Monthly Archives: April 2017
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April 2017
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
9 years ago
Get a Head Start on Reliability Analysis Early in Your Design Cycle
Get a Head Start on Reliability Analysis Early in Your Design Cycle Power integrity issues must be addressed as early in the design cycle as possible to avoid expensive design
10 years ago
Model Extraction for Body-Biased XDMOS Devices
Compared with regular MOSFET devices, the body bias effect in HVMOS is usually more pronounced. In addition to the regular threshold voltage increase with body bias, the LDD region of
10 years ago
Edge Effect Analysis on TFT Devices Using 3D Numerical Simulation
3D TFT analysis has been getting lots of attention due to issues caused by 3D effects such as the edge effect on the TFT characteristics. The presence of an enhanced
10 years ago
3D Simulation of Dual-Gate Thin Film Transistors
Dual-Gate Thin Film Transistors (DGTFTs) are often used in pixel driver and peripheral circuits for liquid crystal displays. This is because of the reduction of the gate-off state leakage current
10 years ago
Effect of Fin Thickness on Subthreshold Characteristics of 10 nm FinFETs Using 3D TCAD
The planar bulk Si metal-oxide semiconductor field-effect transistor (MOSFET) has reached its scaling limit due to various short channel effects (SCE). With 20 nm advanced planar technology, the source and