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2003

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.

23 years ago

Spectre® Replacement in the Cadence Flow

Silvaco has always supported the Solaris based Cadence design environment for seemless SmartSpice integration. To accommodate new customer demands to support the new Linux environment, Silvaco has developed a SmartSpice

23 years ago

New Functionality – BUS notation in SmartSpice

A new notation has been introduced into SmartSpice to allow a compact expression of a multiple bit wire buss to be used. From this expression the user can simply state

23 years ago

Role of Netlist Extraction in Process Design Kits

Netlist extraction and the quality of netlist extraction is becoming of increasing concern for integrated circuit design flow. As circuits become more complicated with concomitant reductions in geometry, the design

23 years ago

Parasitic Resistor Extraction with HIPEX-R

HIPEX-R is part of HIPEX software package for physical verification of multimillion transistor designs. It is a hierarchical full chip parasitic resistance extraction tool.

23 years ago

HIPEX-Net: New SILVACO Full-Chip LPE Tool vs. Maverick

SILVACO is releasing its new layout parameter extractor: HIPEX-NET. The new tool will replace Silvaco’s Maverick, which is a part of Guardian LVS/ERC. While being fully compliant with Maverick, HIPEX-NET

23 years ago

Measurement of Spacing Checks in Guardian DRC

In previous versions of Guardian DRC there were only two ways of measuring the distance between two segments: the ordinary, Euclidean metric, and the square metric, which behaves differently when

23 years ago

Highlighting Two Nodes in the Expert Layout Editor and Other Tips

Q: I would like to highlight two nodes at the same time in Expert. I currently use Verification->Node Probing->Pick Node to highlight a node, but I donít see how I

23 years ago

The Effect of Carrier Spilling on Spreading Resistance Profiling (SRP) Accuracy

Spreading Resistance Profiling (SRP) retains its popularity in the semiconductor industry by an inexpensive means of capturing dopant profile information. However, device engineers often incorporate SRP data into process simulation

23 years ago

Eye Diagram for a Direct Modulated Semiconductor Laser in ATLAS

An eye diagram is a convenient way to visualise how the waveforms used to send multiple bits of data can potentially lead to errors in the interpretation of those bits.

23 years ago

Analysis of Light Power Dependence on the Leakage Current in a Buried Hetero- Structure p-InP Semiconductor Laser

An effective device structure for reducing leakage current in BH laser diodes with semiin-sulation doped Fe in InP blocking layers has been analyzed [3]. In this study, the leakage current