling WebinarsVariation Webinars
June 25, 2020 | 10:00 am – 10:30 am (PDT) This webinar will review these new approaches and how they are applied…
April 20, 2020
POST
TFT and OLED SPICE Modeling Using Utmost IV
Modeling Webinars
May 14th 2020 | 10:00 am – 10:30 am (PDT) In this webinar you will learn about SPICE modeling approaches and methods…
April 20, 2020
Webinars for Display Week
Optoelectronic Simulation of Solar Cells, Waveguides, and LEDs
TCAD Webinars
April 23nd 2020 | 10:00 am – 11:00 am (PDT) In this webinar, we will give an overview of Silvaco’s optical simulation…
April 7, 2020
Analog Custom Design
Silvaco Licenses HiSIM_IGBT Power Device Model Developed by HiSIM Consortium and Provides Support in SmartSpice Circuit Simulator
Modeling NewsModeling PressSPICE NewsSPICE Press
April 7, 2020
April 2, 2020
News
March 30, 2020
POST
Accelerating Design with the Victory TCAD Suite
TCAD Blogs
The Simulation Standard, Silvaco’s technical journal for semiconductor process and device engineers is beginning its 30th year of publication. The latest issue…
March 30, 2020
News
March 9, 2020
Webinars for Display Week
Reducing Organic LED Fabrication Time and Cost via Multi-Scale Flow Simulation
TCAD Webinars
April 2nd 2020 | 10:00 am – 11:00 am (PDT) Drift diffusion simulations are widely applied to study multilayer organic LED devices,…
March 3, 2020
Simulation Standard
Victory TCAD Suite: How to use it for fast, efficient, and accurate simulation of power semiconductor devices
Silvaco TCAD has been used by Tier 1 power device manufactures and designers for decades. The introduction of Victory Process, Victory Mesh,…
March 2, 2020
POST
TCAD Simulations of RF-SOI Switches with Trap-Rich Substrate
TCAD Blogs
The market for cellular components has been shifting rapidly from GaAs pHEMT or silicon-on-sapphire (SOS) to silicon-based technology. CMOS (silicon-on-insulator) SOI antenna…
March 2, 2020
Simulation Standard
Hints and Tips: Specify Units in the Victory Process Material Statement
It is crucial for any kind of calculations that units are consistent between equations and modeling modules. Often different units are used…
March 1, 2020
POST
Utmost IV Quick-Start Model Optimization Templates
Modeling Webinars
March 12th 2020 | 10:00 am - 11:00 am (PDT) This webinar will present a new capability available in UTMOST IV: the…
March 1, 2020
Simulation Standard
Hints and Tips: How do I Load, Remesh, and Refine an Existing Device Structure in Victory Mesh?
Victory Mesh initially supported loading and remeshing of the saved status from Victory Process. Victory Mesh 1.5.0 onwards is now able to…
February 26, 2020
Technical Libraries
Nanoscale Devices
Nanoscale DevicesTCAD Published Papers
Nanoscale Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. P. Blaise,1,2 “Ab Initio…
February 26, 2020
Technical Libraries
Solar Cells
Solar CellsTCAD Published Papers
Solar Cells The full text for most of these papers may be found at the IEEE website at www.ieee.org. Samy Almosni,[a,b] Ludmila Cojocaru,[a] Debin Li,[c] Satoshi…
February 26, 2020
Technical Libraries
MEMS
MEMSTCAD Published Papers
MEMS The full text for most of these papers may be found at the IEEE website at www.ieee.org. Yonghyun Shim, Member, IEEE, Jean-Pierre…
February 26, 2020
Technical Libraries
Memory Devices
TCAD Published Papers
Memory Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. Daewoong Kang, Hyungcheol Shin,…
February 26, 2020
Technical Libraries
Optoelectronics
OptoelectronicsTCAD Published Papers
Optoelectronics The full text for most of these papers may be found at the IEEE website at www.ieee.org. H. Matsuura, S. Sakurai, Y.…
February 26, 2020
Technical Libraries
Radiation, SEU and Reliability
Radiation, SEU and ReliabilityTCAD Published Papers
Radiation, SEU and Reliability The full text for most of these papers may be found at the IEEE website at www.ieee.org. Takashi Kameshima,…
February 26, 2020
Technical Libraries
Power Device Simulation
Power Devices SimulationTCAD Published Papers
Power Device Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Viviana Cerantonio, Marcello…
February 26, 2020
Technical Libraries
ESD Simulation
ESD SimulationTCAD Published Papers
ESD Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Guido Notermans, Olivier Quittard,…
February 26, 2020
Technical Libraries
Organic Device Technology
Organic Device TechnologyTCAD Published Papers
Organic Device Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. Debin Li, “Recent…
February 26, 2020
Technical Libraries
Interconnect Simulation
Interconnect SimulationTCAD Published Papers
Interconnect Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Keh-Jeng Chang, Jyh-Jeng Chou,…
February 26, 2020
Technical Libraries
SOI Technology
TCAD Published Papers
SOI Technology The full text most of these papers may be found at the IEEE website at www.ieee.org. Ali A. Orouji, Hamid Amini…
February 26, 2020
Technical Libraries
TFT Technology
TCAD Published PapersTFT Technology
TFT Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. Yu-Shien Shiah1, Kihyung Sim1, Yuhao…
February 26, 2020
Technical Libraries
Compound Devices
Compound DevicesTCAD Published Papers
Compound Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. N. Seoane1, M. Aldegunde1,…
February 26, 2020
Technical Libraries
CMOS Technology
CMOS TechnologyTCAD Published Papers
CMOS Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. T Uchino1, 2, E Gili1,…
February 26, 2020
Technical Libraries
Process Simulation
Process SimulationTCAD Published Papers
Process Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Guriqbal Singh Josan, Archana…
February 24, 2020
POST
What’s in the New MIPI Alliance I3C V1.1 Standard?
SIPware Webinars
February 27th 2020 | 10:00 am - 11:00 am (PST) I3C has the advantages in reducing pin count, increasing performance, and decreasing…
February 19, 2020
News
Weebit Nano and Silvaco Develop New Simulation Capabilities to Increase ReRAM Adoption
TCAD NewsTCAD Press
February 19, 2020
February 6, 2020
POST
TCAD of Innovative Nanodevices with Victory Atomistic
TCAD Webinars
TCAD of Innovative Nanodevices with Victory Atomistic This webinar will introduce to the simulation capabilities of Victory Atomistic (VA) as part of…
February 5, 2020
News
Two-dimensional oscillatory neural networks for energy efficient neuromorphic computing
TCAD News
Feb. 5, 2020 On the 4 th and 5th of February 2020, in Montpellier (France), at the premises of LIRMM, CNRS the…
January 24, 2020
POST
New MIPI I3C V1.1 Standard Streamlines Peripheral Connectivity with Lower Cost and Higher Bandwidth
SIPware Blogs
The MIPI Alliance (MIPI) develops interface specifications for mobile and mobile-influenced industries. There is at least one MIPI specification in every smartphone…
January 16, 2020
Custom Webinars
Accelerate the Circuit Simulation Flow with Jivaro Parasitic Reduction
Parasitics+Netlist WebinarsSPICE Webinars
Accelerate the Circuit Simulation Flow with Jivaro Parasitic Reduction Jivaro is a unique, stand-alone solution for the reduction of parasitic networks that…
January 7, 2020
POST
For Next Generation Nanowires, Simulation from Atoms to SPICE
TCAD Blogs
As process nodes continue to shrink, the requirement for additional physics-based simulation is gradually creeping into each stage of the design process.…
December 18, 2019
POST
Atomistic Analysis and Next Generation Computing at IEDM 2019
TCAD Blogs
IEDM is THE device conference with more than a thousand participants from major companies and R&D institutes. Many talks were dedicated to…
December 14, 2019
POST
TCAD Recommended Textbooks
TCAD Textbooks
CMOS: Mixed-Signal Circuit Design, Second Edition R. Jacob Baker. Published Wiley-IEEE Press, 2nd Edition. Published 2009, pp. 330 ISBN 978-0-470-29026-2 Understanding Modern…
December 12, 2019
POST
IP Solutions for Secure Autonomous Driving
SIPware Webinars
IP Solutions for Secure Autonomous Driving This webinar will present the risks and necessary countermeasures for securing cyber-physical vehicle systems. Manufacturers are…
November 26, 2019
POST
Free 350 pg. Book on SoC Design and Secure Autonomous Driving Webinar
SIPware Blogs
Silvaco has an upcoming webinar IP Solutions for Secure Autonomous Driving on Dec. 3, 10am – 11am (PST) . The webinar will…
November 21, 2019
POST
Optimization of the Select Gate Transistor in a 3D NAND Memory Cell
TCAD Webinars
Optimization of the Select Gate Transistor in a 3D NAND Memory Cell This webinar will present the usage of TCAD process and…
November 21, 2019
Custom Blogs
Customer Case Study: Using SmartSpice to Deliver Next-Generation, Low Power Memory Systems
At our SURGE Santa Clara event in October, Cameron Fisher, CEO of Mobile Semiconductor described their experience in adopting SmartSpice as their…
November 19, 2019
POST
Silvaco Exhibits and Presents Invited Paper on Atomistic Simulation at IEDM 2019
TCAD Blogs
The IEEE International Electron Devices Meeting (IEDM) is the world’s preeminent forum for reporting technological breakthroughs in the areas of semiconductor and…
November 7, 2019
POST
Simulating Silicon Devices at Cryogenic Temperatures
TCAD Webinars
Simulating Silicon Devices at Cryogenic Temperatures This webinar discusses the problems encountered when using the Drift-Diffusion method to simulate the behavior of…
October 31, 2019
POST
SiC and Other Wide Bandgap Materials: From Process to Device Simulation
TCAD Webinars
This webinar provides an overview of Silvaco’s TCAD tools. It introduces Silvaco’s process and device simulation capabilities for wide bandgap materials. In…
October 25, 2019
POST
How TCAD Can Optimize Power Electronics
TCAD Blogs
The power electronics (PE) market is growing rapidly, driven by the accelerating demand of EV and HEV vehicles. Power devices lend themselves…
October 24, 2019
Custom Blogs
SmartSpice Does It Smart
By this definition, any SPICE simulator qualifies as a smart design tool, but what about versatility? SmartSpice has had over 30 years…
October 24, 2019
POST
AI and Machine Learning SoCs – Memory and Interconnect IP Perspectives
SIPware Webinars
AI and Machine Learning SoCs – Memory and Interconnect IP Perspectives This webinar will discuss the challenges of developing of artificial intelligence…
October 10, 2019
Custom Webinars
On-Chip Variation and the Sign-off Timing Flow: An Industry Perspective
Library Webinars
As semiconductor technology advances, the impact of on-chip variation increases, which means more sophisticated solutions are required.
October 1, 2019
Simulation Standard
Maverick: Hierarchical Netlist Extractor for PC Platforms
Diamond is considered to be the ultimate semiconductor material for high power and high frequency devices due to its superior electrical and…
September 18, 2019
News
MEDIA ALERT: Meet Silvaco at the TSMC OIP Ecosystem Forum
September 18, 2019
September 16, 2019
POST
Silvaco Partners with HDL Design House for Analog and Digital IC Design Services
SPICE News
September 16, 2019
September 9, 2019
POST
The Need for Advanced Wide Bandgap Power Electronics
TCAD Blogs
PowerAmerica’s strategic roadmap for next generation wide bandgap (WBG) power electronics (PE) came out earlier this year. The public version of the…
September 5, 2019
Simulation Standard
Next Generation CMOS Nanowire: From Atoms to Circuit Simulation
Abstract— A complete simulation flow for a Nanowire-based ring oscillator circuit is presented, where the active devices were simulated using an atomistic…
September 4, 2019
POST
3D TCAD Simulation for Power Devices
TCAD Blogs
y first IC design back in 1978 was a DRAM and it ran on 12V, 5V and -5V, but then my second…
September 4, 2019
Simulation Standard
Optimization of Select Gate Transistor in Advanced 3D NAND Memory Cell
Abstract—There are several device challenges unique to the select gate transistor in 3D NAND memory cell. It requires low leakage current to…
September 3, 2019
Simulation Standard
RFSOI Switch Harmonics Simulations with Trap-Rich Substrate
In this paper, in order to understand trap-rich substrate behavior, passive and active device on SOI with trap-rich layer structures were simulated…
September 3, 2019
Simulation Standard
Estimation of Interface Property Changes Between Normally On/Off Hydrogenated Diamond MISFETs
Introduction Diamond is considered to be the ultimate semiconductor material for high power and high frequency devices due to its superior electrical…
August 29, 2019
POST
Where Circuit Simulation Model Files Come From
TCAD Blogs
I started out my engineering career by doing transistor-level circuit design and we used a proprietary SPICE circuit simulator. One thing that…
August 16, 2019
POST
230 Papers on Power Device Simulations using Silvaco TCAD
TCAD Blogs
A quick search of the IEEE Xplore online library gives a list of more than 230 published technical articles on Power Device…
August 15, 2019
Custom Webinars
Fast Capacitance Extraction Within the Expert Layout Editor Using Hipex and the Stellar Solver for a Touch Panel Application
Fast Capacitance Extraction Within the Expert Layout Editor Using Hipex and the Stellar Solver for a Touch Panel Application The Stellar GUI-based…
August 15, 2019
POST
Advanced Materials and New Architectures for AI Applications
TCAD Blogs
Over the past 50 years in our industry, there have been three invariant principles: Moore’s Law drives the pace of Si technology…
August 9, 2019
POST
Everything You Want to Know about Silvaco Foundation IP
SIPware Blogs
In the creation of an ASIC or SoC a wide variety of digital components are needed. Standard logic cells are used to…
August 1, 2019
News
July 26, 2019
POST
System and Method for IP Fingerprinting and IP DNA Analysis
SIPware Blogs
In the world of SoC development, an IP management system is software for the licensing, distribution and compliance administration of design IP…
July 23, 2019
News
July 18, 2019
Custom Blogs
Machine Learning in Silvaco EDA Software
In the following video, Dr. Firas Mohamed, VP & GM, Machine Learning & Flow Optimization Division and GM, Silvaco France talks with…
July 17, 2019
Custom News
July 11, 2019
POST
Silvaco SIPware Automotive IP
SIPware Webinars
Silvaco SIPware Automotive IP Silvaco has partnered with semiconductor leaders like NXP, Infineon and TI to offer a comprehensive portfolio of automotive…
July 11, 2019
POST
I/O Design and Characterization – How Can You Compete with Free?
