Learn How to Utilize Victory Analytics and Machine Learning to Calibrate TCAD Data
December 12, 2024
In this webinar, an ML-TCAD combined strategy is presented to boost the calibration of TCAD parameters to benchmark TCAD simulations against experimental data.
Learn How to Simulate 2D-TMD-Channel FETs with Atomistic Precision
September 26, 2024
In this context, we show how the Victory Atomistic tool can answer this essential question thanks to quantum mechanics, offering valuable support for the prototyping effort of a 2D transistor in a professional TCAD environment.
Learn How Micron Utilizes Silvaco’s Fab Technology Co-Optimization for Development and Manufacturing of Memory Technologies
August 29, 2024
This webinar highlights how Micron Technology utilizes Silvaco’s Fab Technology Co-Optimization (FTCOTM) platform for the development and manufacturing of advanced memory technologies.
Applying Artificial Intelligence in Fab Technology Co-Optimization (FTCOTM)
July 25, 2024
The common approach to optimize a fabrication process involves process and fab engineers creating and setting up Design of Experiments (DoEs) using a trial-and-error approach. This approach often leads to costly iterations since wafer fabrication is both expensive and time-consuming. The new approach described in this webinar, already in production use today, leverages artificial intelligence (AI) and machine learning (ML) to generate an accurate model of a fabrication step.
Silvaco Announces Initiatives to Enhance Workforce Development in Semiconductor Industry
June 12, 2024
Silvaco Announces Launch of Initial Public Offering
April 30, 2024
Learn How STMicroelectronics Silicon Carbide (SiC) Research Team uses Silvaco TCAD to Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices
March 28, 2024
During SiC device switching operations, it is possible that devices could be reaching abnormal overload conditions, which is why some applications require “robustness” specifications (e.g., Short Circuit and UIS tests). In this webinar we will show how the impact of a short circuit of a defect localized in the active area has been investigated by means of TCAD simulations performed with Silvaco software.