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Simulation Standard
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
24 years ago
Advanced Features in Expert Layout Editing Tool: Parameterized Cells
Silvaco Expert is an extremely powerful layout-editing tool that supports features related to parameterized cells. Parameterized cells, often called P-cells, increase designer productivity by adding enormous flexibility and efficiency to
24 years ago
Expert Wiring Tool: Router at Hand
Modern complex circuit designs require automatic router functionality in circuit layout editors. In multi-layer hierarchical design, it is often necessary to build a single wire between two objects or arbitrary
24 years ago
C++ Language Interface for Expert Layout Editor
The C++ interface for Silvaco’s Expert layout tool, is now an exclusive customization language that expands the tool’s handling of high-level customization, such as a design application working with Expert’s
24 years ago
Running a DRC Check on a Design with Round Curves
After I create my round curve and run a DRC check on my design, it comes up with hundreds of errors associated with curves. For example, I have the layer
24 years ago
Simulating Boron Diffusion in Silicon Germanium
The silicon germanium heterojunction bipolar transistor (SiGe HBT) is a promising technology for combining the operating speed of compound material devices with the production capability of bulk silicon. The presence
24 years ago
Simulating 3D Ohmic Heating Effects in Metal
A new feature has been added to Silvaco's device simulator ATLAS, which allows the simulation of ohmic heating effects in metals using the Giga or Giga3D modules. The feature has
24 years ago
The Valdinoci Temperature Dependent Impact Ionization Model for Silicon
Impact ionization plays an important role in the design of many semiconductor devices. Since impact ionization is both temperature and electric field dependent, it is important to use a model
24 years ago
Reproducing Basic Experiments in ATLAS to Study the Transient Decay of Carriers
ATLAS may be used to study these effects. A standard experiment for studying recombination in silicon is the transient decay of photoexcited carriers - known as the Stephenson-Keyes method for
24 years ago
BSIM3SOI Version 3.0 Model Released in SmartSpice
BSIM3SOI version 3.0 model was released on May 2002 by UC Berkeley. This model includes both Partially and Fully depleted models. This model is now implemented in SmartSpice and can
24 years ago
A New Surface-Potentials Based MOSFET Model: HiSIM
HiSIM is based on a charge-sheet model. IDS current is described using only one equation, and there-fore is continuous over the whole range of operating regions. This improves MOSFETs modeling