SIPware Blogs
I interviewed Silvaco partner Stephen Fairbanks, CTO of Certus Semiconductor from the show floor at DAC 2019, in Las Vegas, about I/O…
July 5, 2019
Simulation Standard
TCAD Simulation of Electric Field Distribution in Gallium Nitride Trench-based Power Devices
Introduction Gallium nitride (GaN)-based devices are excellent candidates for high-voltage and high-power applications, due to the superior physical properties of GaN compared…
July 4, 2019
Simulation Standard
Channel-length Dependence of a-IGZO TFTs with Self-heating Effects
Introduction Amorphous In-Ga-Zn-O thin-film transistors (a-IGZO TFTs) show a high mobility, a small sub-threshold swing, and a low OFF-current, and they are…
July 3, 2019
Simulation Standard
Simulation of Different Tunnel Junctions in InGaP/GaAs, InGaP/CdTe Dual Junction Solar Cells
Abstract — Dual junction solar cells were simulated using Silvaco TCAD tool with various tunnel junction material compositions. InGaP/GaAs dual junction solar…
July 2, 2019
POST
Talking Atoms to Systems in Next-Generation SoC Designs
TCAD Blogs
New system-on-chip (SoC) devices are driving new memory architectures and photonic interfaces, while specialized new intellectual property (IP) requires analysis down to…
July 1, 2019
Simulation Standard
Hints, Tips and Solutions – July, August, September 2019
Q. Is it possible to emulate a deep reactive ion etch process (e.g. deep trench with scalloped sidewalls) without using a physical…
June 25, 2019
POST
Robust SPICE Modeling with Verilog-A: Principles and Practical Techniques
Modeling WebinarsSPICE Webinars
Robust SPICE Modeling with Verilog-A: Principles and Practical Techniques Insufficient robustness of models in SPICE circuit simulators may lead to a poor…
June 25, 2019
Custom Blogs
5nm Success – Silicon Creations CEO Video Interview at DAC 2019
In the following video, I interview Silvaco customer Randy Caplan of Silicon Creations from the show floor at DAC 2019, in Las…
June 24, 2019
Webinars for Display Week
Simulation and Analysis of Liquid Crystal on Silicon Pixels for Augmented Reality and Holography Applications
TCAD Webinars
July 24, 2019 Since its invention in the early 1970s, liquid crystal on silicon (LCoS) technology has proven its success in a…
June 18, 2019
POST
Design Flow Applications Using the SmartSpice Analysis Engine
SPICE Webinars
Design Flow Applications Using the SmartSpice Analysis Engine Circuit Simulation is at the heart of many Board, IC and Package design flows.…
June 7, 2019
POST
Launching Samsung Foundry IP as Silvaco IP – What you Need to Know
SIPware Blogs
On Monday, May 13, Silvaco announced that the semiconductor design IP of Samsung Foundry is now marketed, licensed and supported through Silvaco.…
June 3, 2019
POST
CEA-Leti and Silvaco Team Up on Yield-Prediction Project For Ultra-Low-Power Static Memories
Variation News
June 3, 2019
May 30, 2019
POST
Silvaco and Si2 Release Unique, Free 15nm Open-Source Digital Cell Library
Foundation IP News
Silvaco and Si2 Release Unique, Free 15nm Open-Source Digital Cell Library Silvaco Contribution to Si2 Will Improve Innovation in State-of-the Art Nanometer…
May 28, 2019
TCAD Training
Silvaco TCAD: Introduction and the Basics – A Tutorial in 3 Parts
TCAD Webinars
In this 3-part webinar series, viewers will be introduced to the suite of Silvaco TCAD software, and offered starter training and tutorial.…
May 28, 2019
POST
May 28, 2019
TCAD Training
Silvaco TCAD: Introduction and the Basics – Part 3
TCAD Webinars
Silvaco TCAD: Introduction and the Basics – A Tutorial in 3 Parts Part III-TCAD Process Simulation Silvaco TCAD can be applied to…
May 23, 2019
POST
Inventing the Future of MicroLED: Silvaco TCAD
TCAD Blogs
Silvaco did Executive Video Interviews at our booth in the middle of the show floor at Display Week 2019 in San Jose.…
May 22, 2019
Webinars for Display Week
Device Simulation of Oxide Semiconductor TFTs: Device Modeling and Self-Heating Effects
TCAD Webinars
May 22, 2018 This webinar shows how to use Silvaco simulators for OS TFT device simulation. The carrier-electron transport and electronic states…
May 21, 2019
News
Stars of IP Party Tees Off in Las Vegas
May 21, 2019
May 21, 2019
TCAD Training
Silvaco TCAD: Introduction and the Basics – Part 2
TCAD Webinars
Part II of this webinar series takes a dive into creating a new device simulation deck. Attendees will learn how to use…
May 21, 2019
News
May 20, 2019
Custom News
May 19, 2019
POST
Samsung Foundry and Silvaco Begin Partnership to Launch Samsung Foundry Semiconductor IP
SIPware Blogs
On Monday, May 13, Silvaco announced that the semiconductor design IP of Samsung Foundry is now marketed, licensed and supported through Silvaco.…
May 13, 2019
POST
Samsung Foundry Begins Partnership with Silvaco to Launch their Semiconductor IP Assets
Foundation IP News
Samsung Foundry Begins Partnership with Silvaco to Launch their Semiconductor IP Assets Santa Clara, CA – May 13, 2019 – Silvaco Inc., a…
May 13, 2019
News
May 10, 2019
POST
New Whitepaper: Comprehensive Design Solutions for Display Technology
TCAD Blogs
Silvaco has a large booth in the middle of the show floor at Display Week 2019 at the San Jose Convention Center,…
May 7, 2019
TCAD Training
Silvaco TCAD: Introduction and the Basics – Part 1
TCAD Webinars
Silvaco TCAD: Introduction and the Basics – A Tutorial in 3 Parts Part I – Overview of Silvaco TCAD Silvaco TCAD can…
May 2, 2019
Custom Webinars
Accelerate Custom Layout Editing with Expert and JavaScript
Accelerate Custom Layout Editing with Expert and JavaScript Expert is a powerful hierarchical layout editor suitable for a wide variety of design…
April 30, 2019
POST
Managing Design Technology Co-Optimization (DTCO) Using One Command File
TCAD Webinars
Managing Design Technology Co-Optimization (DTCO) Using One Command File This webinar illustrates the advantages of using a single command file and a…
April 26, 2019
POST
Modeling Quantum Dot Based hyLEDs using Radiant
TCAD Blogs
Radiant is a graphical user interface (GUI) for TCAD simulations which lowers the entry barrier for inexperienced users to doing technology analysis.…
April 24, 2019
POST
Unraveling and Optimizing Transistor-Level Simulation
SPICE Webinars
Unraveling and Optimizing Transistor-Level Simulation Circuit Simulation is one of the most critical parts of the design process. Validating circuit behavior is…
April 23, 2019
News
April 23, 2019
POST
Next Generation of SoC Design: From Atoms to Systems
SIPware Webinars
Next Generation of SoC Design: From Atoms to Systems This webinar provides examples of how complex new technologies such as Flash memory,…
April 19, 2019
POST
Design IP for Automotive SoCs: Trends and Solutions
SIPware Blogs
The number and complexity of automotive SoCs and Control Systems is growing dramatically to fill the demand for new features in next-generation…
April 16, 2019
News
April 6, 2019
Custom Blogs
Six-Sigma Analysis of Digital Standard Cells
library of digital standard cells implements both Boolean logic and sequential storage functions. These foundation IPs are used extensively and repeatedly within…
April 4, 2019
TCAD Training
Introduction to Atomistic Simulation for Nanodevices
TCAD Webinars
Introduction to Atomistic Simulation for Nanodevices This webinar will provide introduction to the atomistic simulation capabilities of NEMO5, which is evolving into…
April 1, 2019
Simulation Standard
Process Simulation – New Features in 2019 Baseline Release
2019 baseline release of Victory Process includes improvements and extensions to the following modules: Physical etching/deposition Stress simulation Annealing/oxidation
April 1, 2019
Simulation Standard
Meshing – New Features in 2019 Baseline Release
The 2019 TCAD baseline release of Victory Mesh now contains Solid Modeling functionality. The term Solid Modeling is used to refer to…
April 1, 2019
Simulation Standard
Device Simulation – New Features in 2019 Baseline Release
The effect of Coulomb interaction in the absorption spectrum of quantum wells (QWs) is responsible for the quantum confined Stark effect (QCSE),…
April 1, 2019
Simulation Standard
Interactive Tools – New Features in 2019 Baseline Release
DeckBuild is Silvaco’s state of the art simulator interface. It is capable of running all simulators from Silvaco as well as many…
April 1, 2019
Technical Libraries
Bipolar Technology
Bipolar TechnologyTCAD Published Papers
Bipolar Technology The full text for most of these papers may be found at the IEEE website at www.ieee.org. A. S. Zoolfakar, N.…
March 26, 2019
POST
TCAD-based Model Extraction Flow for GaN HEMT Devices – Part 2
Modeling WebinarsTCAD Webinars
TCAD-based Model Extraction Flow for GaN HEMT Devices – Part 2 This webinar represents a continuation of a previously presented parameter extraction…
March 22, 2019
POST
Remembering Dr. Misha Temkin, Aug. 1955 – Mar. 2019
TCAD Blogs
Dr. Misha Temkin was a beloved colleague and researcher who worked at Silvaco for over 30 years. He passed on March 12,…
March 21, 2019
POST
Challenges and Solutions of Nanometer Library Characterization
Library BlogsSIPware Blogs
Graham Bell sits down with Bernardo Culau, Director of Characterization, to discuss the challenges and Solutions of Nanometer Library Characterization. They also…
March 21, 2019
POST
Nanometer Library Characterization: Challenges and Solutions
Library WebinarsSIPware Webinars
Nanometer Library Characterization: Challenges and Solutions Designers today see a significant increase in the number of simulations and PVT corners required to…
March 15, 2019
POST
Chris Browy of Avery Design Sits Down to Discuss Why Silvaco and Avery are Working Together
SIPware Blogs
Silvaco just announced an agreement with Avery Designs for the distribution of Avery’s verification IP (VIP) for the MIPI I3C sensor interface…
February 28, 2019
POST
Simulation of Reliability and NBTI Aging in MOS Microelectronics
TCAD Webinars
Simulation of Reliability and NBTI Aging in MOS Microelectronics The continuous scaling of semiconductor devices is a driving force in the field…
February 26, 2019
News
February 25, 2019
POST
Silvaco, Inc. and Avery Design Systems Partner to Deliver Complete CAN-FD Automotive and MIPI I3C IP and VIP Solutions
Foundation IP News
Silvaco, Inc. and Avery Design Systems Partner to Deliver Complete CAN-FD Automotive and MIPI I3C IP and VIP Solutions TEWKSBURY, MA. and…
January 28, 2019
Custom News
January 15, 2019
Webinars for Display Week
TCAD Solution for Flexible Display
TCAD Webinars
January 15, 2018 In this webinar, we review the basic elements of device design for flexible displays, including the key factors affecting…
January 1, 2019
Simulation Standard
3D TFT Simulation of Grains and Grain Boundaries
Introduction Low-temperature polycrystalline silicon (LTPS) thin-film transistors have been widely applied to AMOLED (Active Matrix Organic Light Emitting Diode) as the most…
January 1, 2019
Simulation Standard
Quantum Dot-Based Hybrid Light Emitting Diode Modelling Using Radiant
Introduction With the recently launched Radiant, a graphical user interface (GUI) for Atlas-based TCAD simulations, the entry barrier for inexperienced users has…
January 1, 2019
Simulation Standard
Verification of an Compact Model for Organic Thin-Film-Transistors by Using MixedMode Creating an CMOS Inverter Circuit with TCAD Transistor Devices
Organic thin-film transistors (OTFTs) are promising devices for future low-cost electronics[1][2]. However, to enable the development of this technology, circuit design simulation…
January 1, 2019
Simulation Standard
Hints, Tips and Solutions – Movie and PDF Report Generation with the DeckBuild GUI
Introduction In this article we will emphasize two new features of the DeckBuild deck editing environment. These are the movie creation on…
December 18, 2018
Custom Blogs
SPICE Model Generation by Machine Learning
by Thomas Blaesi It was 1988 when I got into SPICE (Simulation Program with Integrated Circuit Emphasis) while I was characterizing a…
December 18, 2018
POST
Improving Memory on the Edge Using Octal Serial Flash Cache
SIPware Webinars
Improving Memory on the Edge Using Octal Serial Flash Cache This webinar will discuss the various solutions for storing and executing microprocessor…
December 11, 2018
POST
Bandstructure Effects in Nano Devices
TCAD Webinars
Bandstructure Effects in Nano Devices&Examples Using NEMO5 As semiconductor device and circuit engineers we traditionally think of band edges and effective masses…
December 6, 2018
POST
SPICE Modeling for Flexible Electronics
Modeling WebinarsTCAD Webinars
SPICE Modeling for Flexible Electronics Flexible electronics has an exciting potential for enabling bendable, rollable and foldable displays, smart product labeling as…
November 29, 2018
POST
MIPI I3C
SIPware Webinars
MIPI I3C LEARN ABOUT MIPI I3C ALLIANCE STANDARD This webinar will provide a discussion of a new a standard from the MIPI…
October 1, 2018
Simulation Standard
Process Variation, Alignment and BEOL Effects on Circuit Level Performance
As process nodes continue to shrink, the requirement for additional physics is gradually creeping into each stage of the design process. By…
October 1, 2018
Simulation Standard
Touch Panel Capacitance Extraction in Hipex Full Chip Extraction Tool Using Stellar Field Solver
The previously standalone Stellar GUI based field solver tool for parasitic extraction is now integrated into Hipex (Silvaco’s full chip extraction tool)…
October 1, 2018
Simulation Standard
Dynamic Analysis of Liquid Crystal Pixels
We have demonstrated in previous articles the static electrical and optical simulation of LC cells [1][2]. The last piece of the function…
October 1, 2018
Simulation Standard
Hints, Tips and Solutions – Adding An Impurity to a Diffusion Model and Enable Diffusion of a New Impurity in a Specific Material
OBJECTIVE Add an impurity (H) to a material (silicon) for a diffusion model (Fermi). The description below refers to Victory Process version…
September 20, 2018
POST
Memory Statistical Characterization Solution with VarMan
Variation Webinars
Memory Statistical Characterization Solution with VarMan With each new semiconductor process node, process variation, both global and local, play an increasingly significant…
August 21, 2018
POST
How FPD Designers Can Improve Productivity
TCAD Webinars
This webinar will provide a discussion about new features of Silvaco’s Layout Editor tool (Expert) for improving design productivity on FPD layout.
July 19, 2018
POST
TCAD-based Model Extraction Flow for GaN HEMT Devices – Part 1
Modeling WebinarsTCAD Webinars
TCAD-based Model Extraction Flow for GaN HEMT Devices This webinar will present a model parameter extraction methodology for GaN HEMT devices. This…
July 12, 2018
Custom Webinars
Standard Cell Layout Migration and Optimization
Library Webinars
Standard Cell Layout Migration and Optimization This webinar will present an efficient methodology for migrating and optimizing standard cell libraries. Foundation IP…
July 1, 2018
Simulation Standard
3D Topography Simulation of SiC Epitaxial Growth Modeled by Diffusive Flux and Gibbs-Thomson Effect
One of wide bandgap semiconductors, SiC has been widely applied to the power devices, and then, the super-junction MOS transistor of SiC…
July 1, 2018
Simulation Standard
An Empirical Composition Dependent Model of Dopant Diffusion Coefficients in Si, Si1-x Gex and Ge Material Systems
Previously published fast empirical models for diffusion coefficients in silicon-germanium (Si1-x Gex) [1][2] were not applicable to high germanium content x≥0.5 and…
July 1, 2018
Simulation Standard
TCAD Simulation of Leakage Through Threading Dislocations in GaN-based pn-diodes
Gallium nitride (GaN)-based devices for power electronics show superior performance in comparison to silicon carbide and silicon-based devices [1]–[3]. The development of…
July 1, 2018
Simulation Standard
Hints, Tips and Solutions – DeckBuild Remote VM Setup
This document describes how to setup a virtual environment suitable for the deckbuild remote mode. The host system to consider shall be…
June 21, 2018
TCAD Training
Introduction to TCAD – Device Theory Put into Practice
TCAD Webinars
Introduction to TCAD – Device Theory Put into Practice TCAD process and device simulation is a powerful 2D and 3D modeling tool…
June 19, 2018
Custom Webinars
Exploration and Comparison of Various Parasitic Solutions and Parasitic-centric Calculations
Exploration and comparison of various parasitic solutions and parasitic-centric calculations This webinar will provide an overview on methods and tools to review…
June 14, 2018
POST
Bringing IP Management to the Enterprise Level
SIPware Webinars
Bringing IP Management to the Enterprise Level IP reuse is no longer a new thing—it is the lifeblood of any semiconductor company,…
May 17, 2018
POST
How TCAD Can Help You to Find The Right Material To Build Your Flexible Display
TCAD Webinars
How TCAD Can Help You to Find The Right Material To Build Your Flexible Display The mechanical stress in a thin-film transistor…
April 12, 2018
POST
Subsystem Insight
SIPware Webinars
Subsystem Insight Debugging Silvaco Subsystems with IAR Embedded Workbench Silvaco and IAR Systems have teamed up to provide software solutions for Silvaco’s…
April 1, 2018
Simulation Standard
TCAD Simulation of Si and GaAs p-n Junction Devices at Cryogenic Temperatures, Down to 2 K
Cryogenic electronics plays a fundamental role in several applications, such as spacecraft, high-energy physics experiments, metrology, superconductive astronomical detectors and, with the…
April 1, 2018
Simulation Standard
Bi-axial Deformation with Victory Mesh for Flexible Electronic Applications
For high performance large area flexible electronics, amorphous metal oxide semiconductor based thin film transistors offer many advantages. These include high mobility,…
April 1, 2018
Simulation Standard
TCAD-based GaN HEMT Scalable Modeling Flow Using the MVSG Compact Model
Gallium Nitride High Electron Mobility (GaN HEMT) device technology has gained a lot of traction during the last years. These devices have…
April 1, 2018
Simulation Standard
Hints, Tips and Solutions – Adding Random Noise to Mask Layout
Geometrical module of Victory Process allows the fast and accurate transfer of mask patterns to the structure. However, sometimes it is necessary…
March 29, 2018
POST
Accurate Parasitic RC Extraction using Realistic 3D TCAD Structures
TCAD Webinars
Accurate Parasitic RC Extraction using Realistic 3D TCAD Structures Accurate determination of RC parasitics is a key component in the design and…
February 28, 2018
POST
Standard Cell Statistical Characterization with VarMan
Variation Webinars
Standard Cell Statistical Characterization with VarMan With each new semiconductor process node, process variation, both global and local, play an increasingly significant…
February 18, 2018
POST
SPI vs SPI
SIPware Webinars
SPI vs SPI This webinar will provide a discussion of Silvaco’s SPI, QSPI, and OSPI IP products and how they are useful…
January 1, 2018
Simulation Standard
Advanced Process and Device 3D TCAD Simulation of Split-Gate Trench UMOSFET
Lower conduction loss and fast switching characteristics for power devices are increasingly required in the more and more energy-conscious world. For the…
January 1, 2018
Simulation Standard
Using TCAD to Reverse Engineer a 2N2222 BJT for Proton Damage Simulations
It is often the case, that an Engineer is required to simulate environmental effects on a device manufactured by a third party. …
January 1, 2018
Simulation Standard
Optimization of PD-SOI CMOS Process and Devices for RF Applications
In recent years, radio-frequency (RF) CMOS on Silicon-on-Insulator (SOI) has rapidly evolved as a mainstream technology for switches used in wireless applications…
December 7, 2017
Custom Webinars
iPDK integration into Gateway Schematic Capture
iPDK integration into Gateway Schematic Capture This webinar will provide a discussion of the integration of iPDK design kits into the Gateway…
October 25, 2017
POST
TCAD Simulation of Ion Transport and Electrochemistry
TCAD Webinars
TCAD Simulation of Ion Transport and Electrochemistry This webinar will discuss the simulation of ion transport and electrochemistry in semiconductor devices. These…
October 1, 2017
Simulation Standard
W-element Field Solvers
In connection with the reduction in the size of electronic elements and the increase in operating frequencies, it becomes necessary to transmit…
October 1, 2017
Simulation Standard
SmartSpice Shared Mode API
SmartSpice API, shared mode, was developed in order to provide an easy to use solution for products requiring the analog SPICE core…
October 1, 2017
Simulation Standard
Temperature Properties of Amorphous In-Ga-Zn-O Thin-Film Transistors with a new Mobility Model
Amorphous In-Ga-Zn-O (a-IGZO), which is a typical amorphous oxide conductor (AOS), is considered to be one of the most promising channel materials…
October 1, 2017
Simulation Standard
Automated Stress Simulation Interface Between Victory Process and Device
Victory Process now includes the Victory Stress library directly within the process simulator, which removes the necessity to keep switching from process…
October 1, 2017
Simulation Standard
TCAD Simulation of GaN-based Vertical FETs (HEMTs)
