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May 2007

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.

19 years ago

Electrical Stress Degradation of Small-Grain Polysilicon Thin-Film Transistors

Abstract This paper is focused on the stability of n-channel laser-crystallized polysilicon thin-film transistors (TFTs) submitted to a hydrogenation process during the fabrication and with small grains dimension. With the

19 years ago

Trapping Effects in the Transient Response of AlGaN/GaN HEMT Devices

In this paper, the transient analysis of an AlGaN/GaN high-electron mobility transistor (HEMT) device is presented. Drain–current dispersion effects are investigated when gate or drain voltages are pulsed. Gate-lag and

19 years ago

New Feature of Quantum Module: Schrödinger-Poisson Solver for Nanowire Application

Introduction The trend toward ultra-short gate length MOSFET requires a more and more effective control of the channel by the gate leading to new architecture like double-gate, tri-gate, omega-gate, and