Simulation Standard

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.

24 years ago

Advanced Features in Expert Layout Editing Tool: Parameterized Cells

Silvaco Expert is an extremely powerful layout-editing tool that supports features related to parameterized cells. Parameterized cells, often called P-cells, increase designer productivity by adding enormous flexibility and efficiency to

24 years ago

Expert Wiring Tool: Router at Hand

Modern complex circuit designs require automatic router functionality in circuit layout editors. In multi-layer hierarchical design, it is often necessary to build a single wire between two objects or arbitrary

24 years ago

C++ Language Interface for Expert Layout Editor

The C++ interface for Silvaco’s Expert layout tool, is now an exclusive customization language that expands the tool’s handling of high-level customization, such as a design application working with Expert’s

24 years ago

Running a DRC Check on a Design with Round Curves

After I create my round curve and run a DRC check on my design, it comes up with hundreds of errors associated with curves. For example, I have the layer

24 years ago

Simulating Boron Diffusion in Silicon Germanium

The silicon germanium heterojunction bipolar transistor (SiGe HBT) is a promising technology for combining the operating speed of compound material devices with the production capability of bulk silicon. The presence

24 years ago

Simulating 3D Ohmic Heating Effects in Metal

A new feature has been added to Silvaco's device simulator ATLAS, which allows the simulation of ohmic heating effects in metals using the Giga or Giga3D modules. The feature has

24 years ago

The Valdinoci Temperature Dependent Impact Ionization Model for Silicon

Impact ionization plays an important role in the design of many semiconductor devices. Since impact ionization is both temperature and electric field dependent, it is important to use a model

24 years ago

Reproducing Basic Experiments in ATLAS to Study the Transient Decay of Carriers

ATLAS may be used to study these effects. A standard experiment for studying recombination in silicon is the transient decay of photoexcited carriers - known as the Stephenson-Keyes method for

24 years ago

BSIM3SOI Version 3.0 Model Released in SmartSpice

BSIM3SOI version 3.0 model was released on May 2002 by UC Berkeley. This model includes both Partially and Fully depleted models. This model is now implemented in SmartSpice and can

24 years ago

A New Surface-Potentials Based MOSFET Model: HiSIM

HiSIM is based on a charge-sheet model. IDS current is described using only one equation, and there-fore is continuous over the whole range of operating regions. This improves MOSFETs modeling