Daily Archives: 2019年3月21日
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March 21, 2019
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
8 years ago
Challenges and Solutions of Nanometer Library Characterization
Graham Bell sits down with Bernardo Culau, Director of Characterization, to discuss the challenges and Solutions of Nanometer Library Characterization. They also discuss the webinar on the same topic. You
8 years ago
Nanometer Library Characterization: Challenges and Solutions
Nanometer Library Characterization: Challenges and Solutions Designers today see a significant increase in the number of simulations and PVT corners required to an accurate library characterization, including new formats to