Gallium nitride (GaN)-based devices have entered the power electronics market and are showing excellent progress in the medium power conversion application [1]-[5].…
September 12, 2017
POST
Getting to Know the New MIPI Alliance I3C Standard
SIPware Webinars
Getting to Know the New MIPI Alliance I3CSM Standard Mobile devices today contain a rich assortment of sensors that need to communicate their…
July 1, 2017
Simulation Standard
Calculating Failures In Time Rates for FinFET Circuits Using TCAD
In a previous article in Simulation Standard article entitled “Soft Error Simulations”, we discussed various ways to simulate soft errors using either…
July 1, 2017
Simulation Standard
Optical Simulation of Liquid Crystals in the In-plane Switching Mode
Liquid Crystals (LCs) are widely used in the display technology due to the property of optical birefringence. Being sandwiched by two crossed…
July 1, 2017
Simulation Standard
TCAD Simulations of TFET and Tunneling Diode
Researchers and designers are looking into a future of ultra-low power and ultra-low voltage (ULV) devices and designs. Portable devices, nodes, and…
July 1, 2017
Simulation Standard
TFT Panel Simulation Using SmartSpice Pro
TFT panels have already gained their undisputable reputation in a variety of professional and commercial applications. High quality, ease of customization, and…
May 16, 2017
POST
Accelerating TFT and FPD Design
TCAD Webinars
Accelerating TFT and FPD Design This webinar will provide an overview of different techniques for TFT and FPD design enabled by the…
May 4, 2017
POST
Enabling TCAD for TFT, LCD & OLED Display Designs
TCAD Webinars
Enabling TCAD for TFT, LCD & OLED Display Designs This webinar will provide an insight into different TCAD-based simulation techniques that designers…
April 20, 2017
Custom Webinars
Get a Head Start on Reliability Analysis Early in Your Design Cycle
Get a Head Start on Reliability Analysis Early in Your Design Cycle Power integrity issues must be addressed as early in the…
April 1, 2017
Simulation Standard
Model Extraction for Body-Biased XDMOS Devices
Compared with regular MOSFET devices, the body bias effect in HVMOS is usually more pronounced. In addition to the regular threshold voltage…
April 1, 2017
Simulation Standard
Edge Effect Analysis on TFT Devices Using 3D Numerical Simulation
3D TFT analysis has been getting lots of attention due to issues caused by 3D effects such as the edge effect on…
April 1, 2017
Simulation Standard
3D Simulation of Dual-Gate Thin Film Transistors
Dual-Gate Thin Film Transistors (DGTFTs) are often used in pixel driver and peripheral circuits for liquid crystal displays. This is because of…
April 1, 2017
Simulation Standard
Effect of Fin Thickness on Subthreshold Characteristics of 10 nm FinFETs Using 3D TCAD
The planar bulk Si metal-oxide semiconductor field-effect transistor (MOSFET) has reached its scaling limit due to various short channel effects (SCE). With…
March 23, 2017
Custom Webinars
Secrets of Parasitic Extraction Unveiled
Secrets of Parasitic Extraction Unveiled! Parasitic extraction is a mandatory step for physical design sign off, and at advanced nodes, parasitics substantially…
February 17, 2017
POST
Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD
TCAD Webinars
Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD This webinar will provide specific approaches for simulating electronic device behavioral…
January 26, 2017
POST
TCAD Simulation of Organic Optoelectronic Devices
TCAD Webinars
TCAD Simulation of Organic Optoelectronic Devices This webinar will introduce Radiant developed as an integrated simulation environment of LED and OLED devices…
January 1, 2017
Simulation Standard
Simulation of a Bipolar Junction Transistor Under High and Low Current Injection Conditions
Semiconductor devices such as bipolar power transistors and solar cells may operate over a range of optical or electrical injection levels. In…
January 1, 2017
Simulation Standard
Thermo-mechanical Stress in Through-Silicon-Vias
During the last several years, the enhancement of integrated circuits (ICs) performance and power consumption have contributed to the continual scaling down…
January 1, 2017
Simulation Standard
Hints, Tips and Solutions – Extract geometric information from 3D process simulation
Q: How do I extract geometric information, such as material thickness or junction depth, from the current 3D process simulation using Victory…
December 8, 2016
POST
Victory Process 2D – An Innovative Alternative to SUPREM-based Simulators Ensuring Robust 3D Solutions
TCAD Webinars
Victory Process 2D – An Innovative Alternative to SUPREM-based Simulators Ensuring Robust 3D Solutions Two-dimensional process simulators based on SUPREM-IV from Stanford…
November 10, 2016
POST
Statistical Analysis Flow for Analog Design with VarMan
Variation Webinars
Statistical Analysis Flow for Analog Design with VarMan The impact of variation on analog design has become critical with the advanced nodes…
October 1, 2016
Simulation Standard
TCAD Simulation of Impact Ionization at Cryogenic Temperatures, down to 3 K
Some electronic devices operate at very low, cryogenic temperatures, sometimes as low as 4 K, which is the temperature of liquid helium.…
October 1, 2016
Simulation Standard
Stress Induced by Intrinsically Strained Silicon Nitride Passivation Films of AlGaN/GaN HEMTs Using Victory Process 2D
In the AlGaN/GaN HEMT fabrication process, silicon nitride (Si3N4) passivation of the HEMT surface layer, which is typically AlGaN, is commonly used…
October 1, 2016
Simulation Standard
Victory Process 2D – A Valuable Alternative To SUPREM-based Simulators
SUPREM-IV – Stanford University PRocEss Modeling Program was first released 30 years ago. Since then its descendants - Athena from Silvaco and…
September 27, 2016
POST
TCAD Simulation of Organic Optoelectric Devices
TCAD Webinars
This webinar will introduce Radiant developed as an integrated simulation environment of LED and OLED devices and will focus on an OLED
September 14, 2016
IP
Semiconductor IP Community Joins Forces To Launch IP Tradeshow and Conference
Semiconductor IP Community Joins Forces To Launch IP Tradeshow and Conference REUSE 2016 Event Focuses Exclusively on Fastest Growing Segment of the…
August 9, 2016
POST
WeEn Semiconductors Selects Silvaco’s TCAD Products for Advanced Bipolar Power Device Design
TCAD News
August 9, 2016
July 26, 2016
Custom Webinars
Power Distribution Network Analysis for Layout Engineers
Power Distribution Network Analysis for Layout Engineers This webinar will provide an overview of Silvaco’s new reliability analysis tool InVar Prime. InVar…
July 1, 2016
Simulation Standard
Simulation of Device Degradation Due to Bias Temperature Stress
Introduction Bias Temperature Instability (BTI) [1] ranks among the most serious reliability issues in present-day semiconductor devices. In pMOSFETs, for instance, it…
July 1, 2016
Simulation Standard
Using Victory Process to Create Realistic Structures for Capacitance Extraction in Clever
Silvaco offers many alternatives for creating simple 3D structures, the optimum choice depending on what the user needs to simulate. Many of…
July 1, 2016
Simulation Standard
Hints, Tips and Solutions – How to best visualize vectors and field lines in TonyPlot
Traditionally, visualizing vectors by means of arrows in TonyPlot was a challenge, especially in the areas where the computational grid was dense.…
July 1, 2016
Simulation Standard
Hints, Tips and Solutions – Scattering mechanisms contributing to reduced channel mobility in 4H-SiC MOSFETs
In a MOSFET structure, silicon carbide, 4H-SiC in particular, is known to exhibit lower channel mobility than Si, mainly due to Coulomb…
June 30, 2016
POST
TCAD Usability: DeckBuild and Virtual Wafer Fab
TCAD Webinars
TCAD Usability: DeckBuild and Virtual Wafer Fab This webinar will give a demonstration of the tools DeckBuild and Virtual Wafer Fab, which…
June 28, 2016
IP
Silvaco Expands Automotive IP Portfolio With Release of CAN FD Core
Silvaco Expands Automotive IP Portfolio With Release of CAN FD Core Collaboration with NXP Semiconductor Provides Customers with Key Roadmap Technology for…
June 23, 2016
POST
TCAD Simulation of Wide Bandgap Power Devices – English
TCAD Webinars
TCAD Simulation of Wide Bandgap Power Devices Simulation of wide bandgap power devices has always posed convergence challenges. In addition to this,…
May 24, 2016
POST
TCAD Simulation of Wide Bandgap Power Devices – Japanese
TCAD Webinars
TCAD Simulation of Wide Bandgap Power Devices Simulation of wide bandgap power devices has always posed convergence challenges. In addition to this…
April 28, 2016
POST
Simulation of Physical Etching in Memory Technology
TCAD Webinars
Simulation of Physical Etching in Memory Technology This webinar will provide a deep insight into the methods, mechanisms and models to simulate…
April 14, 2016
POST
Efficient 3D TCAD Simulation of Silicon Power Devices
TCAD Webinars
Efficient 3D TCAD Simulation of Silicon Power Devices It is well known that TCAD simulation can save time and money since it…
April 1, 2016
Simulation Standard
Soft Error
A soft error in the context of this article, can be defined as an unintended change in electrical state of a device…
April 1, 2016
Simulation Standard
Hints, Tips and Solutions – Types of 3D Delaunay Shape Refinement
Q: What Types of 3D Delaunay Shape Refinement can be used in Victory Process? A. The Victory Process cell mode Delaunay 3D…
March 31, 2016
POST
Variation aware design for advanced nodes and low power technologies
Variation Webinars
Variation aware design for advanced nodes and low power technologies Designers’ characterization and verification tasks have become more critical due to scaled…
March 17, 2016
Custom Webinars
Easy design migration to Silvaco Custom Design flow via OpenAccess
Easy design migration to Silvaco Custom Design flow via OpenAccess This webinar will provide an overview for how circuit designers can use…
March 17, 2016
Custom Webinars
Easy design migration to Silvaco Custom Design flow via OpenAccess
Easy design migration to Silvaco Custom Design flow via OpenAccess This webinar will provide an overview for how circuit designers can use…
January 1, 2016
Simulation Standard
Blue LED Simulation
It is very important to understand the operation and underlying physics of InGaN/GaN materials based electronic device in modern display industry such…
January 1, 2016
Simulation Standard
Unified Victory Conformal Export for 2D Process Mode
Victory Process can operate in either 1, 2 or 3-dimensions and can produce one of two different geometric representations: cell mode and…
January 1, 2016
Simulation Standard
a-IGZO TFT Simulation
The flat panel device for active matrix liquid crystal displays (AMLCDs) and active matrix organic light-emitting diode displays (AMOLEDs) has utilized a…
January 1, 2016
Simulation Standard
Hints, Tips and Solutions – Crop and Slice using a non-convex mask in Victory Process export
Q. How can I Crop and Slice using a non-convex mask during the export? Non-Convex Mask Polygons Non-Convex Mask Polygons Previous Victory…
December 16, 2015
POST
Solar cell modeling using TCAD and SPICE
Modeling WebinarsSPICE WebinarsTCAD Webinars
Solar Cell Modeling Using TCAD and SPICE In this webinar a review of the TCAD-to-SPICE simulation flow of solar cells and solar…
October 1, 2015
Simulation Standard
Performance Evaluation of a New Hybrid MPI-thread Parallelized Direct Solver
The solution of linear systems lies in the core of any TCAD simulation. On any nonlinear step of the computation a linear…
October 1, 2015
Simulation Standard
Deep Hole Etching Simulation for Advanced NAND Flash Memory
The NAND Flash memory cell has been refined to reduce the bit cost, but the limit of its miniaturization has been reached…
October 1, 2015
Simulation Standard
Optical Simulation of Organic Light Emitting Diode by Transfer Matrix Method with a Green’s Function Approach and 2D FDTD
Organic light emitting diode (OLED) has been getting much attention over the past decades in the field of displays and lighting applications…
October 1, 2015
Simulation Standard
3D TCAD Mixed-Mode Simulation of Current Filaments in IGBT Multicell Array under Short-Circuit Condition
A power IGBT (Insulated Gate Bipolar Transistor) is conventionally made up of a repetitive array of homogenous IGBT cells. Such a homogenous…
October 1, 2015
Simulation Standard
Hints, Tips and Solutions – Create scalable devices with Victory Process
Deckbuild supports variable substitution for both numerical and string variables using the SET statement and the $ symbol, thus allowing users to…
September 29, 2015
Custom Webinars
Power Integrity and Reliability Analysis
Power Integrity and Reliability Analysis This webinar will provide an overview of Silvaco’s power integrity and reliability analysis tool, InVar. InVar’s concurrent…
September 29, 2015
Custom Webinars
Power Integrity and Reliability Analysis
Power Integrity and Reliability Analysis This webinar will provide an overview of Silvaco’s power integrity and reliability analysis tool, InVar. InVar’s concurrent…
July 1, 2015
Simulation Standard
Improvements and Features of the Updated DeckBuild 2 GUI
In this article we will emphasize the new features and improvements of the DeckBuild 2 deck editing environment. We will start by…
July 1, 2015
Simulation Standard
Performance Improvement by MPI Parallelization in 3D Device Simulation
As the design technology for power devices, such as MOSFET, GTO, and IGBT has matured, the importance of large domain 3D TCAD…
July 1, 2015
Simulation Standard
Electrical Simulation of Liquid Crystals
Liquid Crystals (LCs) are state of matter intermediate between that of a crystalline and a liquid. The optical, mechanical, electrical and magnetic…
July 1, 2015
Simulation Standard
Hints, Tips and Solutions – Local conformal mesh refinement in Victory Process
The Victory Process conformal export is generated from the volume planes specified in a user deck. The accuracy and resolution of the…
May 1, 2015
Custom Webinars
Partitioning and DRC for 3D systems & ICs
Partitioning and DRC for 3D systems & ICs 3D integration of ICs and systems is enhancing cost scaling of “More than Moore”…
May 1, 2015
Custom Webinars
Partitioning and DRC for 3D systems & ICs
Partitioning and DRC for 3D systems & ICs 3D integration of ICs and systems is enhancing cost scaling of “More than Moore”…
April 1, 2015
Simulation Standard
Radiant: GUI-based Design Software for Performing Simulations of Optoelectronic Thin Film Devices Such as LED and OLED
Device simulation helps users understand and depict the physical processes in a device and to make reliable predictions of the behavior of…
April 1, 2015
Simulation Standard
Optimizing Solar Cell Top Metal Contact Design Introduction
Among the many design criteria for solar cells, the design of the top metal contact impacts the cell efficiency. The areal density…
April 1, 2015
Simulation Standard
Vertical LOCOS Power Devices in Victory Process: From 3D Process and Electrical Optimisation to High Speed, Full Chip Process Emulation
There is a constant demand to lower the on-state resistance of devices, improving their energy efficiency as well as increasing their current…
April 1, 2015
Simulation Standard
Hints, Tips and Solutions – Mirror 3D structures in Victory Process
Victory Process supports mesh generation for device simulation using many common algorithms. The primary two are conformal and delaunay. A simple process…
March 28, 2015
POST
High Voltage Power Device Modeling with HiSIM_HV 2
Modeling Webinars
High Voltage Power Device Modeling with HiSIM_HV 2 This webinar will provide a comprehensive overview of model parameter extraction for high voltage…
February 17, 2015
POST
Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD
TCAD Webinars
Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD This webinar will provide specific approaches for simulating electronic device behavioral…
January 1, 2015
Simulation Standard
Plasmonic Light Trapping Transforming Thin-Film Photovoltaics
The photovoltaics (PV) market represents the fastest growing renewable energy technology, with a 35% annual growth rate, which is projected to be…
January 1, 2015
Simulation Standard
Hints, Tips, and Solutions – Defining VWF Curve Target For Curve Calibration
VWF allows a curve as target for optimization. This feature greatly benefits the users who need to calibrate TCAD simulation against measured…
January 1, 2015
Simulation Standard
Hints, Tips, and Solutions – Crop and Slice in the Victory Process 3D Exports
This document is a short guide on the new and existing support for export cropping/slicing in Victory Process cell mode. The cropping…
January 1, 2015
Simulation Standard
Hints, Tips and Solutions – Develop your own etch model in Victory Process
Background: Victory Process is packaged with a wide range of etch models. Victory Process also supports an “Open Modelling Interface” (OMI). The…
October 1, 2014
Simulation Standard
Simulating Radiation-Induced Shifts in MOSFET Threshold Voltage
Irradiation by energetic particles can degrade semiconductor device performance. The particles involved can be electrons, positrons, neutrons, protons, alpha particles, heavy ions,…
October 1, 2014
Simulation Standard
Mixed Mode Radiation Event Detector
A reversed biased PIN diode acts as a radiation event detector, sensing the occurrence of an ionizing radiation pulse, which is connected…
October 1, 2014
Simulation Standard
Displacement Damage
Two fundamental damage mechanisms take place when devices are exposed to particle fluences: ionization and lattice displacement or just displacement damage. Ionization…
October 1, 2014
Simulation Standard
Radiation-Induced Current Leakage Between Two n-MOSFET’s
The Simulation Standard article “Simulating Radiation-Induced Shifts in MOSFET Threshold Voltage”1 gives a brief overview of the ways that ionizing radiation can…
July 1, 2014
Simulation Standard
Multiple SEU Strike Simulations on a Six Transistor 20nm SRAM Cell
It is often not realized that more than one Single Event Upset (SEU) statement can be used in a simulation. Each SEU…
July 1, 2014
Simulation Standard
The Physics of Single Event Burnout (SEB)
Single Event Burnout in a diode, requires a specific set of circumstances to occur, since there is no intrinsic current gain in…
July 1, 2014
Simulation Standard
Hints, Tips, and Solutions – Types of 3D Delaunay Shape Refinement in Victory Process
The Victory Process cell mode Delaunay 3D device meshing algorithm already includes various TCAD-based local refinement algorithms to ensure accurate and robust…
July 1, 2014
Simulation Standard
Hints, Tips and Solutions – Meshing a Non Axis Aligned SEU Beam
Q: I have an SEU beam in a 2D structure; the beam track is at an angle through the device. I don’t…
April 1, 2014
Simulation Standard
Hints, Tips, and Solutions – Calculate Light Extraction Efficiency in an OLED or LED with Pure Optical Simulation
Calculation of light extraction efficiency or optical output coupling efficiency is often needed in simulating a light emitting device (LED) such as…
April 1, 2014
Simulation Standard
Hints, Tips, and Solutions – Achieve Publication Quality Plots Using TonyPlot
Yes, TonyPlot has many various display and preference settings that users can adjust, transforming their simulation data into a high quality plot…
April 1, 2014
Simulation Standard
Simulations of Deep-Level Transient Spectroscopy for 4H-SiC
Silicon carbide is expected to be an excellent device material as high voltage and low-loss power devices. Recently, SBD (Schottky Barrier Diode)…
April 1, 2014
Simulation Standard
Generally Applicable Degradation Model for Silicon MOS Devices
The main cause of operational degradation in MOS devices is believed to be due to the buildup of charge at the Silicon-Oxide…
March 27, 2014
POST
Leakage Current TCAD Calibration in a-Si TFTs
TCAD Webinars
Leakage Current TCAD Calibration in a-Si TFTs This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors…
February 27, 2014
POST
TCAD to SPICE simulation of SiC and Si Power Devices
SPICE WebinarsTCAD Webinars
TCAD to SPICE Simulation of SiC and Si Power Devices – Archive This webinar will provide a discussion of the methods used…
January 27, 2014
POST
Modeling and Analysis of Single Event Effects
TCAD Webinars
Modeling and Analysis of Single Event Effects – Archives This webinar will provide a discussion of the methods used by radiation effects…
January 1, 2014
Simulation Standard
Hints, Tips, and Solutions – Simulation on a Cluster of Computers Using the Distributed Computing Feature
A new feature that is introduced in Silvaco’s TCAD applications allows the user to run a parallel simulation on a cluster of…
January 1, 2014
Simulation Standard
Hints, Tips and Solutions – Illuminate a 3D device in a Victory Device Opto-electronic Simulation
A: The 2 basic commands needed to illuminate a structure in Victory Device are BEAM and SOLVE. A single (or multiple) BEAM statement(s) are specified containing the…
January 1, 2014
Simulation Standard
Atlas Simulation of GaN-Based Super Heterojunction Field Effect Transistors Using the Polarization Junction Concept
Wide-bandgap semiconductors such as SiC and GaN have attracted much attention because they are expected to break through the material limits of…
January 1, 2014
