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October 2026

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PG-Fig6-13.in : Orientation dependence of trench oxidation

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PG-Fig6-14.in : Doping Dependent Oxidation Example

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PG-Fig6-15.in : Oxidation Example showing OED

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PG-Fig6-19.in : LOCOS structure with and without stress effects

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PG-Fig6-20.in : Fig6-20 Isolation Structures for the 256Mb Dram

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PG-Fig7-18.in : Effect of electric field on diffusion

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PG-Fig7-19.in : Test different concentration models

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PG-Fig7-20.in : Boron segregation during LOCOS oxidation

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PG-Fig7-21.in : Segregation for different dopants during oxide growth

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PG-Fig7-23.in : Dose Loss

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