11 years ago
The Victory Process conformal export is generated from the volume planes specified in a user deck. The accuracy and resolution of the export is currently controlled by these planes. Local
11 years ago
ICとシステムの3Dインテグレーションは、「More than Moore」テクノロジーとアプリケーションのコストスケーリングを向上しますが、異種システムとICの3Dインテグレーションは今後の設計に大きな課題を投げかけます。
12 years ago
Device simulation helps users understand and depict the physical processes in a device and to make reliable predictions of the behavior of the next device generation. Device simulations with properly
12 years ago
Among the many design criteria for solar cells, the design of the top metal contact impacts the cell efficiency. The areal density of the top contact modifies the magnitude of
12 years ago
There is a constant demand to lower the on-state resistance of devices, improving their energy efficiency as well as increasing their current handling capabilities whilst maintaining the desired breakdown voltage.
12 years ago
Victory Process supports mesh generation for device simulation using many common algorithms. The primary two are conformal and delaunay. A simple process simulation followed by an export will result in
12 years ago
このウェビナーでは、高耐圧デバイス用SPICEモデルの業界標準であるHiSIM_HV 2のモデル・パラメータ抽出を取り上げます。
12 years ago
The photovoltaics (PV) market represents the fastest growing renewable energy technology, with a 35% annual growth rate, which is projected to be worth $150B by 2018.[1] The global cumulative installed
12 years ago
VWF allows a curve as target for optimization. This feature greatly benefits the users who need to calibrate TCAD simulation against measured curve such as SIMS. VWF offers multiple ways
12 years ago
This document is a short guide on the new and existing support for export cropping/slicing in Victory Process cell mode. The cropping operation is useful to extract a segment of
12 years ago
Background: Victory Process is packaged with a wide range of etch models. Victory Process also supports an “Open Modelling Interface” (OMI). The OMI enables users to develop their own models
12 years ago
Irradiation by energetic particles can degrade semiconductor device performance. The particles involved can be electrons, positrons, neutrons, protons, alpha particles, heavy ions, or high-energy photons. As they pass through a