Simulation Standard
Modeling the Optical Response of Phonon-dressed Excitons in OLED Simulations
We demonstrate the modeling of optical response of exciton-polarons based on the well established Holstein Hamiltonian to model coupled exciton-phonon systems in…
October 1, 2013
Simulation Standard
Hints, Tips, and Solutions – Simulate Rapid Thermal Annealing Temperature Transients in Vacuum
When a wafer is clamped only at its edges and is heated with an infra-red source in a vacuum, the majority of…
October 1, 2013
Simulation Standard
Atlas Simulation of a Wide Bandgap Gallium Oxide (Ga2O3) MOSFET
Single-crystal gallium oxide (Ga2O3) has attracted increasing attention as a promising material for power device applications. It possesses excellent material properties and…
October 1, 2013
Simulation Standard
Simulation of a DBR Edge Emitting Laser with External Air Gap Tuning Mirror
A methodology for simulating an edge emitting laser is demonstrated that incorporates a distributed Bragg Reflector (DBR) as one of the mirrors,…
July 1, 2013
Simulation Standard
Anode Shorts Layout Dependence of Bi-mode IGBT (BiGT) On-state Characteristics
A new class of high-voltage semiconductor devices, known as a reverse conducting IGBT (RC-IGBT), has emerged in recent years from research efforts…
July 1, 2013
Simulation Standard
Hints, Tips and Solutions – Compare the Results of Breakdown Simulations with Hatakeyama’s Impact Ionization Model for 4H-SiC Based Power Devices
In a 4H-SiC crystal, the stacking sequence of a Si-C bilayer plane extends along the crystallographic c-axis direction, also referred to as…
July 1, 2013
Simulation Standard
2D IBC-SHJ Solar Cell Simulation and Optimization
Interdigitated back contact silicon heterojunction (IBC-SHJ) combines the advantages of interdigitated back contact (IBC) and silicon heterojunction (SHJ) solar cells. Having all…
July 1, 2013
Simulation Standard
State of the Art 2D and 3D Process and Device Simulation of GaN-Based Devices
Silicon has long been the semiconductor of choice for high-voltage power electronics applications. However, wide-bandgap semiconductors such as SiC and GaN have…
April 1, 2013
Simulation Standard
Hints, Tips and Solutions – Setup Athena Monte Carlo Simulation of Ion Implantation in Silicon Carbide
Monte Carlo module of Athena allows accurate simulation of ion implantation in 4H-SiC and 6H-SiC [1]. It is known that channeling effects…
April 1, 2013
Simulation Standard
TCAD Simulation of Multiple Quantum Well Infrared Photodetector (QWIP)
We demonstrate the capabilities of SILVACO TCAD tools for the design and simulation of intersubband GaAs/AlGaAs multiple quantum well infrared photodetectors. We…
April 1, 2013
Simulation Standard
The Extended Gaussian Disorder Model in Atlas
In this article the various enhancements to the organic device modeling that have been implemented recently in Atlas are presented. Following the…
April 1, 2013
Simulation Standard
Simulation of Ion Beam Etching of Patterned Nanometer-scale Magnetic Structures for High-Density Storage Applications
Fabrication of various nano-structures often requires mask controlled or patterned etching of materials. The chemical or wet etch methods cannot be used…
January 1, 2013
Simulation Standard
State of the Art 3D SiC Process and Device Simulation
Silicon has long been the semiconductor of choice for high-voltage power electronics applications [1,2]. However, wide-bandgap semiconductors such as SiC have begun…
October 1, 2012
Simulation Standard
Calibration of the Ion Enhanced Chemical Etching Model of VICTORY Process Using Virtual Wafer Fab
In this article we describe a technique to automatically calibrate parameters of an Ion Enhanced Chemical Etching model implemented in the 3D…
October 1, 2012
Simulation Standard
Using VICTORY Process to Model the Effect of Silicon Substrate Orientation on Oxidation Kinetics
Different crystal planes of silicon are known to have different oxidation rates, e.g. the silicon plane with Miller indices is oxidized approximately…
October 1, 2012
Simulation Standard
A Semi-Empirical Model for the Simulation of Ion Milling in VICTORY Process
The three-dimensional process simulator VICTORY Process now includes a semi-empirical model for the simulation of ion milling. During ion milling, the mill…
October 1, 2012
Simulation Standard
Developing Custom Etching/Deposition Models in VICTORY Process
VICTORY Process is supplied with a wide range of models and data for an extensive set of materials, so that you can…
July 1, 2012
Simulation Standard
Simulation of Stress Evolution During Semiconductor Device Fabrication
Accurate stress simulation has become a necessary part of performance and reliability analysis of semiconductor devices. In our previous paper [1] we…
July 1, 2012
Simulation Standard
Actuation Voltage For a Cantilever Switch in MEMS
Following the successful 3D simulation of the process flow of cantilever based MEMS switches using VICTORY Process is presented in August 2005…
April 1, 2012
Simulation Standard
Current Collapse Phenomenon in GaN HFETs resulting from Intentional Bulk Iron (Fe) Doping and Un-intentional Interface Traps
The Gallium Nitride-based material family has fundamental material properties which make it an attractive candidate for semiconductor device fabrication. These properties include:…
April 1, 2012
Simulation Standard
Syntax Driven 2D Structure Export from 3D Structures and Extraction of 2D Volume Data Maps
This article demonstrates a new feature of TonyPlot3D. This feature enables the automated, syntax driven export of 2D structure slices from 3D…
April 1, 2012
Simulation Standard
Leakage Current Calibration Procedures of Amorphous Silicon Thin-Film Transistors
Amorphous silicon Thin-Film Transistors (a-Si TFTs) are widely used as the switching device of liquid crystal display (LCD) technology. For development and…
April 1, 2012
Simulation Standard
3D TFT Simulation
Both flexible and touch panel displays have become popular for portable applications. To meet various functional requirements, system-on-panel (SOP) design has become…
January 1, 2012
Simulation Standard
The Studies of Anti-Reflective (AR) Coatings Effects for Solar Cell by Using Silvaco TCAD Tools
In 1975, screen printing was first applied to solar cells for the formation of the front and rear contacts replacing expensive vacuum…
January 1, 2012
Simulation Standard
Geiger Mode Simulation of Avalanche Photodiodes in ATLAS
Single-photon counting detectors are used in a wide range of applications, including astronomy, optical communications, biological sensors, and military uses. Photomultiplier tubes…
January 1, 2012
Simulation Standard
ZnO based LED: A Performance Optimization through TCAD Simulation
In this paper, a two dimensional (2-D) generic model of quantum well light emitting diode (LED) based on ZnO, II-VI compound semiconductors…
January 1, 2012
Simulation Standard
Normally-off AlGaN/GaN HFET with p-type GaN Gate and AlGaN Buffer
To break through the material limits of Silicon and to realize the drastic performance improvement needed to meet the severe requirements in…
January 1, 2012
Simulation Standard
Simulation of Stresses and Mobility Enhancement Factors in 3D Inverter Cell
The analysis and characterization of stress effects have become an integral part of semiconductor technology and device design. In a typical semiconductor…
September 1, 2011
Simulation Standard
High Light Extraction on OLED with Microcavity Effects
OLEDs have been researched for application in display devices due to their considerable advantages. In order to further improve and optimize devices…
September 1, 2011
Simulation Standard
Modelling of GaN/InGaN Tricolour Multiple Quantum Well Light Emitting Diodes
Since lighting is estimated to account for 20% of the world’s electricity consumption, the search for reliable and efficient lighting technologies to…
September 1, 2011
Simulation Standard
InGaN/GaN Ridge Type with MQW Laser Diode Simulation Using ATLAS
The light source on short wavelenghts has been researched in GaN-based lser diodes (LDs). For high efficiency emitting devices, the wave-guide layer…
September 1, 2011
Simulation Standard
Using VICTORY Process to Model Thermal Oxidation of Silicon in O2/HCl Mixtures
The addition of a chlorine species during thermal oxidation of silicon results in improved threshold stability, higher and more uniform oxide dielectric…
July 1, 2011
Simulation Standard
Thermal Optimization on GaN HFET Using Flip Chip and Through Wafer via Structures
GaN heterojunction field effect transistors (HFETs) have been under extensive investigation because of their projected superb performances as high-power RF devices. The…
July 1, 2011
Simulation Standard
3D Simulation of Ion Enhanced Chemical Etching with VICTORY Process
VICTORY Process is a tool for 3D simulation of the semiconductor industry’s technological processes. It allows stable and accurate modeling of the…
July 1, 2011
Simulation Standard
Simulation of Transient Diffusion Enhancement of Boron with VICTORY Process in 3D, with the Plus-One Implantation Damage Model and the Five-Stream Diffusion Model
VICTORY Process is a 3D process simulation tool which allows for an accurate simulation of the doping distributions in semiconductor devices. It…
April 1, 2011
Simulation Standard
The Studies of Regular Texture Thickness and Finger Pattern of the Front Surface by Using Silvaco TCAD Tools
The photovoltaic industry has rapidly grown since 2000 and has diversified in technology how the solar cell are manufactured. As of 2010,…
April 1, 2011
Simulation Standard
Extracting Concentrations from Arbitrary Shaped Well Regions
It is often the case when simulating charged coupled devices (CCDs) or image sensors, that a designer wishes to know how many…
April 1, 2011
Simulation Standard
Simulation of 3D Anisotropic Crystal Etching with VICTORY Process
Anisotropic crystal etching is the common technique used in Micro Electromechanical systems (MEMS) manufacturing. It uses the property of some single crystal…
February 1, 2011
Simulation Standard
Using VICTORY Process to Simulate Thermal Oxidation of Silicon at High Pressures of Ambient Gases
Developing ULSI silicon technology requires good control of dopant diffusion and minimizing defect formation during thermal oxidation. The use of high pressures…
January 1, 2011
Simulation Standard
Hints, Tips, and Solutions – Export 3D Structures from VICTORY Cell/Process to ANSOFT ANSYS
SILVACO provides the tool ANSYSExporter which establishes the link between SILVACO software and ANSOFT ANSYS. ANSYSExporter is fully integrated within the SILVACO…
January 1, 2011
Simulation Standard
The Doping Effect Simulation on the OLED Devices Using ATLAS
Organic light emitting diodes (OLEDs) have attracted great attention for full-color flat-panel displays since the demonstration of efficient electroluminescent devices [1]. Due…
January 1, 2011
Simulation Standard
Design Consideration & Performance Analysis of MCT Based Dual Band (MWIR/LWIR) Photodetector
In this paper, a physics based two dimensional (2-D) generic model of dual band mid wavelength and long wavelength infrared (MW-LW) photodetector…
October 1, 2010
Simulation Standard
Hints, Tips, and Solutions – Conversion to Different Units
Q. How do I convert a value from one set of units into another? A. Use the DBINTERNAL CONVERT.UNITS command.
October 1, 2010
Simulation Standard
How to Mesh in 2D TCAD
Meshing for process in ATHENA or electrical characterisation in ATLAS is one of the biggest challenges that a user faces. Poor meshing…
October 1, 2010
Simulation Standard
Using VICTORY Process for Plasma Etching Simulations
VICTORY Process, the 3D process simulator now includes a module for plasma etching. The module is designed to simulate plasma etching processes…
July 1, 2010
Simulation Standard
Hints, Tips, and Solutions – Passing a Variable from an ATLAS deck into a C-Interpreter Function
The Silvaco C-Interpreter (SCI) allows convenient and flexible definition of physical models and material parameters via an ANSI standard C-language interface. The…
July 1, 2010
Simulation Standard
Simulating Negative Bias Temperature Instability of p-MOSFETS
The degradation of MOSFET devices having relatively thin oxide layers is generally accepted as being mainly associated with the depassivation of silicon…
July 1, 2010
Simulation Standard
Coupled Optimization of Diode and IGBT Characteristics Under Clamped Inductive Switching in ATLAS MixedMode and Virtual Wafer Fab (VWF)
Virtual Wafer Fab’s powerful range of optimizers are used to investigate and minimise the coupled switching losses of a TCAD IGBT and…
July 1, 2010
Simulation Standard
Using Manual Refinement of Geometrical Mesh in VICTORY Process
VICTORY Process is a 3D process simulation tool which employs the LevelSet technique for manipulating and deforming structures. The structure’s geometry is…
April 1, 2010
Simulation Standard
Simulating the Hysteresis effects of Si/SiO2 Interface Traps
The trap states at the interface of Silicon with Silicon Dioxide are usually divided conceptually into interface states and fixed oxide charges…
April 1, 2010
Simulation Standard
Designing a High-Voltage IGBT Structure with TCAD
The Insulated Gate Bipolar Transistor (IGBT), is a power device that combines the high-power characteristics of bipolar transistors with the fast-switching and…
April 1, 2010
Simulation Standard
Investigation of the SiGe Waveguide Photodiodes Using FDTD Method for High Speed Optical Communication
Silicon as a photonic medium has unique advantages in telecommunication systems. It is transparent in the range of optical telecommunications wavelength (1.3…
January 1, 2010
Simulation Standard
A Box Method Discretisation for the Drift-Diffusion Equations in a Magnetic Field
The problem of discretising the semiconductor drift-diffusion equations in the presence of a uniform magnetic field using the Box Method has previously…
January 1, 2010
Simulation Standard
Simulation of Resonant Tunneling Diodes Using ATLAS
This article describes a model for Resonant Tunneling Diodes (RTDs) implemented within ATLAS framework. The model is based on a self-consistent solution…
January 1, 2010
Simulation Standard
Modeling and Optimization of CIGS Solar Cell Module
Solar cells manufactured from wafers of crystalline or polycrystalline silicon are today the dominant technology in the commercial market. Solar cells based…
January 1, 2010
Simulation Standard
Using VICTORY PROCESS for Rapid Geometry Prototyping
The fully three-dimensional process simulator VICTORY PROCESS allows user to perform a wide range of manipulations of the structure’s geometry in order…
October 1, 2009
Simulation Standard
3D SOI NMOSFET Simulation Using VICTORY DEVICE
SOI MOSFETs can exhibit a kink in their Id/Vd curves, which is caused by impact ionization, floating potentials, and other effects. One…
October 1, 2009
Simulation Standard
Crosstalk Simulation in InSb Detector Arrays
Crosstalk is one of the main parameters that critically affect the resolution of detector arrays. It results in a reduction in image…
October 1, 2009
Simulation Standard
Simulating the Effects of Stress/Strain on a 50 nm Silicon FinFET
In modern semiconductor devices, the effects of physical lattice strain are playing an increasingly important role. One reason for this is that…
July 1, 2009
Simulation Standard
Textured Thin-film Solar Cell Simulation
Texturing is often used to improve light trapping in thin film solar cells. The textured surfaces act to scatter the light in…
July 1, 2009
Simulation Standard
Evaluating of the Breakdown Voltage of the Super-Junctions Using ATLAS
High Voltage Power Devices using super junction or multi RESURF effect have a relatively high BV with a drastic reduction in the…
July 1, 2009
Simulation Standard
Active and Isolation Trench Fabrication for 100V Vertical LOCOS Power MOSFETS with VICTORY PROCESS and ATHENA
Vertical LOCOS (VLOCOS) power MOSFET structures are becoming increasingly popular [1-3] for 100 V rated applications due to their high packing density,…
July 1, 2009
Simulation Standard
Third Generation Solar Cell Technologies: Localized Surface Plasmons
Solar cells are experiencing a surge in activity due to concerns about sustainability of non-renewable resources and the negative impacts of global…
April 1, 2009
Simulation Standard
Hints, Tips and Solutions – Visualizing Drift and Diffusion Current Densities
One of the most important features of TCAD simulation is that the TCAD tools encapsulate the physics of the processes or devices…
April 1, 2009
Simulation Standard
Simulating SiGe and Impurity Dependent Stress
The simulation of stress during device fabrication is becoming increasingly important and is often now deliberately introduced during fabrication to enhance device…
April 1, 2009
Simulation Standard
Physical 3D Single Event Upset Simulation of a SRAM Cell with VICTORY DEVICE and SmartSpice
VICTORY DEVICE simulation framework includes tools for 1D, 2D and 3D simulation of modern semiconductor technologies. VICTORY DEVICE implements a full tetrahedral…
April 1, 2009
Simulation Standard
Electrically Controlled Silicon-based Photonic Crystal Chromatic Dispersion Compensator with Ultra Low Power Consumption
We show full 3-Dimensional (3D) electrical and optical simulation of a tunable silicon-based Photonic Crystal (PhC) Chromatic Dispersion Compensator (CDC) with high…
April 1, 2009
Simulation Standard
SONOS/SANOS Simulation in ATLAS
Semiconductor-Oxide-Nitride-Oxide-Semiconductor (SONOS) Non-Volatile memory structures can be simulated using ATLAS. The basic principle of these devices is the use of a charge…
January 1, 2009
Simulation Standard
Hints, Tips and Solutions – Determining the CV Curve and Terminal Currents of a MOSFET
Q: How can I get a CV curve of a MOSFET? And how can I get the current on all terminals? A:…
January 1, 2009
Simulation Standard
Minimization of Well-Proximity Effect by Means of 2D and 3D Monte Carlo Simulation of Retrograde Well Implantation
The formation of deep p- and n- wells using high-energy implantation has become an integral part of CMOS technology process flow. The…
January 1, 2009
Simulation Standard
3D Simulation of Oxidation Induced Stress Using Cartesian Meshes with Adaptive Refinement
The formation of isolation trenches is one of the key process steps used in power device fabrication. Also the intensive scaling of…
January 1, 2009
Simulation Standard
3D Simulation of Ion Milling for Mass Storage Applications
The ion milling process is used extensively in the Hard Disc Drive industry, particularly in the manufacture of thin film magnetic heads.…
January 1, 2009
Simulation Standard
Self-Heating effect Simulation of GaN HFET Devices – 4H-SiC and Sapphire Substrate Comparison
GaN-based Hetero-Field Effect Transistors have been investigated in high power and high frequency electronics devices. However, such improved performance is still subject…
January 1, 2009
Simulation Standard
Modeling of GaInP/GaAs DualJunction Solar Cells Including Tunnel Junction
This paper presents research efforts conducted at the IESUPM in the development of an accurate, physically-based solar cell model using the general-purpose…
November 1, 2007
Simulation Standard
Ballistic Quantum Transport in Nanoscale Transistors: a Non Equilibrium Green’s Function Approach
Introduction As MOS field-effect transistors are scaled down to a nanometer regime, quantum effects in both transverse and transport directions start playing…
November 1, 2007
Simulation Standard
A Novel Approach to Three-Dimensional Semiconductor Process Simulation: Application to Thermal Oxidation
Abstract The paper presents a new approach to three-dimensional semiconductor process simulation that overcomes the problem of moving boundaries and mesh generation.…
August 1, 2007
Simulation Standard
Simulation of an Organic Photovoltaic Cell (OPC) Using Atlas
Introduction In recent years, the investigation of Organic Light Emitting Diodes (OLEDs) and photovoltaic devices based on small organic molecules and polymers…
August 1, 2007
Simulation Standard
Two-Dimensional Atlas Device Simulation of an Organic Light-Emitting Field-Effect Transistor Using a Heterostructure Inside the Transistor Channel
1. Introduction Organic semiconductors have been incorporated in a wide range of devices, including organic thin-film transistors (OTFTs) and circuits, organic solar…
May 1, 2007
Simulation Standard
Electrical Stress Degradation of Small-Grain Polysilicon Thin-Film Transistors
Abstract This paper is focused on the stability of n-channel laser-crystallized polysilicon thin-film transistors (TFTs) submitted to a hydrogenation process during the…
May 1, 2007
Simulation Standard
Trapping Effects in the Transient Response of AlGaN/GaN HEMT Devices
In this paper, the transient analysis of an AlGaN/GaN high-electron mobility transistor (HEMT) device is presented. Drain–current dispersion effects are investigated when…
May 1, 2007
Simulation Standard
New Feature of Quantum Module: Schrödinger-Poisson Solver for Nanowire Application
Introduction The trend toward ultra-short gate length MOSFET requires a more and more effective control of the channel by the gate leading…
February 1, 2007
Simulation Standard
How Can I significantly Reduce Circuit Parasitics Netlist Extraction Time?
