Yearly Archives: 2018
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2018
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
8 years ago
How TCAD Can Help You to Find The Right Material To Build Your Flexible Display
How TCAD Can Help You to Find The Right Material To Build Your Flexible Display The mechanical stress in a thin-film transistor on flexible substrate is one of the most
9 years ago
Subsystem Insight
Subsystem Insight Debugging Silvaco Subsystems with IAR Embedded Workbench Silvaco and IAR Systems have teamed up to provide software solutions for Silvaco’s AMBA Subsystems. Silvaco’s AMBA Subsystems provide the basic
9 years ago
TCAD Simulation of Si and GaAs p-n Junction Devices at Cryogenic Temperatures, Down to 2 K
Cryogenic electronics plays a fundamental role in several applications, such as spacecraft, high-energy physics experiments, metrology, superconductive astronomical detectors and, with the increased interest in quantum computing, the manipulation of
9 years ago
Bi-axial Deformation with Victory Mesh for Flexible Electronic Applications
For high performance large area flexible electronics, amorphous metal oxide semiconductor based thin film transistors offer many advantages. These include high mobility, steep sub-threshold and ultralow leakage current, with low
9 years ago
TCAD-based GaN HEMT Scalable Modeling Flow Using the MVSG Compact Model
Gallium Nitride High Electron Mobility (GaN HEMT) device technology has gained a lot of traction during the last years. These devices have significant advantages compared to Silicon in user applications
9 years ago
Hints, Tips and Solutions – Adding Random Noise to Mask Layout
Geometrical module of Victory Process allows the fast and accurate transfer of mask patterns to the structure. However, sometimes it is necessary to emulate the imperfections of physical processes while
9 years ago
Accurate Parasitic RC Extraction using Realistic 3D TCAD Structures
Accurate Parasitic RC Extraction using Realistic 3D TCAD Structures Accurate determination of RC parasitics is a key component in the design and integration of many state of the art semiconductor
9 years ago
Standard Cell Statistical Characterization with VarMan
Standard Cell Statistical Characterization with VarMan With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining standard cell library performance. When
9 years ago
SPI vs SPI
SPI vs SPI This webinar will provide a discussion of Silvaco’s SPI, QSPI, and OSPI IP products and how they are useful in today’s SOCs. SOCs from small IoT devices
9 years ago
Advanced Process and Device 3D TCAD Simulation of Split-Gate Trench UMOSFET
Lower conduction loss and fast switching characteristics for power devices are increasingly required in the more and more energy-conscious world. For the low to medium voltage ranges (12 V ~