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Analog Custom Design

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.

TCAD-based Model Extraction Flow for GaN HEMT Devices – Part 1

TCAD-based Model Extraction Flow for GaN HEMT Devices This webinar will present a model parameter extraction methodology for GaN HEMT devices. This will include a review of the current SPICE

Standard Cell Layout Migration and Optimization

Standard Cell Layout Migration and Optimization This webinar will present an efficient methodology for migrating and optimizing standard cell libraries. Foundation IP reuse through migration between non-disruptive technology nodes can

8 years ago

Exploration and Comparison of Various Parasitic Solutions and Parasitic-centric Calculations

Exploration and comparison of various parasitic solutions and parasitic-centric calculations This webinar will provide an overview on methods and tools to review parasitic extractor results and to perform a number

9 years ago

Standard Cell Statistical Characterization with VarMan

Standard Cell Statistical Characterization with VarMan With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining standard cell library performance. When

9 years ago

iPDK integration into Gateway Schematic Capture

iPDK integration into Gateway Schematic Capture This webinar will provide a discussion of the integration of iPDK design kits into the Gateway tool flow. iPDKs are fast becoming the prefered

9 years ago

Get a Head Start on Reliability Analysis Early in Your Design Cycle

Get a Head Start on Reliability Analysis Early in Your Design Cycle Power integrity issues must be addressed as early in the design cycle as possible to avoid expensive design

10 years ago

Secrets of Parasitic Extraction Unveiled

Secrets of Parasitic Extraction Unveiled! Parasitic extraction is a mandatory step for physical design sign off, and at advanced nodes, parasitics substantially impact the behavior of circuit design. Any analysis

10 years ago

Statistical Analysis Flow for Analog Design with VarMan

Statistical Analysis Flow for Analog Design with VarMan The impact of variation on analog design has become critical with the advanced nodes technology. The regular Monte Carlo approach for statistical

10 years ago

Power Distribution Network Analysis for Layout Engineers

Power Distribution Network Analysis for Layout Engineers This webinar will provide an overview of Silvaco’s new reliability analysis tool InVar Prime. InVar Prime is an addition to the family of

11 years ago

Variation aware design for advanced nodes and low power technologies

Variation aware design for advanced nodes and low power technologies Designers’ characterization and verification tasks have become more critical due to scaled down process technologies such as FinFET or FDSOI,