How Can I significantly Reduce Circuit Parasitics Netlist Extraction Time?
February 1, 2007
Simulation Standard
TCAD Modeling and Data of NOR Nanocrystal Memories
Introduction It is widely believed that the scaling of standard Flash devices will face in a near future several limitations, due to…
February 1, 2007
Simulation Standard
A Semi-Analytical Model for the Subthreshold Behavior of FinFLASH Structures
Abstract In this paper we present an original semi-analytical model for the subthreshold electrical behavior of complex 3D structures as the SOI…
November 1, 2006
Simulation Standard
Is it possible to calculate the resistance components of a MOSFET
Q. Is it possible to calculate the resistance components of a MOSFET (i.e. channel resistance, epi resistance, substrate resistance etc.) as a function…
November 1, 2006
Simulation Standard
Design Rules and Trends for Dummy Metal Filling Using Exact, Clever and Stellar
Introduction The physical verification is becoming the most complex phase raised by the Deep SubMicron (DSM) technology. More than 50% of the…
November 1, 2006
Simulation Standard
Advanced Quantum Effects Simulation in Atlas
Introduction The trend toward smaller MOSFET devices with thinner gate oxide and greater doping is resulting in the increased importance of quantum…
November 1, 2006
Simulation Standard
TCAD Simulation of a SONOS Device with Silvaco’s new FNONOS Model
Introduction Erasable programmable read-only memory (EPROM) devices include amongst others, floating gate technology and SONOS (Polysilicon-Oxide-Nitride-Silicon) technology. Floating gate technology involves charge…
August 1, 2006
Simulation Standard
How to obtain a stable grid and smooth doping profile in non-planar a-Si TFT using Athena/Elite?
How to obtain a stable grid and smooth doping profile in non-planar a-Si TFT using Athena/Elite?
August 1, 2006
Simulation Standard
Three Dimensional Electro-Thermodynamic Analysis for GaN Light Emitting Diodes
Abstract Improvement in temperature characteristics of GaN LEDs is important for realizing reliable devices operating at high temperatures. In this article, the…
August 1, 2006
Simulation Standard
Accurate Spice Netlist Extraction in Stellar Using New Substrate Partition Feature
Introduction By default STELLAR calculates the capacitances between interconnect lines and the whole substrate. In certain conditions it may lead to some inaccuracies. For…
August 1, 2006
Simulation Standard
Atlas Device Simulation of Amorphous Oxide Semiconductor Thin-Film Transistors
1. Introduction Amorphous oxide semiconductor materials have attracted much attention as key components of TFTs for flexible electronics [1]. The advantages of…
August 1, 2006
Simulation Standard
Simulating the Source of Polarization Charge in AlGaN/GaN HFETs
Polarization-induced charges at the AlGaN/GaN interface of heterojunction field-effect transistors (HFETs) create a high density, two-dimensional electron gas (2DEG) in the channel.…
May 1, 2006
Simulation Standard
Interconnect Parasitic Extraction of BiCMOS Cell Using Silvaco Clever
Interconnect parasitic effects play a very important role in modern integrated circuit design, especially for digital circuit. This article presents how a…
May 1, 2006
Simulation Standard
Evaluating of the Avalanche Failure of Power MOSFETs using Atlas
Introduction Power MOSFETs are widely used with an inductive load for S/W power supplies, DC-DC converters, and so on. But due to…
May 1, 2006
Simulation Standard
Comparison of 3-Dimensional Quantum Effects in Nano Devices Using the Atlas 3D BQP Model
Introduction With the MOSFET gate lengths scaling down to sub-20nms many kinds of devices have been proposed and researched such as double-gate,…
May 1, 2006
Simulation Standard
Enhanced Silicon Light Emission Intensity with Multiple SiGe Quantum Well Structure
Abstract The measured I-V curve from a ten period Si/SiGe MQW pin LED fabricated using a UHVCVD system is compared with ATLAS simulation results.…
February 1, 2006
Simulation Standard
Multi-layer Organic Light Emitting Diode Simulation
A conventional 2 layer organic light emitting diode consists of a Hole Ttransport Layer (HTL) and an electron transport layer (ETL). A…
February 1, 2006
Simulation Standard
Crosstalk Between Pixels of Organic Photo-Voltaic Devices
For various technological reasons, LEDs and as well as photo-voltaic devices frequently use PEDOT:PSS on top of ITO contacts as a hole…
February 1, 2006
Simulation Standard
Athena/Optolith Simulation of Proximity Lithography
Photolithography simulation is a very important part of TCAD. Accurate and predictive lithography simulation saves time and money spent on development and…
February 1, 2006
Simulation Standard
Inductance Optimization using 3D Field Solver based on Design Of Experiment Approach
A new 3D electromagnetic simulator coupled with a statistical analysis, for inductance loop optimization is presented. It allows RF designers to easily…
November 1, 2005
Simulation Standard
How can I create a non planar structure using III-V materials for Device Analysis
How can I create a non planar structure using III-V materials for Device Analysis when the materials I want to use are…
November 1, 2005
Simulation Standard
Numerical Analysis of GaInP Solar Cells: Toward Advanced Photovoltaic Devices Modeling
Simulation capacities of GaInP solar cells were studied with a special emphasis on material and structural parameters. The comparison between experimental and…
November 1, 2005
Simulation Standard
Simulation and Characterization of High-Frequency Performances of Advanced MIM Capacitors
Abstract: High-frequency simulations and characterizations of advanced metal-insulator-metal (MIM) capacitors with ultra thin 32 nm PECVD Si3N4 dielectric are presented. The frequency dependent…
August 1, 2005
Simulation Standard
How can I create a Design Of Experiments (DOE) using DeckBuild with one or more variables
How can I create a Design Of Experiments (DOE) using DeckBuild with one or more variables specified in a single input file when I…
August 1, 2005
Simulation Standard
Process Flow Simulation and Manufacture of Variable RF MEMS Capacitors
Introduction The application of microelectromechanical systems (MEMS) to radio-frequency (RF)/microwave systems is on the verge of revolutionizing wireless communications, mainly in the…
August 1, 2005
Simulation Standard
Gate Charging Simulation Using Atlas/MixedMode
Introduction In modern power devices, the total power loss comprises both a conductive power loss component and a capacitive loss component. As…
August 1, 2005
Simulation Standard
Using Athena Monte Carlo Module for Ion Implantation Simulation in Silicon Carbides
Introduction The Monte Carlo Implantation Module of ATHENA has proved to be a very accurate tool for simulation of various implantation processes. In this…
June 1, 2005
Simulation Standard
Is there a way to turn-off all of the generated layers
Is there a way to turn-off all of the generated layers so that the layout modifications can be done without them cluttering…
June 1, 2005
Simulation Standard
Expert’s Netlist Driven Layout
Expert features a powerful Netlist Driven Layout (NDL) function to assist the user in creating a layout. It increases the productivity of layout…
June 1, 2005
Simulation Standard
Expert Parametric Wires
Expert Parametric Wire (Pwire) is a complex group of objects containing, a single wire named master wire, any number of subparts such as…
May 1, 2005
Simulation Standard
I am currently using ATLAS/ Blaze to model the electrical properties of an LED device
I am currently using ATLAS/ Blaze to model the electrical properties of an LED device that I am investigating. Is it possible to examine the…
May 1, 2005
Simulation Standard
Simulating the Device Characteristics of MEH-PPV Polymer Light Emitting Diodes Using Atlas
Organic light emitting diodes (OLEDs) are attracting great interest in the display technology industry due to their promising low cost large area…
May 1, 2005
Simulation Standard
A Comprehensive Solution for Simulating Ultra-Shallow Junctions: From High Dose/Low Energy Implant to Diffusion Annealing
The persistent semiconductor technology trend of shrinking down device size requires development of veryaggressive technological setups consisting in high dose/low energy implants,…
March 1, 2005
Simulation Standard
Expert: Wiring
The wiring tool in Expert automatically creates the shortest wire connecting two points specified by the user. The created wire goes around any existing…
March 1, 2005
Simulation Standard
I have to send copies of my project layout to different members of my group
Q. I have to send copies of my project layout to different members of my group, but they need to see only specific…
March 1, 2005
Simulation Standard
Expert: Layout Versus Layout (LVL) Comparison
Introduction The functionality Silvaco’s Layou Editor, Expert, has recently been expanded with the new feature called Layout Versus Layout comparison (LVL). LVL is…
March 1, 2005
Simulation Standard
New Parasitic Capacitance Modeling in Hipex-C
In deep submicron technology, conduction layers have widths much smaller than their thicknesses (see Figure 1). This makes edge parasitic capacitance effects…
March 1, 2005
Simulation Standard
Capacitance Coupling Calculation of IPS mode TFT-LCD Using Clever
The increasing demand of the TFT-LCD industry has lead to a rapid growth in display size and resolution. The higher cell packing…
February 1, 2005
Simulation Standard
Can Athena get the STRESS in Compound Advanced material?
Q: Can ATHENA get the STRESS in Compound Advanced material? A: The ATHENA STRESS command has been augmented to allow the 2 Dimensional stress distribution. To get the…
February 1, 2005
Simulation Standard
Simulating Selective and Non-Selective Epitaxy Over Oxide Isolated Regions Using Athena
In certain cases, most notably in modern bipolar and SiGe HBT structures, epitaxial steps are performed after the oxide isolation structures have…
February 1, 2005
Simulation Standard
Process and Device Simulation of Field Emission Microtrides
One of the most beneficial merits of computer-based experiment using TCAD lies in its capability of a total simulation of the target…
February 1, 2005
Simulation Standard
Pending Issues in the Modeling of Concentrator Solar Cells
The modelling of concentrator solar cells for real conditions of operation inside optical concentrators is a subject almost untreated. Consequently, this work…
December 1, 2004
Simulation Standard
How can I view a Foundry DRC run in Expert?
Q: How can I view a Foundry DRC run in Expert? A: Before a Foundry will start creating the masks to fabricate…
December 1, 2004
Simulation Standard
Using Expert’s Pcell Feature to Generate Complex Shaped Layers
One of the strengths of Expert is to generate complex shaped layers such as spiral inductors, parabolic waveguides, etc. For the case of the…
December 1, 2004
Simulation Standard
Cross-Sectional Viewer
Cross-Sectional Viewer is a tool in the Expert layout editor that simulates the cross-sections of ICs along an arbitrary drawn cut-line on the layout.…
November 1, 2004
Simulation Standard
How do you perform a lift off procedure in ATHENA?
A common technique for creating metal contacts is one known as a lift off. When performing a lift off process step, in…
November 1, 2004
Simulation Standard
Transient Simulations of Edge Emitting Fabry-Perot InP/InGaAsP Laser Diode Using Silvaco TCAD Tools
In this communication we present a brief description of our initial results of transient simulation of InP/InGaAsP Fabry-Perot edge emitting laser diode…
November 1, 2004
Simulation Standard
Practice of LPE Rule File Generation by Exact
This article will show how you can create LPE rule files using EXACT’s LISA scripting functionality. We will concentrate on generating a…
November 1, 2004
Simulation Standard
Two-Dimensional Device Simulation of the InGaAs/InP Avalanche Photodiodes
The high gain, and high gain-bandwidth product of the avalanche photodiodes is one of the key device for the long distance optical…
November 1, 2004
Simulation Standard
Resistor and Capacitor L/W Parameters in LVS Comparison
In the design of VLSI circuits the situations occur very often when a single schematic device is implemented in the layout by…
October 1, 2004
Simulation Standard
Fast and Accurate Simulation of the Steady-State of Voltage Controlled Oscillators with SmartSpice-RF
A novel simulation method of the steady-state of oscillators, based on Harmonic Balance (HB), is presented. A comparison with regular transient simulations…
October 1, 2004
Simulation Standard
A Sophisticated Verilog-A Debugger
During the elaboration of a Verilog-A model, debugging a module can be very useful for detecting non-physical behavior or fine-tuning the model. The SILVACO Verilog-A debugger…
October 1, 2004
Simulation Standard
Noise Simulations
If the MOS model file has the parameters: noia, noib, noic, Af, Kf and nlev=0 will SmartSpice ignore the BSIM III noise parameters (noia,…
September 1, 2004
Simulation Standard
EDIF Conversion Flow on Gateway
EDIF has been a vital part of the Electronic Design Automation (EDA) industry for many years and Gateway allows users to convert…
September 1, 2004
Simulation Standard
Hipex-CRC Parasitic RC-Network Reducer
Design of large scale chips requires precise knowledge of interconnect delays. However, detailed analysis of interconnects may quickly become computationally too expensive…
September 1, 2004
Simulation Standard
SET Accurate Compact Model for SET-MOSFET Hybrid Circuit Simulation
Single-Electron Transistors (SETs) [1][2] are attractive candidates for post-CMOS VLSI ICs. Accurate models are also required in order to efficiently design SET…
September 1, 2004
Simulation Standard
Generic Devices – The New HIPEX-NET Feature for Extraction of Custom Devices
Hipex-NET is SILVACO’s powerfull hierarchical layout netlist extractor. Built-in extracting rules permit to make fast and accurate parameter extraction for basic set of…
September 1, 2004
Simulation Standard
How can I become a more efficient user of Expert?
How can I become a more efficient user of Expert?
August 1, 2004
Simulation Standard
Electrostatic Effect of Localized Charge in Dual Bit Memory Cells with DiscreteTraps
In this paper the electrostatic impact of Channel Hot Electron (CHE) injection in discrete-trap memories is quantitatively addressed. The dual bit behavior…
August 1, 2004
Simulation Standard
A New Efficient Quantum Method: The Bohm Quantum Potential Model
This article presents a new approach to model the quantum confinement of carriers in MOSFET or heterostructure. SILVACO has already included in…
August 1, 2004
Simulation Standard
The subject of how to use the EXTRACT statement in DeckBuild often arises
The subject of how to use the EXTRACT statement in DeckBuild often arises. The EXTRACT statement is a very useful tool for analysing data…
August 1, 2004
Simulation Standard
Simulating Selective and Non-Selective Epitaxy over Oxide Isolated Regions Using Athena
In certain cases, most notably in modern bipolar and SiGe HBT structures, epitaxial steps are performed after the oxide isolation structures have…
July 1, 2004
Simulation Standard
Silvaco’s RFIC Design Suite
This article focuses on the use of Silvaco’s RFIC Design Suite including PDK, SmartSpice-RF, and Gateway.
July 1, 2004
Simulation Standard
HiSIM-1.2 Parameter Extraction with the Revised UTMOST-III Local Optimization Strategies
HiSIM-1.2 parameter extraction methodology was discussed in detail in a previous issue of Silvaco Simulation Standard [1]. This article is meant to…
July 1, 2004
Simulation Standard
A Family Portrait of the BSIM Models
1. Introduction BSIM1, the first model of the BSIM series was released about ten years ago. Some major improvements have been made…
July 1, 2004
Simulation Standard
Customers are starting to use 64bit machines with large hard drives and Gigs of RAM
Customers are starting to use 64bit machines with large hard drives and Gigs of RAM and tend to forget the limitations imposed…
June 1, 2004
Simulation Standard
New Features in Expert Node Probing
Expert’s Node Probing is powerful tool for inspection of netlist components on layout. It is designed for highlighting layout objects electrically connected…
June 1, 2004
Simulation Standard
Parasitic Capacitance Extraction with Hipex and Exact
Overview To extract parasitic capacitances from a circuit layout, you need to perform the following steps:
June 1, 2004
Simulation Standard
Expert Layout Editor – New Commands Focus On Easier Operation
Expert layout editor version 4.0.1R has several new commands and functions released together with the new Qt GUI interface. Most of them are…
June 1, 2004
Simulation Standard
Every time I create a new project or library, an empty cell with the same name is created in my project
Q. Every time I create a new project or library, an empty cell with the same name is created in my project.…
May 1, 2004
Simulation Standard
STELLAR – Process Based Parasitics Capacitance Extraction on Large Custom Cells
SILVACO has recently released a new suite of interconnect analysis tools to meet the demands of state of the art cell, circuit…
May 1, 2004
Simulation Standard
LPE Optimization with Clever/Hipex/Exact Linkage Methodology
On the cutting edge of LSI design, the accuracy of Layout Parasitic Extraction (LPE) tools is a critical issue to miniaturized LSI…
May 1, 2004
Simulation Standard
When solving for the static CV curve for a MOS capacitor, due to the absence of current carriers
When solving for the static CV curve for a MOS capacitor, due to the absence of current carriers, convergence can be a…
April 1, 2004
Simulation Standard
IBIS Models Now Supported in SmartSpice
Expert Parametric Wire (Pwire) is a complex group of objects containing, a single wire named master wire, any number of subparts such as…
April 1, 2004
Simulation Standard
Extraction of SPICE Model Parameters from Atlas Device Simulation Using Utmost
Many users would like to extract SPICE models from their process and device simulation using Athena and Atlas to be used in…
April 1, 2004
Simulation Standard
Array Copying – Alignment from Specified Instance Number
For LCD and Memory designs, Array Copy function on Gateway is conveniently used. Users may want to align instances from specified instance…
March 1, 2004
Simulation Standard
Hierarchical Layout versus Schematic
A new Hierarchical Layout versus Schematic (HLVS) system that provides significant improvement in verification of huge circuits is described. Other of LVS…
March 1, 2004
Simulation Standard
Design of Optimal Spiral Inductors in Expert
Introduction One of the key components in many RF ICs applications is the inductor. It is very important that the inductor has…
March 1, 2004
Simulation Standard
When I do an extract, the generated layers are present in the layout.
