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Simulation Standard
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
23 years ago
IBIS Models in SmartSpice
The Input/Output Buffer Information Specification (IBIS) is a standard for electronic behavioral models based on I/V and V/T curve data. It is being developed by the IBIS Open Forum, which
23 years ago
New Features in SmartSpice 2.3.4.C
A powerful new feature “Stop-Continue” has been added to SmartSpice to allow the user to suspend a transient simulation and investigate the output before resuming the simulation run from the
23 years ago
Spectre® Replacement in the Cadence Flow
Silvaco has always supported the Solaris based Cadence design environment for seemless SmartSpice integration. To accommodate new customer demands to support the new Linux environment, Silvaco has developed a SmartSpice
23 years ago
New Functionality – BUS notation in SmartSpice
A new notation has been introduced into SmartSpice to allow a compact expression of a multiple bit wire buss to be used. From this expression the user can simply state
23 years ago
Role of Netlist Extraction in Process Design Kits
Netlist extraction and the quality of netlist extraction is becoming of increasing concern for integrated circuit design flow. As circuits become more complicated with concomitant reductions in geometry, the design
23 years ago
Parasitic Resistor Extraction with HIPEX-R
HIPEX-R is part of HIPEX software package for physical verification of multimillion transistor designs. It is a hierarchical full chip parasitic resistance extraction tool.
23 years ago
HIPEX-Net: New SILVACO Full-Chip LPE Tool vs. Maverick
SILVACO is releasing its new layout parameter extractor: HIPEX-NET. The new tool will replace Silvaco’s Maverick, which is a part of Guardian LVS/ERC. While being fully compliant with Maverick, HIPEX-NET
23 years ago
Measurement of Spacing Checks in Guardian DRC
In previous versions of Guardian DRC there were only two ways of measuring the distance between two segments: the ordinary, Euclidean metric, and the square metric, which behaves differently when
23 years ago
Highlighting Two Nodes in the Expert Layout Editor and Other Tips
Q: I would like to highlight two nodes at the same time in Expert. I currently use Verification->Node Probing->Pick Node to highlight a node, but I donít see how I
23 years ago
The Effect of Carrier Spilling on Spreading Resistance Profiling (SRP) Accuracy
Spreading Resistance Profiling (SRP) retains its popularity in the semiconductor industry by an inexpensive means of capturing dopant profile information. However, device engineers often incorporate SRP data into process simulation