Casey Molver

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster. 

11 years ago

The Victory Process conformal export is generated from the volume planes specified in a user deck. The accuracy and resolution of the export is currently controlled by these planes. Local

11 years ago

ICとシステムの3Dインテグレーションは、「More than Moore」テクノロジーとアプリケーションのコストスケーリングを向上しますが、異種システムとICの3Dインテグレーションは今後の設計に大きな課題を投げかけます。

12 years ago

Device simulation helps users understand and depict the physical processes in a device and to make reliable predictions of the behavior of the next device generation. Device simulations with properly

12 years ago

Among the many design criteria for solar cells, the design of the top metal contact impacts the cell efficiency. The areal density of the top contact modifies the magnitude of

12 years ago

There is a constant demand to lower the on-state resistance of devices, improving their energy efficiency as well as increasing their current handling capabilities whilst maintaining the desired breakdown voltage.

12 years ago

Victory Process supports mesh generation for device simulation using many common algorithms. The primary two are conformal and delaunay. A simple process simulation followed by an export will result in

12 years ago

このウェビナーでは、高耐圧デバイス用SPICEモデルの業界標準であるHiSIM_HV 2のモデル・パラメータ抽出を取り上げます。

12 years ago

The photovoltaics (PV) market represents the fastest growing renewable energy technology, with a 35% annual growth rate, which is projected to be worth $150B by 2018.[1] The global cumulative installed

12 years ago

VWF allows a curve as target for optimization. This feature greatly benefits the users who need to calibrate TCAD simulation against measured curve such as SIMS. VWF offers multiple ways

12 years ago

This document is a short guide on the new and existing support for export cropping/slicing in Victory Process cell mode. The cropping operation is useful to extract a segment of

12 years ago

Background: Victory Process is packaged with a wide range of etch models. Victory Process also supports an “Open Modelling Interface” (OMI). The OMI enables users to develop their own models

12 years ago

Irradiation by energetic particles can degrade semiconductor device performance. The particles involved can be electrons, positrons, neutrons, protons, alpha particles, heavy ions, or high-energy photons. As they pass through a