Yearly Archives: 2017
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2017
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
9 years ago
iPDK integration into Gateway Schematic Capture
iPDK integration into Gateway Schematic Capture This webinar will provide a discussion of the integration of iPDK design kits into the Gateway tool flow. iPDKs are fast becoming the prefered
9 years ago
TCAD Simulation of Ion Transport and Electrochemistry
TCAD Simulation of Ion Transport and Electrochemistry This webinar will discuss the simulation of ion transport and electrochemistry in semiconductor devices. These phenomena are of interest both in cases where
9 years ago
W-element Field Solvers
In connection with the reduction in the size of electronic elements and the increase in operating frequencies, it becomes necessary to transmit signals between the nodes of the circuit using
9 years ago
SmartSpice Shared Mode API
SmartSpice API, shared mode, was developed in order to provide an easy to use solution for products requiring the analog SPICE core engine as an integral part of their functionality.
9 years ago
Temperature Properties of Amorphous In-Ga-Zn-O Thin-Film Transistors with a new Mobility Model
Amorphous In-Ga-Zn-O (a-IGZO), which is a typical amorphous oxide conductor (AOS), is considered to be one of the most promising channel materials of thin-film transistors (TFTs) for new flat-panel displays
9 years ago
Automated Stress Simulation Interface Between Victory Process and Device
Victory Process now includes the Victory Stress library directly within the process simulator, which removes the necessity to keep switching from process to stress simulators when invoking stress simulations at
9 years ago
TCAD Simulation of GaN-based Vertical FETs (HEMTs)
Gallium nitride (GaN)-based devices have entered the power electronics market and are showing excellent progress in the medium power conversion application [1]-[5]. For high-power conversion application, devices with vertical geometry
9 years ago
Getting to Know the New MIPI Alliance I3C Standard
Getting to Know the New MIPI Alliance I3CSM Standard Mobile devices today contain a rich assortment of sensors that need to communicate their information as quickly as possible at the
9 years ago
Calculating Failures In Time Rates for FinFET Circuits Using TCAD
In a previous article in Simulation Standard article entitled “Soft Error Simulations”, we discussed various ways to simulate soft errors using either TCAD, SPICE or a mixture of both. In
9 years ago
Optical Simulation of Liquid Crystals in the In-plane Switching Mode
Liquid Crystals (LCs) are widely used in the display technology due to the property of optical birefringence. Being sandwiched by two crossed polarizers, an LC medium will work as a