Learn About Advanced TFT-Based Flat Panel Design with SmartSpice

March 23, 2023 In this webinar, we will present the benefits of adopting SmartSpice’s unique 4-terminal TFT compact model, and we describe how SmartSpice Flex Modeling technology can be used to simulate image retention issues.

Learn About the Latest Advances in Device Modeling Using Silvaco Utmost IV

January 26, 2023 In this webinar, we will introduce the Corner and Retargeting Module, the most recent addition to our modeling software platform, and review some of the newest models and technologies where Silvaco’s Utmost IV is a key contributor.

Learn How Silvaco Flow Helps Designing and Simulating Pixel Arrays in Flat Panel Displays and Detectors

June 30, 2022 In this webinar, we highlight how leading display and detector companies exploit the capabilities of Silvaco tools for schematic and layout editing, very accurate field solver-based parasitic extraction required by modern TFT technology, back-annotation of parasitic RC elements into the netlist, and fast and accurate SPICE simulations of large arrays of pixels.

How to Eliminate Image Retention Issues with SmartSpice Flex Modeling

June 9, 2022 In this webinar, we will introduce a solution to the long-standing issue in the display community of Image Retention and how to simulate this effect at the SPICE level.

Learn How to Improve TFT-Based Flat Panel Designs with the Unique SmartSpice 4-Terminal TFT Model

April, 28, 2022 (PDT) In this webinar, we will describe SmartSpice’s 4-terminal TFT compact model. Unique in the market, we present some of the characteristics of this compact model, and some of the degrees of freedom that it brings to both the modeling and the design teams.

How to Optimize and Boost Your Device Modeling and Characterization with Utmost IV

March 10, 2022 | 10:00 am – 10:30 am (PST) In this webinar we will examine some of the key features and advantages of Utmost IV for device modeling and characterization, and the major design flows where Utmost IV is a key component.