Casey Molver

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster. 

12 years ago

Device simulation helps users understand and depict the physical processes in a device and to make reliable predictions of the behavior of the next device generation. Device simulations with properly

12 years ago

Among the many design criteria for solar cells, the design of the top metal contact impacts the cell efficiency. The areal density of the top contact modifies the magnitude of

12 years ago

There is a constant demand to lower the on-state resistance of devices, improving their energy efficiency as well as increasing their current handling capabilities whilst maintaining the desired breakdown voltage.

12 years ago

Victory Process supports mesh generation for device simulation using many common algorithms. The primary two are conformal and delaunay. A simple process simulation followed by an export will result in

12 years ago

2015년 3월 29일 | 2:00am-2:30am (한국 시각) 업계 표준 HiSIM_HV 2 모델을 사용하여, 고전압 소자를 위한 모델 파라미터 추출에 대해 소개합니다.

12 years ago

2015년 2월 18일 | 3:00am-3:30am (한국 시각) 이번 시간에 우주 또는 다른 높은 에너지 입자나 광원 근처의 방사선 환경에 노출되었을 때, 산화물 충전 및 물리적 손상 등, 전자 소자의 동작

12 years ago

The photovoltaics (PV) market represents the fastest growing renewable energy technology, with a 35% annual growth rate, which is projected to be worth $150B by 2018.[1] The global cumulative installed

12 years ago

VWF allows a curve as target for optimization. This feature greatly benefits the users who need to calibrate TCAD simulation against measured curve such as SIMS. VWF offers multiple ways

12 years ago

This document is a short guide on the new and existing support for export cropping/slicing in Victory Process cell mode. The cropping operation is useful to extract a segment of

12 years ago

Background: Victory Process is packaged with a wide range of etch models. Victory Process also supports an “Open Modelling Interface” (OMI). The OMI enables users to develop their own models

12 years ago

Irradiation by energetic particles can degrade semiconductor device performance. The particles involved can be electrons, positrons, neutrons, protons, alpha particles, heavy ions, or high-energy photons. As they pass through a

12 years ago

A reversed biased PIN diode acts as a radiation event detector, sensing the occurrence of an ionizing radiation pulse, which is connected to a threshold detector, the resistor RThreshold, that