Casey Molver

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster. 

28 years ago

The latest Berkeley BSIM3v3.2 model of June 16 1998 has been integrated into SmartSpice 1.5.5. The Silvaco implementation of the Berkeley BSIM3v3.2 model can be invoked by specifying the model

28 years ago

Silvaco now offers the EKV (ENZ, KRUMMENACHER, VITTOZ) MOSFET model version 2.6 originally developed in EPFL ("Ecole Polytechnique Federale de Lausanne" - Switzerland), as part of the SmartLib product-independent model

28 years ago

The latest Berkeley BSIM3v3.2 model of June 16 1998 is now available in the SmartSpice 1.5.5 release. Two BSIM3v3.2 implementations are supported in SmartSpice and UTMOST III.

28 years ago

Q: Can I draw tangents to circles in EXPERT? A: Expert supports several options for drawing sophisticated shapes. There are three ways to accomplish this task.

28 years ago

Placement and routing problems for integrated circuits are inherently interrelated and extremely complex from the algorithmic point of view. This complexity grows exponentially as the scale of integration increases.

28 years ago

Maverick is a modern hierarchical netlist extractor, providing extraordinary efficiency as well as comprehensive features and ease of use. It runs on PC under Microsoft Windows NT providing unique productivity

28 years ago

How can anti-reflective coatings be modeled when simulating photodetectors in ATLAS/Luminous? How can detection efficiency be plotted?

28 years ago

This article focuses on the effects of process and modeling parameters on device electrical characteristics and uses the threshold voltage versus gate length of a n-MOSFET as an illustration.

28 years ago

Mixed-signal systems-on-a-chip (SOC) integration of digital, analog, RF, and power components is emerging to meet demands for low-power, highly integrated systems in portable computing, wireless communications, and multimedia.

28 years ago

FastBlaze is a fast physical device simulator for MESFETs and HEMTs optimized to provide interactive TCAD for modern III-V FET devices. It incorporates device-specific techniques to allow 1000x to 10000x

29 years ago

Q. What is the typical method of measuring flicker noise using S3245A Noise Amplifier?

29 years ago

The importance of the MOS device SPICE model validation and the introduction of the validation routine in UTMOST III was presented in Simulation Standard article issued on September 1996. The