Q: When I do an extract, the generated layers are present in the layout. If I need to do layout modifications I find…
March 1, 2004
Simulation Standard
Resistance Calculation Approach in Hipex-NET
Hipex-NET uses two techniques to calculate resistor values. First method of resistance extraction, which is usual for full chip netlist extractors and uses…
March 1, 2004
Simulation Standard
TCAD Simulation of a Dual Band Monolithic HgCdTe Infrared Photodetector
Introduction Mercury cadmium telluride (HgCdTe) is a semiconductor material whose material properties are adjustable through altering its constitutive molar fractions. HgCdTe has…
February 1, 2004
Simulation Standard
Mocasim – A Versatile Monte Carlo Simulator for III-Nitride Transport Properties
III-Nitrides have recently attracted attention as a promising material class for high-power, high-frequency microelectronic applications at elevated temperatures. They possess large band…
February 1, 2004
Simulation Standard
Schrödinger Approach and Density Gradient Model for Quantum Effects Modeling
We describe here two approaches to model the quantum effects that can no more be neglected in actual and future devices. These…
February 1, 2004
Simulation Standard
How can I use the EXTRACT commands to find the depletion widths in my MOSFET at different drain biases?
To illustrate the use of this statement to find depletion widths we have used the standard MOSFET example mos1ex01.in to first create…
February 1, 2004
Simulation Standard
Instructional Approach to Writing Parasitic Capacitance Rules Files Using Exact
1. Introduction The Exact analysis stage extracts the user-required information necessary for the respective parasitic capacitances by probing the Exact database. This is performed via script…
February 1, 2004
Simulation Standard
Simulation of Silica Microlenslet Formation by Etch and Reflow Using Elite and SSuprem4
Introduction In response to high demand, device designers are developing silica microlenslets that offer efficient coupling between optical fiber bundles and arrays…
January 1, 2004
Simulation Standard
Remote ALTER processing
A new parallelization method has been implemented into SmartSpice. Now .ALTERs can be destributed not only over several CPUs (by using -P option),…
January 1, 2004
Simulation Standard
New SmartLIb Library of Models
In all previous versions of SmartSpice the model code (BSIM, diode etc.) was included in the one executable (SmartSpice ). This means any updates to…
January 1, 2004
Simulation Standard
BSIM4 Model Verilog-A Implementation
The Verilog-A hardware description language opens many areas to SPICE users in the field of compact models, allowing manufacturers and universities to…
January 1, 2004
Simulation Standard
Stress Effect Model in BSIM3v3 Model
Stress effect models are now implemented in major models such as BSIM4 or HiSIM. The need for evermore accurate models with a…
January 1, 2004
Simulation Standard
New Philips MOS20 LDMOS Model in SmartSpice
Philips MOS20 was released in January 2004. Its purpose is to provide a high-voltage compact model to describe both operation of the…
December 4, 2003
Simulation Standard
Sometimes I have problem to skip cells when importing cells
Q: Sometimes I have problem to skip cells when importing cells with the same names from reference library. Once we skip one cell,…
December 1, 2003
Simulation Standard
Guardian DRC vs. Other DRC Systems, I
1. Introduction This article begins a series of articles that describe the compatibility of Guardian DRC system[1] in terms of functionality: command set, syntax…
December 1, 2003
Simulation Standard
Schematic Driven Layout
Expert schematic driven layout (SDL) is a CAD tool which increases the productivity of layout design by automating cell generation and providing visual…
December 1, 2003
Simulation Standard
Interactive P-cell Generation
1. Abstract Parameterized cells (P-cells) significantly increase the productivity of layout designers. Silvaco International’s tool Expert has been designed to aid layout designers through…
November 4, 2003
Simulation Standard
Interconnect Parasitic Accuracy & Speed Improvements in New CLEVER Release
Introduction This article introduces the new features and numerical schema implemented in the most recent release of Clever from Silvaco. In this…
November 4, 2003
Simulation Standard
Is there a way to automatically specify mesh spacing in ATHENA?
Q. Is there a way to automatically specify mesh spacing in ATHENA? A. Yes, there are three ways to automatically specify grid spacing. The most…
November 2, 2003
Simulation Standard
Topography Simulation of Trench Etch Using Monte Carlo Plasma Etch Model with Polymer Re-deposition
1. Introduction The topography simulation module, Elite has constantly been improved in order to simulate advanced processes, which are becoming more complex with device…
November 1, 2003
Simulation Standard
TCAD Simulation of a Polysilicon Thin Film Transistor For Active Matrix Liquid Crystal Displays
Polysilicon thin film transistors are attractive as active devices in driver circuits of highly integrated active-matrix liquid crystal displays (AMLCDs) and as…
October 1, 2003
Simulation Standard
IBIS Models in SmartSpice
The Input/Output Buffer Information Specification (IBIS) is a standard for electronic behavioral models based on I/V and V/T curve data. It is…
October 1, 2003
Simulation Standard
New Features in SmartSpice 2.3.4.C
A powerful new feature “Stop-Continue” has been added to SmartSpice to allow the user to suspend a transient simulation and investigate the…
October 1, 2003
Simulation Standard
Spectre® Replacement in the Cadence Flow
Silvaco has always supported the Solaris based Cadence design environment for seemless SmartSpice integration. To accommodate new customer demands to support the…
October 1, 2003
Simulation Standard
New Functionality – BUS notation in SmartSpice
A new notation has been introduced into SmartSpice to allow a compact expression of a multiple bit wire buss to be used.…
September 1, 2003
Simulation Standard
Role of Netlist Extraction in Process Design Kits
Netlist extraction and the quality of netlist extraction is becoming of increasing concern for integrated circuit design flow. As circuits become more…
September 1, 2003
Simulation Standard
Parasitic Resistor Extraction with HIPEX-R
HIPEX-R is part of HIPEX software package for physical verification of multimillion transistor designs. It is a hierarchical full chip parasitic resistance…
September 1, 2003
Simulation Standard
HIPEX-Net: New SILVACO Full-Chip LPE Tool vs. Maverick
SILVACO is releasing its new layout parameter extractor: HIPEX-NET. The new tool will replace Silvaco’s Maverick, which is a part of Guardian…
September 1, 2003
Simulation Standard
Measurement of Spacing Checks in Guardian DRC
In previous versions of Guardian DRC there were only two ways of measuring the distance between two segments: the ordinary, Euclidean metric,…
September 1, 2003
Simulation Standard
Highlighting Two Nodes in the Expert Layout Editor and Other Tips
Q: I would like to highlight two nodes at the same time in Expert. I currently use Verification->Node Probing->Pick Node to highlight…
August 1, 2003
Simulation Standard
The Effect of Carrier Spilling on Spreading Resistance Profiling (SRP) Accuracy
Spreading Resistance Profiling (SRP) retains its popularity in the semiconductor industry by an inexpensive means of capturing dopant profile information. However, device…
August 1, 2003
Simulation Standard
Eye Diagram for a Direct Modulated Semiconductor Laser in ATLAS
An eye diagram is a convenient way to visualise how the waveforms used to send multiple bits of data can potentially lead…
August 1, 2003
Simulation Standard
Analysis of Light Power Dependence on the Leakage Current in a Buried Hetero- Structure p-InP Semiconductor Laser
An effective device structure for reducing leakage current in BH laser diodes with semiin-sulation doped Fe in InP blocking layers has been…
August 1, 2003
Simulation Standard
Generation of III-Nitride Transport Parameters with Mocasim
Mocasim is an advanced three-valley Monte Carlo simulator designed to generate the transport parameters used in Silvaco’s physical device simulators. It accurately…
August 1, 2003
Simulation Standard
EXACT Worksheet Utility to View Variables and Data
Q: EXACT has powerful scripting utilities for manipulating the final capacitance data and variables but is there an easier graphical front end…
July 1, 2003
Simulation Standard
HiSIM V1.2 Model Parameter Extraction with UTMOST-III
HiSIM (Hiroshima university STARC IGFET Model) is one of the surface potential based Spice models [1], [2] and pioneered the iterative approach…
July 1, 2003
Simulation Standard
Shallow-Trench-Isolation (STI) Effects in BSIM4 and HiSIM MOSFET Models in SmartSpice & UTMOST-III
There are several ways to account for the effect of STI-induced stress in standard compact models. The purpose of this article is…
July 1, 2003
Simulation Standard
Behavioral Modeling of PLL Using Verilog-A with SmartSpice
In this article, we describe practical behavioral modeling for highly non-linear circuits using Verilog-A, which is analog extension of Verilog-AMS. At first,…
July 1, 2003
Simulation Standard
Using Binned Device Models with SmartSpice
Q. My simulation fails because SmartSpice cannot find a binned model, what does this mean?
June 1, 2003
Simulation Standard
HIPEX-Net: Hierarchical Layout Extractor for Expert Editor
HIPEX-Net is a hierarchical layout extractor. It can create both hierarchical and flat SPICE formatted netlists of the extracted layout. HIPEX-Net also…
June 1, 2003
Simulation Standard
“Shortest Path” Option for Flight Line Style (Net Bar)
There is the recent improvement in Expert Layout Editor, the “Shortest path” option was added to Flight line styles (Net Bar). This…
June 1, 2003
Simulation Standard
Expert Layout Editor Recent Improvements: Over-the-Point Drawing of Orthogonal Shapes
This article presents an overview of new features added to Silvaco's Expert layout editor. Silvaco has taken a careful look at the…
June 1, 2003
Simulation Standard
Guardian DRC Edge Layer Operations
Recent versions of Guardian DRC introduce operations that involve edge layers, either on input or on output. An edge layer is a layer…
June 1, 2003
Simulation Standard
Guardian LVS: New Platform-Independent GUI
We introduce a platform-independent version of Guardian LVS. An important feature of any tool is its capability to operate on various platforms…
June 1, 2003
Simulation Standard
Counting Instances in an Expert Editor Layout
Q: I have some trouble counting the number of in-stances in a layout using Expert. I have tried to use the Chip…
May 1, 2003
Simulation Standard
Low Voltage Super Junction MOSFET Simulation and Experimentation
The application of Super Junction concepts to a low voltage power MOSFET is investigated. The body junction is modified with the addition…
May 1, 2003
Simulation Standard
Using The Statistical Sampling Feature in the BCA Monte Carlo Implant Simulator
Silvaco’s Binary Collision Approximation (BCA) Monte- Carlo Implantation simulator closely replicates the physics of implantation by individually tracking implanted ions and their…
May 1, 2003
Simulation Standard
A Comparison Between Classical Full Chip Extraction and Field Solver Parasitic Extraction
This article will present two different ways to extract parasitics from an IC design: first using a full chip extraction tool HIPEX-RC…
May 1, 2003
Simulation Standard
ATLAS Simulation of an SEU Event in 2D
Q: Can ATLAS simulate an SEU event in 2D? To simulate a single event upset (SEU) is inherently a 3D problem because…
April 1, 2003
Simulation Standard
RPI VCSEL Model Released in SmartSpice
RPI VCSEL model was developed by Professor Michael Shur and his team from the Rensselaer Polytechnic Institute (RPI) [1]. A release of…
April 1, 2003
Simulation Standard
BSIM3v3 Model Verilog-A Implementation
Berkeley University BSIM3v3 model is the industry-standard, physics-based, deep-submicron MOSFET model for digital and analog circuit designs. This makes BSIM3v3 model a…
April 1, 2003
Simulation Standard
New Device Model Card Approach
Normally a single active device model is extracted to cover a range of device geometries and temperature. Sometimes this single scalable model…
April 1, 2003
Simulation Standard
SmartSpice Tips: Memory Usage, .MODIF & .ALTER, Non-convergence
When you run a long simulation time analysis the evaluated time points are normally all held in memory until the end time…
March 1, 2003
Simulation Standard
Guardian-Net Netlist Extractor: An Example of Specific Device Extraction Using XI-Scripts
Guardian LVS from Silvaco is an efficient, reliable, and diverse package that brings the benefit of high-speed verification to PC-based test environments.…
March 1, 2003
Simulation Standard
Complex Parallel-Series Reduction
Silvaco’s Guardian LVS tool compares two circuits that are defined by their netlists. The comparison is based strictly on the topological structure…
March 1, 2003
Simulation Standard
Expert Editor Settings and Layer Cleaning
I generated some layers in Expert by DRC script run, and after that, derived layers can not be cleaned by "Tools\Derived Layers\Clean…
February 1, 2003
Simulation Standard
Two-Dimensional ATLAS Device Simulation of Pentacene Organic Thin-film Transistors
Recent years has seen rapid acceleration in the research and development of organic thin film transistors (OTFTs) as key components for active…
February 1, 2003
Simulation Standard
Exact2: Interconnect Parasitic Capacitance Simulator
Exact2 from Silvaco is a sophisticated, physically-based simulation tool for calculating semiconductor interconnect capacitance values. Its purpose is to build a capacitance…
February 1, 2003
Simulation Standard
Laser Simulation Encompassing Molar Fraction Variation via DevEdit
This article addresses the creation of semiconductor laser double heterostructures, and the subsequent simulation of laser output with DevEdit from Silvaco. A…
February 1, 2003
Simulation Standard
The Importance of Mesh Definition in Strained-Si Heterostructure Simulation
Computer simulation is used extensively to verify physical phenomena in semiconductor devices. Meshing plays an essential role in obtaining good simulation results.…
February 1, 2003
Simulation Standard
Optical Lithography Models in ATHENA
ATHENA’s Optolith module is designed to simulate the 3 basic lithography technologies; contact printing, proximity and projection lithography. The imaging calculations within…
January 1, 2003
Simulation Standard
A CAD Framework for Co-Design and Analysis of CMOS-SET Hybrid Integrated Circuits
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical…
January 1, 2003
Simulation Standard
Behavioral Modeling and Simulation in the Scholar Schematic Environment
This article focusses on the use of Silvaco International’s schematic capture and editing tool Scholar combined with Verilog A. Verilog A is…
January 1, 2003
Simulation Standard
SmartView – Integration Aspects and Key Attributes
This simulation standard will discuss Silvaco International’s post processing application SmartView and will highlight features that identifying it as an important tool…
January 1, 2003
Simulation Standard
Getting an Accurate FFT Spectral Plot in SmartSpice
The transient simulation uses an adaptive time-stepping algorithm depending on the change in the circuit waveforms (dV/dT). This means the simulated waveform…
December 1, 2002
Simulation Standard
Real-time DRC Verification by DRC Guard
DRC Guard Performs "real-time" DRC on Expert Layout Editor. DRC Guard’s real-time design rule check (DRC) verifies entered or modified objects after the…
December 1, 2002
Simulation Standard
Actual Examples of Creating Parameterized Cells
Silvaco’s Expert tool is an extremely powerful layout-editing tool that supports features related to parameterized cells. Parameterized cells, often called P-cells, increase…
December 1, 2002
Simulation Standard
Connectivity Operations in Guardian DRC
The article "Connectivity options for DRC spacing check operations in Guardian" (Simulation Standard, vol. 11, no. 12) [1] describes layout netlist connectivity…
December 1, 2002
Simulation Standard
How does Snap-to-grid Works for Cell Instances
We have lots of cells that become off-grid when we do cut-and-paste from other cells. We tried to use the "Tools->Snap Selected…
November 1, 2002
Simulation Standard
Simulation of Single-Event Effects in FinFETs Using the ATLAS Device Simulator
A great deal of recent industry attention has focused on the use of non-planar multi-gate device structures in future generation MOS devices…
November 1, 2002
Simulation Standard
Simulation of a Double Ridge Edge Emitting InGaAsP/InP MQW Laser
In order to investigate the influence of ridge separation on the transverse optical modes of a double ridge edge multiple quantum well…
November 1, 2002
Simulation Standard
Quantum Modeling Part I: Poisson-Schrodinger Solver
The trend toward smaller MOSFET devices with thinner gate oxide and greater doping is resulting in the increased importance of quantum mechanical…
November 1, 2002
Simulation Standard
Simulation of a High Gain InP/InGaAs/InP Double HBT with Varying Doping Profile within ATLAS
It is possible to now create new heterojunction and double heterojunction bipolar transistors [2] utilizing junction layers made of different heterojunction semiconductor…
November 1, 2002
Simulation Standard
Order of Multiple Implants in a Process Affects Results
When an implant occurs there will be some level of damage to the crystal structure of the silicon. If this damage is…
October 1, 2002
Simulation Standard
Temperature Effects in SmartSpice LEVEL=6 Ferroelectric Capacitance Model From Ramtron
Implementation of a new ferroelectric capacitance model from Ramtron International Corporation into SmartSpice was first described in the April 2002 issue of…
October 1, 2002
Simulation Standard
UFSOI V7.0 (UFPDB V2.0) Model Released in SmartSpice
Version 7.0 of the University of Florida Silicon-On-Insulator (UFSOI), released in 2002, is now available with Silvaco SmartSpice by setting LEVEL to…
October 1, 2002
Simulation Standard
Managing SmartSpice / SmartView Simulation Output Raw Files
Silvaco SmartSpice simulation results are typically stored in RAM. Since transient simulations of large circuits often exceed 1GB, a large swap-space partition…
October 1, 2002
Simulation Standard
Defining Voltage Controlled Oscillators in SmartSpice
One of the methods to define a Voltage Controlled Oscillator (VCO) in a SPICE simulation is to make use of a voltage-controlled…
October 1, 2002
Simulation Standard
Geometry Binning for TFT models and SmartSpice Tips
Level=36 RPI poly-Si TFT and other original TFT models do not support automatic geometry binning. The enhanced model included with SmartSpice 1.9.7.C…
September 1, 2002
Simulation Standard
Advanced Features in Expert Layout Editing Tool: Parameterized Cells
Silvaco Expert is an extremely powerful layout-editing tool that supports features related to parameterized cells. Parameterized cells, often called P-cells, increase designer…
September 1, 2002
Simulation Standard
Expert Wiring Tool: Router at Hand
Modern complex circuit designs require automatic router functionality in circuit layout editors. In multi-layer hierarchical design, it is often necessary to build…
September 1, 2002
Simulation Standard
C++ Language Interface for Expert Layout Editor
The C++ interface for Silvaco’s Expert layout tool, is now an exclusive customization language that expands the tool’s handling of high-level customization,…
September 1, 2002
Simulation Standard
Running a DRC Check on a Design with Round Curves
After I create my round curve and run a DRC check on my design, it comes up with hundreds of errors associated…
August 1, 2002
Simulation Standard
Simulating Boron Diffusion in Silicon Germanium
The silicon germanium heterojunction bipolar transistor (SiGe HBT) is a promising technology for combining the operating speed of compound material devices with…
August 1, 2002
Simulation Standard
Simulating 3D Ohmic Heating Effects in Metal
A new feature has been added to Silvaco's device simulator ATLAS, which allows the simulation of ohmic heating effects in metals using…
August 1, 2002
Simulation Standard
The Valdinoci Temperature Dependent Impact Ionization Model for Silicon
Impact ionization plays an important role in the design of many semiconductor devices. Since impact ionization is both temperature and electric field…
August 1, 2002
Simulation Standard
Reproducing Basic Experiments in ATLAS to Study the Transient Decay of Carriers
ATLAS may be used to study these effects. A standard experiment for studying recombination in silicon is the transient decay of photoexcited…
July 1, 2002
Simulation Standard
BSIM3SOI Version 3.0 Model Released in SmartSpice
BSIM3SOI version 3.0 model was released on May 2002 by UC Berkeley. This model includes both Partially and Fully depleted models. This…
July 1, 2002
Simulation Standard
A New Surface-Potentials Based MOSFET Model: HiSIM
HiSIM is based on a charge-sheet model. IDS current is described using only one equation, and there-fore is continuous over the whole…
July 1, 2002
Simulation Standard
HiSIM Version 1.0 Model Released in UTMOST III
HiSIM is a MOSFET model for SPICE circuit simulation that has been developed by Hiroshima University and STARC Company. This model present several…
July 1, 2002
Simulation Standard
Measure Low Current FT in Bipolar devices
The input impedence of most network analyzers are around 1 MOhm, which is relatively small. Due to this low impedence the leakage…
June 1, 2002
Simulation Standard
Parallel DRC by Functional Decomposition of DRC Decks
A new version of Savage DRC system taps the full power of multiprocessor computers by introducing simultaneous execution of DRC commands from…
June 1, 2002
Simulation Standard
Expert Layout Editor, Savage DRC System and Guardian LVS for Linux Platform
Silvaco Data Systems announces the release of CELEBRITY CAD suite: Expert layout editor, Savage DRC system and Guardian LVS for Linux platform.
