Daily Archives: 2005年2月1日
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February 1, 2005
Know how your circuit behaves across process variation before silicon tells you, with Monte Carlo-accurate results up to 30X faster.
22 years ago
Can Athena get the STRESS in Compound Advanced material?
Q: Can ATHENA get the STRESS in Compound Advanced material? A: The ATHENA STRESS command has been augmented to allow the 2 Dimensional stress distribution. To get the STRESS, the
22 years ago
Simulating Selective and Non-Selective Epitaxy Over Oxide Isolated Regions Using Athena
In certain cases, most notably in modern bipolar and SiGe HBT structures, epitaxial steps are performed after the oxide isolation structures have been already created. Thus the initial surface prior
22 years ago
Process and Device Simulation of Field Emission Microtrides
One of the most beneficial merits of computer-based experiment using TCAD lies in its capability of a total simulation of the target device. One can consider its novel fabrication process
22 years ago
Pending Issues in the Modeling of Concentrator Solar Cells
The modelling of concentrator solar cells for real conditions of operation inside optical concentrators is a subject almost untreated. Consequently, this work highlights the main specific situations that should be