7 years ago
The Simulation Standard, Silvaco’s technical journal for semiconductor process and device engineers is beginning its 30th year of publication. The latest issue has just been released and it outlines a
7 years ago
2020년 4월 3일 | 2:00am-2:30am (한국 시각) 드리프트 확산 시뮬레이션은 다층 OLED 소자 연구에 폭넓게 적용할 수 있지만, 미시적인 방법은 소자 규모로 바로 변환할 수 없는 분자 속성을 계산하는 데에
7 years ago
The market for cellular components has been shifting rapidly from GaAs pHEMT or silicon-on-sapphire (SOS) to silicon-based technology. CMOS (silicon-on-insulator) SOI antenna switches which are compatible with multimode GSM/EDGE, TD/WCDMA,
7 years ago
The full text for most of these papers may be found at the IEEE website at www.ieee.org. P. Blaise,1,2 “Ab Initio Simulation of Advanced Materials and Devices: Current Challenges“, 1Silvaco
7 years ago
The full text for most of these papers may be found at the IEEE website at www.ieee.org. Samy Almosni,[a,b] Ludmila Cojocaru,[a] Debin Li,[c] Satoshi Uchida,* [d] Takaya Kubo,[a] Hiroshi Segawa[a],[e],
7 years ago
The full text for most of these papers may be found at the IEEE website at www.ieee.org. Yonghyun Shim, Member, IEEE, Jean-Pierre Raskin, Member, IEEE, César Roda Neve, Member, IEEE,
7 years ago
The full text for most of these papers may be found at the IEEE website at www.ieee.org. Daewoong Kang, Hyungcheol Shin, “Improving the cell characteristics using arch-active profile in NAND
7 years ago
The full text for most of these papers may be found at the IEEE website at www.ieee.org. H. Matsuura, S. Sakurai, Y. Oda, S. Fukushima, S. Ishikawa, A. Takeshita, and
The full text for most of these papers may be found at the IEEE website at www.ieee.org. Takashi Kameshima, Shun Ono, Togo Kudo, Kyosuke Ozaki, Yoichi Kirihara, Kazuo Kobayashi, Yuichi
7 years ago
The full text for most of these papers may be found at the IEEE website at www.ieee.org. Viviana Cerantonio, Marcello Giuffrida, Cristina Miccoli, Alessandro Chini, Ferdinando Iucolano “From TCAD simulations
7 years ago
The full text for most of these papers may be found at the IEEE website at www.ieee.org. Guido Notermans, Olivier Quittard, Anco Heringa, Željko Mrčarica, Fabrice Blanc, Hans van Zwol,