June 1, 2002
Simulation Standard
Modification of BEM for Precise Capacitance Extraction
It is well-known that parasitic effects are no longer negligible for modern integrated circuit technology. Among the most important parasitic effects limiting…
June 1, 2002
Simulation Standard
Advanced Layout Editing Using XI-scripts
To provide uniform etching of metal, dummy metal rectangles can be placed over an unused area of the chip. The following script…
June 1, 2002
Simulation Standard
Hints, Tips, and Solutions for Expert Layout Editor
Q: How can I cut exactly the same hole in many layers? Q: How to skip a single layer during stream-out? Q:…
May 1, 2002
Simulation Standard
A Model for Boron T.E.D. in Silicon: Full Couplings of Dopant with Free and Clustered Interstitials
In this contribution we present a model for transient enhanced diffusion of boron in silicon. This model is based on the usual…
May 1, 2002
Simulation Standard
Breakdown Analysis of a Body-Contacted Submicron High Electron Mobility Transistor
Interest continues to grow in the development of high electron mobility transistor (HEMT) technologies for micrometer and millimeter wave power applications. A…
May 1, 2002
Simulation Standard
QUEST: Frequency-Dependent RLCG Extractor Part 2 – Comparison with Experiments
This article presents a standard case of transmission line: the microstrip structure. First, the structure is described and then the results extracted…
May 1, 2002
Simulation Standard
ATLAS Simulation of a Schottky Contact
ATLAS allows the user to define a contact with a number of different boundary conditions; ohmic, Schottky, current controlled, floating or reflecting. The…
April 1, 2002
Simulation Standard
Verilog-A Release in SmartSpice
We give in this article an introduction to the Verilog-A SmartSpice interface. This new feature in SmartSpice allows the user to write…
April 1, 2002
Simulation Standard
New Ferroelectric Capacitance Model frmc from Ramtron Corporation in SmartSpice
Ramtron International Corporation has developed a ferroelectric capacitance model with a new concept of double distributions of domain reversal voltages.
April 1, 2002
Simulation Standard
Multiple Linear Solvers Introduced in SmartSpice
Acknowledging the need for more flexibility, SmartSpice now provides three numerical methods for linear system solution. The additional solvers provide for greater…
April 1, 2002
Simulation Standard
BSIM4 RF CMOS Modeling with UTMOST III
The BSIM4 model provides a RF CMOS modeling capability. Prior to the BSIM4 model the RF modeling was accomplished by using macro…
March 1, 2002
Simulation Standard
Enhanced LVS Reports in Guardian and Their Inspection
It is well known that analyzing LVS reports is often a difficult and brain-teasing task because the "global" nature of connectivity. Unlike…
March 1, 2002
Simulation Standard
Antenna Rule Checks in Savage
Antenna rules is a common name for rules that check ratios of amounts of material in two layers from the same node.…
March 1, 2002
Simulation Standard
Expert’s Application Programming Interface (Expert API)
Expert API is intended for customizing and extending the existing software functionality by functions written by the users of Expert using C/C++.
March 1, 2002
Simulation Standard
Add Custom Commands to Expert’s Menu
A simple way to add custom commands to Expert's menu is implemented. It is possible to add menu items that execute xi-commands…
February 20, 2002
Simulation Standard
Non-Stationary Transport Effects: Impact on Performances of Realistic 50nm MOSFET Technology
We analyze quantitatively the real impact of technology on the needed level for carrier transport modeling. The results, based on theoretical analyses,…
February 1, 2002
Simulation Standard
QUEST: Frequency-Dependent RLCG Extractor
Signals propagated in actual and future IC's interconnections are spreading, in terms of spectrum frequency, from DC to microwave domain because of…
February 1, 2002
Simulation Standard
Modeling of Charge Distribution Using Schrodinger-Poisson Equations: Application to Double-Gate GAA-SOI Transistor
The Gate-All-Around SOI transistor [1], in which the gate oxide and the gate electrode are wrapped around the semiconductor region between the…
February 1, 2002
Simulation Standard
Installing and using Silvaco TCAD tools on a Windows 2000 Machine
Installing and using Silvaco TCAD tools on a Windows 2000 Machine Introduction Silvaco software supports licensing on Windows NT (Serverice Pack 4.…
January 1, 2002
Simulation Standard
Modella PNP Bipolar Model Released in SmartSpice
The Modella lateral PNP bipolar model was developed by Philips Electronics N.V. and first released to the public domain in 1990 [1,2].…
January 1, 2002
Simulation Standard
New Berkeley BSIM4v2.1 MOSFET Model Available Within SmartSpice/UTMOST III
So far the BSIM3v3.2 MOSFET model, developed by UC-Berkeley, has been considered as the industry standard model for deep-submicron CMOS design. It…
January 1, 2002
Simulation Standard
How to Achieve Good Parameter Optimization Using The New Methodology in UTMOST III Optimizer
Optimization is the task of finding the absolute best set of admissible conditions to achieve your objective, formulated in mathematical terms. The…
January 1, 2002
Simulation Standard
How to extract BSIM4 parameters using UTMOST III
The BSIM4_FI routine in UTMOST III MOS module should be used for data collection and BSIM4 SPICE model parameter extraction. The BSIM4_FI…
December 1, 2000
Simulation Standard
Connectivity Options for DRC Spacing Check Operations in Savage
An IC layout has to satisfy many technological design requirements. One of these is spacing, i.e., a layout object has to be…
December 1, 2000
Simulation Standard
Recent improvements in Expert, Savage, Guardian and Maverick
Most of recent improvements in Expert, Savage, Guardian and Maverick are aimed at the enhancement of the usability of these tools. All…
December 1, 2000
Simulation Standard
Optimal Packing of Orthoblocks For ULSI Floorplanning
Virtually all latest and prospective enhancements of Expert Layout processor (for example, semi-automatic floorplanning) are based on sophisticated geometrical models. In some…
December 1, 2000
Simulation Standard
Hints, Tips and Solutions for Expert Layout Editor
If I try to close a project, Expert gives me a prompt: "Save changes in a project?", but I remember that I…
November 1, 2000
Simulation Standard
Simulating Impurity Freeze-Out During Low Temperature Operation
The low temperature operation of many device structures has been shown as an effective method for improving device performance without reducing device…
November 1, 2000
Simulation Standard
Simulation of Vertical Double-Gate SOI MOSFETs Using Device3D
This article will present the simulation methodology of a self-aligned double-gate MOSFET structure (FinFET) using SILVACO 3-D simulation suite. The double-gate MOSFET…
November 1, 2000
Simulation Standard
Non-Stationary Transport Effects: Impact on Performances of Realistic 50nm MOSFET Technology
We analyze quantitatively the real impact of technology on the needed level for carrier transport modeling. The results, based on theoretical analyzes,…
November 1, 2000
Simulation Standard
ATLAS can be used to perform large signal sinusoidal analysis
The Atlas syntax is flexible enough to allow the definition of sinusoidal nodal voltages by defining them on the SOLVE statement line.…
October 1, 2000
Simulation Standard
RF CMOS Modeling Using UTMOST III AC (S-Parameter) Module
This article presents a high frequency SPICE model parameter extraction method for CMOS devices. Current compact MOS models are developed for low…
October 1, 2000
Simulation Standard
New Improvements in TFT Models: Amorphous (Level=35) and Poly-Silicon (Level=36) TFT
New improvements have been added to Shur a-Si:H and Poly-Si Thin Film Transistors models. These enhancements include self-heating effect and a new…
October 1, 2000
Simulation Standard
BSIM4_U ( BSIM4 Universal Routine )
This routine is a multitarget/geometry routine used to extract all kind of characteristics. There is the possibility to trace three different targets.…
October 1, 2000
Simulation Standard
Measure CJSWG (CJGATE) Capacitance using UTMOST III
For the UTMOST III versions greater than 17.2.0.R, the UTMOST users can measure the CJSWG (CJGATE) capacitance using the "CJ/CJSW" routine. The…
September 1, 2000
Simulation Standard
Cross-Sectional Viewer in Expert
Cross-Sectional Viewer is a tool within Expert to simulate the cross sectional view of ICs along an arbitrary drawn cut-line on the layout. Cross-sectional Viewer is a…
September 1, 2000
Simulation Standard
Expert: Recent Improvements in Hierarchical Layout Inspection
The functionality of several features of Expert layout editor has been enhanced to deal with hierarchical layouts in more convenient ways.
September 1, 2000
Simulation Standard
Applicability of Distance Computation for Graphs to LVS Discrepancy Analysis
An important step in electronic circuit design is layout versus schematic verification (LVS)
September 1, 2000
Simulation Standard
Expert Hints, Tips, and Solutions: Object Scripting, Layer Color Palette, Big Measurements
Q: Often I need to measure big objects. It order to position the ruler precisely I must zoom in at one end,…
August 1, 2000
Simulation Standard
Yield Analysis and Performance Optimization Using FastBlaze and SPAYN
In previous Simulation Standard articles (Nov 97 & Nov 98) FastBlaze has been presented as a new, highly efficient approach to simulating…
August 1, 2000
Simulation Standard
New Model for Simulation of Exposure Process in Complex Nonplanar Resist-Substrate Structures
Predictive and efficient lithography simulation is an important component of the semiconductor industry efforts to develop the next generation of deep submicron…
August 1, 2000
Simulation Standard
Fast, Physical, Predictive and Calibrated Modeling of Ion Implantation
In a Research & Development environment, Technology Computer Aided Design (TCAD) is involved in the device optimization loop and requires efficient and…
August 1, 2000
Simulation Standard
Can Atlas be used to simulate advanced III-V or II-VI materials?
Yes. ATLAS now supports a wide range of materials in its database. This database covers single element conductors, binary compounds and quaternary compounds. A…
July 1, 2000
Simulation Standard
Modeling and Parameter Extraction Technique for HV MOS Devices with BSIM3v3
In this paper, I have used the same technique to model uni-directional HV MOS devices as previously reported for bi-directional HV MOS…
July 1, 2000
Simulation Standard
New RF MOSFET Small Signal SPICE Model – Part 2
RF MOSFET Small - Signal Model and Parameters Small-signal equivalent circuit of MOSFET after de-embedding parasitics is shown in Figure 1 and…
July 1, 2000
Simulation Standard
UFSOI: Process-Based Compact SOI MOSFET Models
SOI technology appears now to have become an advantageous, viable option for low-voltage and high-performance CMOS integrated circuits in digital, analog, and…
June 5, 2000
Simulation Standard
Hints, Tips, and Solutions June 2000
Q: To simplify netlist extraction, I specify one kind of diffusion resistors in my layout by means of a special resistor definition layer.…
June 4, 2000
Simulation Standard
Parametric-Cells Implementation in Expert
A parameterized cell (P-Cell) is a cell with user-specified parameters. It is possible to create customized p-cell instances with different composition according…
June 3, 2000
Simulation Standard
Dragon DRC: Performance Improvement Techniques
Dragon DRC is a new advanced hierarchical DRC system. The design principles this system is based on are carefully selected to ensure that Dragon DRC…
June 2, 2000
Simulation Standard
Maverick and Guardian – Enhancements
The latest release of Layout versus Schematic tools from CELEBRITY CAD suite (Maverick full-chip parametric netlist extractor and Guardian hierarchical netlist comparator) delivers a number of significant…
June 1, 2000
Simulation Standard
Design Version Control System for Expert
The DVCS subsystem of CELEBRITY CAD suite provides significant improvement in management of complex designs, design reuse and teamwork management. The most important features…
May 4, 2000
Simulation Standard
Hints, Tips, and Solutions February 2000
Q. When I simulate my process flow the simulated profile is always lower than the SRP measurements. What could be causing this? A.…
May 3, 2000
Simulation Standard
Using Luminous to Model the Transient Response of a Silicon Charge Collection and Transfer Structure
The rapid evolution of modern photonic devices in digital photographic and detection systems creates a need for physically-based simulation of charge collection…
May 2, 2000
Simulation Standard
Calibrated and Predictive Simulation of Doping Profiles: Low Energy As, B and BF2 Ion Implantation
This article will present an efficient and original methodology for global and predictive modeling of low energy Boron, BF2 and Arsenic ion…
May 1, 2000
Simulation Standard
QUEST – Extraction of Frequency Dependent R, L, C, and G Transmission Line Models
A primary use of QUEST is intended to be for extracting frequency dependent transmission line models for use in SPICE circuit simulations. The generation…
April 28, 2000
Simulation Standard
Hints, Tips, and Solutions April 2000
Q. How can I extract VBIC bipolar model parameters using UTMOST III? A. UTMOST III Bipolar module can be utilized to extract and optimize the VBIC…
April 3, 2000
Simulation Standard
NEW RF MOSFET Small Signal SPICE Model
With the advent of ever increasing operation frequencies, Silvaco is introducing a new high frequency model for MOSFETs that will be implemented…
April 2, 2000
Simulation Standard
JFET/MESFET TRIQUINT Models (Level=5 and level=7)
Until now, SmartSpice has supported the TriQuint model designated TOM using the Level=5 model parameter. SmartSpice now supports the TriQuint-2 MESFET model designated TOM-2. This model…
April 1, 2000
Simulation Standard
New Version 5.0 of UFSOI Model Released in SmartSpice
The University of Florida SOI Group first released version 5.0 of UFSOI model in August 1999 and then in November 1999. To…
March 3, 2000
Simulation Standard
Hints, Tips, and Solutions March 2000
Q: Usually, when I want to change the display of a drawing in the Drawing window, I select the Window pull-down menu in…
March 2, 2000
Simulation Standard
Scholar – SmartSpice Interface
One of the most useful features of the Scholar schematic capture is tight integration with the SmartSpice simulator. In effect, Scholar makes it possible to automatically generate SmartSpice netlist on…
March 1, 2000
Simulation Standard
Inter-Tool Communication Within CAD CELEBRITY
One of the main features of modern complex Computer-Aided Design Systems is the ability to support the communication between concurrently executing applications…
February 4, 2000
Simulation Standard
Hints, Tips, and Solutions February 2000
Q. How can I ensure that the vertical Y.MESH spacing in my process simulation is adequate for my particular implant condition? A. A good…
February 3, 2000
Simulation Standard
Reverse Engineering An AlGaAs/InGaAs PHEMT With FastBlaze
FastBlaze is an ultra-fast physical MESFET and HEMT simulator which incorporates advanced physical models. By designing the simulator and its framework specifically for…
February 2, 2000
Simulation Standard
ATLAS Field Dependent Mobility: Model Parameters for (0001) 6H-SiC and (0001) 4H-SiC
For high temperature, high power applications Silicon Carbide (SiC) continues to be a useful material for device fabrication because of its wide…
February 1, 2000
Simulation Standard
Investigating Two Dimensional Implantation Effects Using The BCA Model
The Monte Carlo Binary Collision Algorithm (BCA) implant module in ATHENA was introduced in an earlier article [Simulation Standard Vol 10, #5, May 1999]…
January 3, 2000
Simulation Standard
Hints & Tips January 1999
A. UTMOST III SOI module has three routines for characterization of the parasitic BJTs of SOI devices. These routines are "IC/VCE", "Gummel" and "INT_BJT"…
January 2, 2000
Simulation Standard
VBIC Version 1.2 Released in SmartSpice and UTMOST III
The latest VBIC bipolar model v1.2 of Sep 24 1999 has been integrated into SmartSpice and UTMOST III. It can be invoked by specifying the model…
January 1, 2000
Simulation Standard
RF CMOS Device Modeling: BSIM-Based Physical Model with Root-Like Construction Approach – Small Signal Modeling
A novel extraction method of high frequency small-signal model parameters for MOSFET is proposed. From S-parameter measurement, this technique accurately extracts the…
December 2, 1999
Simulation Standard
Hints & Tips December 1999
Q: I tried to resize shapes using the DRC command and observed thin "cracks" appeared for polygons with holes (see the left shape…
December 1, 1999
Simulation Standard
An Intuitive Front-End to Effective and Efficient Schematic Capture Design
In our previous publication ("Scholar: An Enhanced Multi-Platform Schematic Capture", Simulation Standard, Vol.10, Number 9, September 1999) we presented the main features of a…
November 5, 1999
Simulation Standard
Hints & Tips November 1999
A: ATLAS/S-Pisces and ATLAS/Blaze both have a small signal ac analysis capability built into them. This analysis is based upon the work of S.Laux [1] and…
November 4, 1999
Simulation Standard
Modeling Bidirectional Thyristors Using ATLAS
Thyristors are semiconductor devices that exhibit multi-stable or bi-stable electrical characteristics, and can be switched between a high-impedance OFF state and a…
November 3, 1999
Simulation Standard
Modelling Tunneling Currents in Ultra Thin Oxides
Ever decreasing minimum geometries in MOSFET design results in a corresponding reduction in the thickness of the gate oxide. This is an…
November 2, 1999
Simulation Standard
Optoelectric Device Simulation of a Dual-Base BJT Using Luminous
With the continuing emergence of optical technologies, optoelectronic device structures are becoming increasingly important for modern telecommunications and data network applications. Like…
November 1, 1999
Simulation Standard
The Industry Standard of SOI Technology From Process To Circuit Simulation
SOI technology for state of the art CMOS technology is rapidly approaching maturity. PD-SOI device design has the advantage of easier manufacturing…
October 3, 1999
Simulation Standard
Hints & Tips October 1999
A. It is likely that there may be some contact problems or defected devices during the data collection. This problem can occur when…
October 2, 1999
Simulation Standard
New Improvements in TFT Models: Amorphous (Level=35) and Poly-Silicon (Level=36) TFT
New improvements have been added to Shur models. These enhancements include a self-heating effect and a new charge conservative model.
