Yearly Archives: 2020
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2020
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
7 years ago
Hints and Tips: Specify Units in the Victory Process Material Statement
It is crucial for any kind of calculations that units are consistent between equations and modeling modules. Often different units are used in various experimental and theoretical fields. Therefore, we
7 years ago
Utmost IV Quick-Start 모델 최적화 템플릿
2020년 3월 13일 | 2:00am-2:30am (한국 시각) UTMOST IV: Quick-Start Optimization Templates에서 사용할 수 있는 새로운 기능을 소개합니다. 이 기능은 사용자가 데이터를 기반으로 특정 모델에 대한 최적화 프로젝트를 신속하게 생성할
7 years ago
Hints and Tips: How do I Load, Remesh, and Refine an Existing Device Structure in Victory Mesh?
Victory Mesh initially supported loading and remeshing of the saved status from Victory Process. Victory Mesh 1.5.0 onwards is now able to load and remesh individual structure files (.str files),
7 years ago
Nanoscale Devices
Nanoscale Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. P. Blaise,1,2 “Ab Initio Simulation of Advanced Materials and Devices: Current
7 years ago
Solar Cells
Solar Cells The full text for most of these papers may be found at the IEEE website at www.ieee.org. Samy Almosni,[a,b] Ludmila Cojocaru,[a] Debin Li,[c] Satoshi Uchida,* [d] Takaya Kubo,[a]
7 years ago
MEMS
MEMS The full text for most of these papers may be found at the IEEE website at www.ieee.org. Yonghyun Shim, Member, IEEE, Jean-Pierre Raskin, Member, IEEE, César Roda Neve, Member,
7 years ago
Memory Devices
Memory Devices The full text for most of these papers may be found at the IEEE website at www.ieee.org. Daewoong Kang, Hyungcheol Shin, “Improving the cell characteristics using arch-active profile
7 years ago
Optoelectronics
Optoelectronics The full text for most of these papers may be found at the IEEE website at www.ieee.org. H. Matsuura, S. Sakurai, Y. Oda, S. Fukushima, S. Ishikawa, A. Takeshita,
Radiation, SEU and Reliability
Radiation, SEU and Reliability The full text for most of these papers may be found at the IEEE website at www.ieee.org. Takashi Kameshima, Shun Ono, Togo Kudo, Kyosuke Ozaki, Yoichi
7 years ago
Power Device Simulation
Power Device Simulation The full text for most of these papers may be found at the IEEE website at www.ieee.org. Viviana Cerantonio, Marcello Giuffrida, Cristina Miccoli, Alessandro Chini, Ferdinando Iucolano