Home » Archives for Gigi Boss » 第8页
Gigi Boss
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
2 years ago
How Can I Re-Use Individual Monte-Carlo 3D Implant Profiles?
It is often the case that a design of experiments (DOE) is required to optimize the performance of a particular device. Sometimes this simply means tweaking the implant dose for
2 years ago
Comparison of Models for Fluorine Effect on Dopant Diffusion in CMOS Processes
Recently a new diffusion model was introduced to Victory Process: the CMOS model. This model aims at taking on the challenges brought by the specificities of CMOS device processing such
2 years ago
Silvaco Announces Pricing of Initial Public Offering
May 8, 2024
2 years ago
Silvaco Announces Launch of Initial Public Offering
April 30, 2024
Custom News, Foundation IP News, Library News, Modeling News, News, Parasitics+Netlist News, SIPware News, SPICE News, TCAD News, Variation News
3 years ago
Silvaco Announces Expanded Partnership with Micron Technology
April 16, 2024
3 years ago
Setting up the Wafer Orientation: Applications to Ion Implantation
Properly setting the wafer orientation in Victory Process (VP) is critical for various processes such as ion implantation, etching, and deposition. For ion implantation in particular, the determination of the
3 years ago
Optoelectronic Component Design for Photonic Integrated Circuits
Photonic integrated circuits (PICs) are a key enabling technology for a broad range of current and next-generation products. Combining semiconductor materials and manufacturing processes common to microelectronics with the encoding,
3 years ago
意法半导体:如何使用Silvaco TCAD研究表面缺陷点对SiC器件短路现象的影响
2024年3月28日 在打开和关闭SiC器件时,器件容易出现异常过载,因此在一些应用中对器件“鲁棒性”有要求,例如需进行短路测试和UIS测试。在本次研讨会中,来自意法半导体的研发人员将为大家介绍如何使用Silvaco TCAD软件对SiC器件短路现象进行研究。