March 3, 1998

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.

29 years ago

Scanbox Approach to Shape Reconstruction for Automated Reticle Inspection

The paper describes a generalization of the scanline approach [1] to reconstruction of the shape of planar object represented by a discrete point set with a given distance threshold d.

29 years ago

Savage Enhanced with Recognition and Reporting of Hierarchical Structure of Errors

This article describes a method of reporting DRC errors implemented in Savage, applicable to multi-million transistor layouts. The method of hierarchical information inheritance is a perspective approach in an extension