Casey Molver

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster. 

7 years ago

The market for cellular components has been shifting rapidly from GaAs pHEMT or silicon-on-sapphire (SOS) to silicon-based technology. CMOS (silicon-on-insulator) SOI antenna switches which are compatible with multimode GSM/EDGE, TD/WCDMA,

7 years ago

It is crucial for any kind of calculations that units are consistent between equations and modeling modules. Often different units are used in various experimental and theoretical fields. Therefore, we

7 years ago

March 12th 2020 | 10:00 am - 11:00 am (PDT) This webinar will present a new capability available in UTMOST IV: the Quick-Start Optimization Templates. This is a feature that

7 years ago

Victory Mesh initially supported loading and remeshing of the saved status from Victory Process. Victory Mesh 1.5.0 onwards is now able to load and remesh individual structure files (.str files),

The full text for most of these papers may be found at the IEEE website at www.ieee.org. P. Blaise,1,2 “Ab Initio Simulation of Advanced Materials and Devices: Current Challenges“, 1Silvaco

The full text for most of these papers may be found at the IEEE website at www.ieee.org. Samy Almosni,[a,b] Ludmila Cojocaru,[a] Debin Li,[c] Satoshi Uchida,* [d] Takaya Kubo,[a] Hiroshi Segawa[a],[e],

The full text for most of these papers may be found at the IEEE website at www.ieee.org. Yonghyun Shim, Member, IEEE, Jean-Pierre Raskin, Member, IEEE, César Roda Neve, Member, IEEE,

The full text for most of these papers may be found at the IEEE website at www.ieee.org. Daewoong Kang, Hyungcheol Shin, “Improving the cell characteristics using arch-active profile in NAND

The full text for most of these papers may be found at the IEEE website at www.ieee.org. H. Matsuura, S. Sakurai, Y. Oda, S. Fukushima, S. Ishikawa, A. Takeshita, and

The full text for most of these papers may be found at the IEEE website at www.ieee.org. Takashi Kameshima, Shun Ono, Togo Kudo, Kyosuke Ozaki, Yoichi Kirihara, Kazuo Kobayashi, Yuichi

The full text for most of these papers may be found at the IEEE website at www.ieee.org. Viviana Cerantonio, Marcello Giuffrida, Cristina Miccoli, Alessandro Chini, Ferdinando Iucolano “From TCAD simulations

The full text for most of these papers may be found at the IEEE website at www.ieee.org. Guido Notermans, Olivier Quittard, Anco Heringa, Željko Mrčarica, Fabrice Blanc, Hans van Zwol,