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2018

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.

8 years ago

How TCAD Can Help You to Find The Right Material To Build Your Flexible Display

How TCAD Can Help You to Find The Right Material To Build Your Flexible Display The mechanical stress in a thin-film transistor on flexible substrate is one of the most

9 years ago

Subsystem Insight

Subsystem Insight Debugging Silvaco Subsystems with IAR Embedded Workbench Silvaco and IAR Systems have teamed up to provide software solutions for Silvaco’s AMBA Subsystems. Silvaco’s AMBA Subsystems provide the basic

9 years ago

TCAD Simulation of Si and GaAs p-n Junction Devices at Cryogenic Temperatures, Down to 2 K

Cryogenic electronics plays a fundamental role in several applications, such as spacecraft, high-energy physics experiments, metrology, superconductive astronomical detectors and, with the increased interest in quantum computing, the manipulation of

9 years ago

Bi-axial Deformation with Victory Mesh for Flexible Electronic Applications

For high performance large area flexible electronics, amorphous metal oxide semiconductor based thin film transistors offer many advantages. These include high mobility, steep sub-threshold and ultralow leakage current, with low

9 years ago

TCAD-based GaN HEMT Scalable Modeling Flow Using the MVSG Compact Model

Gallium Nitride High Electron Mobility (GaN HEMT) device technology has gained a lot of traction during the last years. These devices have significant advantages compared to Silicon in user applications

9 years ago

Hints, Tips and Solutions – Adding Random Noise to Mask Layout

Geometrical module of Victory Process allows the fast and accurate transfer of mask patterns to the structure. However, sometimes it is necessary to emulate the imperfections of physical processes while

9 years ago

Accurate Parasitic RC Extraction using Realistic 3D TCAD Structures

Accurate Parasitic RC Extraction using Realistic 3D TCAD Structures Accurate determination of RC parasitics is a key component in the design and integration of many state of the art semiconductor

9 years ago

Standard Cell Statistical Characterization with VarMan

Standard Cell Statistical Characterization with VarMan With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining standard cell library performance. When

9 years ago

SPI vs SPI

SPI vs SPI This webinar will provide a discussion of Silvaco’s SPI, QSPI, and OSPI IP products and how they are useful in today’s SOCs. SOCs from small IoT devices

9 years ago

Advanced Process and Device 3D TCAD Simulation of Split-Gate Trench UMOSFET

Lower conduction loss and fast switching characteristics for power devices are increasingly required in the more and more energy-conscious world. For the low to medium voltage ranges (12 V ~