October 1, 1999
Simulation Standard
BSIM3SOI Version 2.1 (FD, DD and PD) Models Released in SmartSpice
The Berkeley BSIM3SOI version 2.1 models, released in September 1999, have been implemented in SmartSpice. The three new models are selected according to…
September 2, 1999
Simulation Standard
Hints & Tips September 1999
Q: How can I cut exactly the same hole in many layers? A: There are at least two ways to do this.…
September 1, 1999
Simulation Standard
Scholar: An Enhanced Multi-Platform Schematic Capture
One of the main features of modern complex CAD systems consists in the ability to support the schematic capture function that provides…
August 4, 1999
Simulation Standard
Hints & Tips August 1999
A: Modeling of the increase in breakdown voltage at elevated temperatures requires a model to describe the temperature dependence of the impact ionization…
August 3, 1999
Simulation Standard
High Performance ATHENA and ATLAS Simulation on PC under NT
The recent advances in PC hardware capability in terms of memory and CPU floating point performance has allowed the possibility of running…
August 2, 1999
Simulation Standard
New Thermionic Emission and Tunneling Models in ATLAS
In order to simulate heterojunction devices accurately, both the thermionic emission and tunneling mechanisms must be considered when calculating transport across hetrojunctions.…
August 1, 1999
Simulation Standard
Generating a Capacitance Coefficient Database for any Chip Level LPE Tool Using EXACT
EXACT is a sophisticated interconnect characterization tool integrated into the DISCOVERY framework. It is designed to build the capacitance coefficient database required by any Layout…
July 3, 1999
Simulation Standard
Hints & Tips July 1999
The "Binning" routine in UTMOST III MOS module has been greatly enhanced. The bin models can be generated much faster and the routine requires…
July 2, 1999
Simulation Standard
MOS31 JFET/MOSFET Model Now Available in SmartSpice
Silvaco now offers the MOS31 JFET/MOSFET model originally developed by Philips [1] as part of the SmartLib product-independent model library. This model is available…
July 1, 1999
Simulation Standard
New SOI UTMOST Module
Bulk CMOS is currently the dominant technology for VLSI integrated circuits but its scaling constraints pose ever greater as device geometries shrink.…
June 4, 1999
Simulation Standard
Hints & Tips May 1999
A. Previous articles in the Simulation Standard have highlighted the diffusion models required for accurate simulation of shallow source/drain junction formation[1] and…
June 2, 1999
Simulation Standard
Hints & Tips June 1999
Q: I want to draw several long wires, with precise positioning of both ends. I am used to doing this as follows:
June 1, 1999
Simulation Standard
Maverick- Hierarchcal Full-Chip Extractor Recent Significant Advances
Maverick is a sophisticated full chip hierarchical netlist extractor [1]. It augments the existing CELEBRITY framework which includes state-of-the-art software for VLSI layout editing, hierarchical…
May 3, 1999
Simulation Standard
Circuit Performance Analysis of Multiple ATHENA Transistors Using MixedMode
In a previous issue of Simulation Standard for Process and Device Engineers[1] the simulation of a three stage CMOS ring oscillator using ATLAS/MixedMode was…
May 2, 1999
Simulation Standard
Continous Trap Model for Accurate Device Simulation of Polysilicon TFTs
There has been a significant increase in the popularity of liquid crystal displays with control circuitry being placed on to the glass…
May 1, 1999
Simulation Standard
Very Low Energy Boron Implant Simulation Using New BCA Monte-Carlo Model
ATHENA version 5.0 includes a new Binary Collision Algorithm (BCA) for accurate Monte-Carlo implant modeling down to sub-1keV energies. This new BCA code…
April 3, 1999
Simulation Standard
Hints & Tips April 1999
A. The BSIM3_MG routine in SOI module of UTMOST III can be used to extract SOI model parameters. The SOI BSIM3_MG routine operation is similar…
April 3, 1999
Simulation Standard
SPAYN: Golden Device Search Algorithm, EKV MOSFET Model and Improved GUI
The addition of important features in the latest version of SPAYN (1.7.3.R) makes it an even more useful and versatile statistical parameter and yield…
April 2, 1999
Simulation Standard
Mixed-Signal Simulation with SmartSpice in the Cadence Design Framework II
Users of the Cadence Design Framework II (DFII, versions 4.4.0 and above) have been enjoying a tight integration between SmartSpice and the Analog Artist…
April 1, 1999
Simulation Standard
Intrinsic Capacitance Parameter Extraction in UTMOST III
The intrinsic capacitance parameter extraction routine (INTCAP) is in the CAP analysis section of the UTMOST III MOS module (Routine#67). The INTCAP routine has…
March 3, 1999
Simulation Standard
Hints & Tips March 1999
Q: I often use the temporary reference point, but I would like to see both absolute coordinates and relative coordinates, without toggling the…
March 2, 1999
Simulation Standard
Advanced Pairwise Merging Algorithm for VLSI Floorplanning
This paper concerns the problem of determining optimal placement of rectangular blocks within a rectangular area known as the packing or cutting-stock…
March 1, 1999
Simulation Standard
Introducing Guardian – LVS Verification for PC-based Platforms
Guardian is a (state-of-the-art) hierarchical netlist comparison system, which eliminates many of the disadvantages of existing programs. Running on PCs under Windows NT,…
February 2, 1999
Simulation Standard
Mixed Circuit Device Simulation of Single Event Upset in a Memory Cell
This article presents Single Event Upset (SEU) simulation of a SRAM cell using MixedMode3D. MixedMode3D provides the capability to simultaneously perform circuit simulation coupled…
February 1, 1999
Simulation Standard
New, Fast Numerical Algorithm for Diffusion Modeling Implemented in ATHENA Version 5.0
A new diffusion algorithm based on a Galerkin method with linear finite elements, an extremely fast sparse matrix solver, and object oriented…
January 5, 1999
Simulation Standard
Hints & Tips January 1999
A. Typically, UTMOST III s-parameter module is used to measure the FT versus IC (collector current) characteristic of bipolar transistors. The FT_CE routine can also…
January 4, 1999
Simulation Standard
New Parameters for TFT model: Amorphous (Level=35) and Poly-Silicon (Level=36) TFT
Several enhancements have been made to the TFT models in SmartSpice. New parameters have been added to improve accuracy and allow simular sophisticated modeling…
January 3, 1999
Simulation Standard
Enhanced Statistical Features in SPAYN Version 1.7.2
When performing statistical analyses it is often necessary to compute transformations of the observed data. This transformation may only involve a single…
January 2, 1999
Simulation Standard
New Built-in Dichotomic Search Algorithm in Smartspice
General purpose dichotomic search method is often requested by designers when they want to find a specific element (voltage, current, parameter value…
January 1, 1999
Simulation Standard
PHILIPS Model 9 New MM9 Extraction Routine in UTMOST III
Philips Level 9 model is widely used as an accurate deep submicron CMOS model. The model is physical, and as such lands…
December 3, 1998
Simulation Standard
HINTS & TIPS – December 1998
Q: I took the example file mux4.gds from Expert's installation and tried the Edit-in-place operation. I entered into an instance of mux1,…
December 2, 1998
Simulation Standard
LISA Powerful Script language for Expert
This article introduces the LISA (Language for Interfacing Silvaco Applications) command language and gives an overview of LISA features.
December 1, 1998
Simulation Standard
Expert Expanded with Client-Server Project/Library Management
The Expert layout processor v.2.0 introduces a client-server system for managing large projects in multiuser design environments. This system is a significant improvement and…
November 5, 1998
Simulation Standard
HINTS & TIPS – November 1998
Q: How can anti-reflective coatings be modeled when simulating photodetectors in ATLAS/Luminous? How can detection efficiency be plotted?A: Earlier version of ATLAS were able to handle…
November 4, 1998
Simulation Standard
New Model for High Energy Implants in ATHENA
In our earlier paper [1] a new Binary Collision Approximation (BCA) module was described. It was shown that models and algorithms implemented…
November 3, 1998
Simulation Standard
Calibrating a Typical Bipolar Process Flow
A common request from TCAD (Technology Computer Aided Design) users is advise on how to calibrate the process flow and device simulator…
November 2, 1998
Simulation Standard
Accurate, High Speed Physics in FastBlaze
FastBlaze uses novel device simulation techniques to simulate typical MESFET and HEMT characteristics in less than a minute. To be a truly useful…
November 1, 1998
Simulation Standard
Validation of CLEVER Interconnect Parasitics with 0.18 µm Process Measurements Benoit Froment and Herve Jaouen – SGS-Thomson Microelectronics
Parasitics+Netlist
CLEVER can perform accurate field solver extractions of resistance and capacitance from 3D structures generated from realistic process simulation. Comparison of CLEVER results with measurements…
October 5, 1998
Simulation Standard
HINTS & TIPS – October 1998
The HP4155/56 DC Analyzer can be configured with SMU and Pulse Generator expander box frame called HP41501A. The expander box can have…
October 4, 1998
Simulation Standard
SPAYN Recent Developments
An important aspect of statistical process control in IC production is the ability to predict circuit performance variation in the manufacturing process.…
October 3, 1998
Simulation Standard
Scholar
The debut of Silvaco's new schematic editor, Scholar, is drawing closer. Scholar is a sophisticated design tool which derives its power and flexibility from the…
October 2, 1998
Simulation Standard
PHILIPS Model 9
In collaboration with STMicroelectronics Central R&D at Crolles (France), a new routine has been developed in UTMOST III to provide a complete solution for…
October 1, 1998
Simulation Standard
Parallel .ALTER Statements in SmartSpice
The .ALTER statement is designed to allow a SPICE input deck to be re-run with a change in a single parameter. This feature is…
September 3, 1998
Simulation Standard
HINTS & TIPS – September 1998
I run DRC, find one-two violations, correct them, then I re-run DRC to check whether my corrections worked. However re-running on the…
September 2, 1998
Simulation Standard
Recursive Cutting of Rectangular Partitions for VLSI Floorplanning
Rectangular partitionings form a mathematical base for many modern approaches to automation of VLSI design [1-3]. In particular, popular methodologies of hierarchical…
September 1, 1998
Simulation Standard
Real-time DRC in Expert Layout Editor
In this paper we introduce one of the latest and most advanced features of Silvaco's Expert Layout processor for Windows NT DRC Guard.…
August 4, 1998
Simulation Standard
HINTS & TIPS – August 1998
When using the analytical implant tables in ATHENA the default model for the lateral implant range assumes a gaussian profile with a standard deviation…
August 3, 1998
Simulation Standard
Simulating Redeposition During Etch Using a Monte Carlo Plasma Etch Model
The shrinking critical dimensions of modern technology place a heavy requirement on optimizing the etching of narrow mask opening. In addition the…
August 2, 1998
Simulation Standard
Fourier Transform Analysis for Large Signal Frequency Response in ATLAS
The ATLAS device simulation framework has been to improve the analysis the large signal transient behavior. These features include a simple specification for single…
August 1, 1998
Simulation Standard
Simulating Accurate 3D Geometries for Interconnect Parasitic Extraction Using CLEVER
CLEVER is designed to model interconnect parasitics by simulating the back end processing steps of custom cells in three dimensions. A 3D process…
July 5, 1998
Simulation Standard
HINTS & TIPS – July 1998
The traditional Noise models in SPICE used two parameters (AF and KF) to model the noise level and the frequency dependency of…
July 4, 1998
Simulation Standard
UTMOST File Format Extension
Following the log file conversion tool for TonyPlot introduced with UTMOST 12.3.14.R1, new file formats have been added to UTMOST III's printing and plotting options to make…
July 3, 1998
Simulation Standard
SmartSpice v.1.5.5 Release Notes
The latest Berkeley BSIM3v3.2 model of June 16 1998 has been integrated into SmartSpice 1.5.5. The Silvaco implementation of the Berkeley BSIM3v3.2 model can…
July 2, 1998
Simulation Standard
EKV MOSFET Model Version 2.6 Now Available in SmartSpice and UTMOST III
Silvaco now offers the EKV (ENZ, KRUMMENACHER, VITTOZ) MOSFET model version 2.6 originally developed in EPFL ("Ecole Polytechnique Federale de Lausanne" -…
July 1, 1998
Simulation Standard
BSIM3v3.2 Model Released in SmartSpice and UTMOST III
The latest Berkeley BSIM3v3.2 model of June 16 1998 is now available in the SmartSpice 1.5.5 release. Two BSIM3v3.2 implementations are supported…
June 3, 1998
Simulation Standard
HINTS AND TIPS – June 1998
Q: Can I draw tangents to circles in EXPERT? A: Expert supports several options for drawing sophisticated shapes. There are three ways to accomplish…
June 2, 1998
Simulation Standard
Optimum Standard Cell Layout Using Weighted Cycle Linear Placement
Placement and routing problems for integrated circuits are inherently interrelated and extremely complex from the algorithmic point of view. This complexity grows…
June 1, 1998
Simulation Standard
Maverick: Hierarchical Netlist Extractor for PC Platforms
Maverick is a modern hierarchical netlist extractor, providing extraordinary efficiency as well as comprehensive features and ease of use. It runs on…
May 5, 1998
Simulation Standard
HINTS AND TIPS – May 1998
How can anti-reflective coatings be modeled when simulating photodetectors in ATLAS/Luminous? How can detection efficiency be plotted?
May 4, 1998
Simulation Standard
Calibrating Reverse Short Channel Effects in MOSFETs
This article focuses on the effects of process and modeling parameters on device electrical characteristics and uses the threshold voltage versus gate…
May 4, 1998
Simulation Standard
Low-Power Systems-on-a-Chip CAD
Mixed-signal systems-on-a-chip (SOC) integration of digital, analog, RF, and power components is emerging to meet demands for low-power, highly integrated systems in…
May 1, 1998
Simulation Standard
Ultra-Fast Device Simulation with Monte Carlo Tuned Transport Models in FastBlaze
FastBlaze is a fast physical device simulator for MESFETs and HEMTs optimized to provide interactive TCAD for modern III-V FET devices. It…
April 7, 1998
Simulation Standard
HINTS & TIPS – April 1998
Q. What is the typical method of measuring flicker noise using S3245A Noise Amplifier?
April 6, 1998
Simulation Standard
SPICE Model Validation
The importance of the MOS device SPICE model validation and the introduction of the validation routine in UTMOST III was presented in…
April 5, 1998
Simulation Standard
UTMOST Log File Conversion for TonyPlot
A new feature has recently been added to UTMOST: the ability to convert UTMOST log files into a format suitable for viewing in TonyPlot. This new…
April 5, 1998
Simulation Standard
Advanced Cell Characterization Using SmartSpice Scripting Features
In a previous article [1], the efficient use of the SmartSpice .MODIF statement for cell characterization was discussed. This article will focus on using advanced…
April 3, 1998
Simulation Standard
Release of RPI Amorphous Silicon and Polysilicon TFT Models in SmartSpice and UTMOST
Thin film transistors (TFTs) have an important application in the manufacture of active matrix LCD displays. As this technology has become more…
April 2, 1998
Simulation Standard
Release of an Upgraded SmartSpice Interface to Cadence
The SmartSpice Interface to Cadence integrates the Analog Artist and Composer elements of the Cadence Design Framework II (DFII) with SmartSpice. This integration is accomplished,…
April 2, 1998
Simulation Standard
ATLAS/MixedMode Simulation of a Three Stage CMOS Ring Oscillator Part I: MixedMode Setup
Ring oscillator circuits are a valuable test structure for determining the feasibility and success of an integrated circuit process fabrication sequence. One…
April 1, 1998
Simulation Standard
BSIM3SOI Level=25 Model Released in SmartSpice
The Berkeley BSIM3SOI model, released in December 1997, is now available within SmartSpice as the MOSFET level=25 model. This model incorporates three separate implementations:…
March 3, 1998
Simulation Standard
Scanbox Approach to Shape Reconstruction for Automated Reticle Inspection
The paper describes a generalization of the scanline approach [1] to reconstruction of the shape of planar object represented by a discrete…
March 3, 1998
Simulation Standard
Savage Enhanced with Recognition and Reporting of Hierarchical Structure of Errors
This article describes a method of reporting DRC errors implemented in Savage, applicable to multi-million transistor layouts. The method of hierarchical information inheritance…
March 2, 1998
Simulation Standard
Circuit Verification via Hypergraph Realization
One of the most challenging and time consuming tasks in VLSI design automation is Layout Versus Schematic (LVS). The problem is to…
March 1, 1998
Simulation Standard
HINTS & TIPS – March 1998
Q: Is it possible to perform a DRC check on portions rather than on the whole circuit useful when only 2 or 3…
February 5, 1998
Simulation Standard
3D Simulation of Power Devices Using Giga3D and MixedMode3D
Recent additions to the ATLAS device simulation framework have added the ability to simulate 3D electrothermal effects in Giga3D and mixed circuit…
February 4, 1998
Simulation Standard
MixedMode Simulation of Power Electronic Converters
With mounting concern for energy conservation and nature preservation, power electronics is becoming increasingly dominant in everyday life.
February 3, 1998
Simulation Standard
Polysilicon Gate Depletion Effects in Sub-Micron MOSFETs
It is usually assumed that the poly gate in a MOSFET is doped at a concentration such that depletion in the gate…
February 2, 1998
Simulation Standard
Mesh Control in ATHENA Avoiding Problems and What to do If they Occur
Mesh control in process simulators is one of the major issues tackled by any user. Over the years the meshing algorithms with SSuprem4 and ATHENA have…
February 1, 1998
Simulation Standard
HINTS & TIPS – February 1998
Q: How can external tools be run inside of Silvaco's run-time environment DeckBuild? Is it possible to include UNIX commands along with simulator…
January 4, 1998
Simulation Standard
The SmartSpice Interface to Cadence (revisited)
The SmartSpice interface to the Cadence Design Framework II has been substantially improved in its latest release (version 1.0.8.R), following feedback from…
January 3, 1998
Simulation Standard
CellRATER from Taveren Technology fast, Accurate Cell Library Characterization for Deep Submicron Timing Flow Improvement
Taveren Technology, Inc., a startup company based in Austin, Texas is busy developing the next generation performance characterization tool suite.
January 2, 1998
Simulation Standard
Cell Characterization with .MODIF Statement in SmartSpice
SmartSpice provides many unique and powerful features to facilitate parametric analysis in general and cell characterization in particular.
January 1, 1998
Simulation Standard
Local Optimization Templates for Extracting BSIM3v3.1 Parameters in UTMOST III
The BSIM3v3.1 SPICE model has become an industry standard for modeling deep-submicron MOS technologies. The model is suitable for both digital and…
January 1, 1998
Simulation Standard
Hints, Tips, and Solutions – January 1998
Q: What is typical measurement set-up for the S3245A Noise Amplifier and what measurement equipment is used? A: Typical Measurement Set-Up
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