Daily Archives: 2015年2月17日

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February 17, 2015

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.

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12 years ago

Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD

Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD This webinar will provide specific approaches for simulating electronic device behavioral changes, including oxide charging and physical damage, during