February 2, 1999

Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster. 

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28 years ago

Mixed Circuit Device Simulation of Single Event Upset in a Memory Cell

This article presents Single Event Upset (SEU) simulation of a SRAM cell using MixedMode3D. MixedMode3D provides the capability to simultaneously perform circuit simulation coupled with three-dimensional device simulation. This allows