Requires: Utmost IV
Minimum Versions: Utmost IV 1.10.6.R
This example describes how to use a script to add a function to some datasets which have previously been generated.
The already measured data is contained in the script_ex01_in.uds file. When this data was measured, someone forgot to add the function to calculate the mosfet transistor transconductance to the idvg characteristic. Using a script, it is possible to correct this mistake. The Utmost IV script is shown here script_ex01.sjs.
The script file and the input data file must be saved into the directory from which you run the following command.
utmost4 -s script_ex01.sjs
When the script runs, the datasets will be read in from the input data file, then the new function will be added to each of the datasets. Finally, the datasets with the new function added will be written out to the output data file script_ex01_out.uds.
script_ex01_in.uds — view contents
Utmost IV CSV Data Logfile
Format Version 1
Copyright (c) 1984-2016 Silvaco, Inc. All rights reserved
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p2
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 2e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
6.579e-08 5.5956e-07 4.05282e-06 2.21062e-05 7.12745e-05
0.000142457 0.000219111 0.000295254 0.00036978 0.000442656
0.000513974 0.000583797 0.000652163 0.000719103 0.000784645
0.000848817 0.000911648 0.000973168 0.00103341 0.00109239
0.00115016 0.00120673 0.00126214 0.00131641 0.00136956
0.00142164 0.00147266 0.00152265 0.00157162 0.00161962
0.00166665 0.00171274 0.00175792 0.0018022 0.0018456
0.00188815 0.00192987 0.00197076 0.00201086 0.00205018
0.00208874 0.00212654 0.00216362 0.00219999 0.00223566
0.00227064 0.00230496 0.00233862 0.00237164 0.00240404
0.00243582
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p3
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 3e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
7.28462e-09 7.14297e-08 6.1896e-07 4.44087e-06 2.18595e-05
5.95822e-05 0.000106638 0.000155006 0.000202597 0.000249101
0.000294534 0.000338934 0.000382329 0.000424741 0.000466191
0.0005067 0.000546291 0.000584985 0.000622805 0.000659774
0.000695913 0.000731245 0.00076579 0.000799569 0.000832603
0.000864911 0.000896511 0.000927423 0.000957663 0.00098725
0.0010162 0.00104453 0.00107225 0.00109939 0.00112595
0.00115195 0.0011774 0.00120232 0.00122672 0.00125061
0.00127401 0.00129692 0.00131936 0.00134135 0.00136288
0.00138397 0.00140463 0.00142488 0.00144471 0.00146414
0.00148319
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p4
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 4e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.41701e-09 1.51223e-08 1.4722e-07 1.21519e-06 7.73149e-06
2.85842e-05 6.07036e-05 9.57e-05 0.000130551 0.000164665
0.000197983 0.000230524 0.000262307 0.000293348 0.000323664
0.00035327 0.000382182 0.000410419 0.000437997 0.000464935
0.000491249 0.000516956 0.000542073 0.000566616 0.0005906
0.000614041 0.000636953 0.000659351 0.000681249 0.000702659
0.000723596 0.00074407 0.000764095 0.000783682 0.000802843
0.000821588 0.000839928 0.000857874 0.000875435 0.000892621
0.000909441 0.000925905 0.000942021 0.000957798 0.000973244
0.000988367 0.00100318 0.00101768 0.00103187 0.00104578
0.0010594
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p5
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 5e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
4.42307e-10 4.96559e-09 5.19488e-08 4.68374e-07 3.39868e-06
1.56594e-05 3.88916e-05 6.60058e-05 9.34278e-05 0.000120345
0.000146642 0.00017232 0.000197392 0.000221871 0.000245769
0.000269099 0.000291873 0.000314106 0.000335811 0.000357004
0.000377698 0.000397907 0.000417645 0.000436923 0.000455756
0.000474156 0.000492134 0.000509702 0.000526871 0.000543653
0.000560057 0.000576094 0.000591773 0.000607105 0.000622098
0.000636761 0.000651103 0.000665132 0.000678856 0.000692283
0.00070542 0.000718275 0.000730855 0.000743167 0.000755217
0.000767012 0.000778558 0.00078986 0.000800926 0.00081176
0.000822368
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p6
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 6e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.93162e-10 2.2388e-09 2.44938e-08 2.34203e-07 1.82941e-06
9.70117e-06 2.73224e-05 4.929e-05 7.18558e-05 9.40744e-05
0.00011579 0.000136994 0.000157695 0.000177902 0.000197625
0.000216874 0.00023566 0.000253995 0.000271891 0.000289359
0.000306412 0.000323062 0.000339318 0.000355193 0.000370698
0.000385842 0.000400635 0.000415088 0.00042921 0.000443009
0.000456496 0.000469677 0.000482563 0.000495159 0.000507475
0.000519518 0.000531294 0.000542811 0.000554076 0.000565094
0.000575873 0.000586419 0.000596736 0.000606832 0.000616712
0.00062638 0.000635843 0.000645105 0.000654171 0.000663047
0.000671735
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p7
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 7e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.06232e-10 1.25725e-09 1.41553e-08 1.40772e-07 1.15112e-06
6.6655e-06 2.06174e-05 3.90095e-05 5.81637e-05 7.7076e-05
9.55689e-05 0.000113626 0.000131253 0.000148457 0.000165246
0.000181629 0.000197615 0.000213215 0.000228439 0.000243296
0.000257798 0.000271953 0.000285773 0.000299266 0.000312441
0.000325308 0.000337876 0.000350152 0.000362144 0.000373862
0.000385311 0.000396501 0.000407437 0.000418126 0.000428576
0.000438792 0.000448781 0.000458549 0.000468102 0.000477445
0.000486583 0.000495522 0.000504267 0.000512823 0.000521194
0.000529386 0.000537402 0.000545248 0.000552926 0.000560442
0.000567799
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p8
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 8e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
6.83998e-11 8.21015e-10 9.42072e-09 9.62027e-08 8.10806e-07
4.96569e-06 1.64312e-05 3.2225e-05 4.88582e-05 6.53193e-05
8.14219e-05 9.71451e-05 0.000112493 0.00012747 0.000142085
0.000156345 0.000170258 0.000183832 0.000197078 0.000210003
0.000222617 0.000234928 0.000246945 0.000258677 0.000270132
0.000281317 0.00029224 0.000302908 0.000313329 0.00032351
0.000333457 0.000343177 0.000352675 0.000361959 0.000371033
0.000379904 0.000388576 0.000397056 0.000405347 0.000413456
0.000421387 0.000429143 0.000436731 0.000444154 0.000451416
0.000458522 0.000465475 0.000472279 0.000478938 0.000485455
0.000491834
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p9
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 9e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
4.90939e-11 5.95055e-10 6.91637e-09 7.19193e-08 6.18757e-07
3.93135e-06 1.36469e-05 2.74827e-05 4.21806e-05 5.67529e-05
7.10123e-05 8.49358e-05 9.85258e-05 0.000111787 0.000124727
0.00013735 0.000149665 0.00016168 0.000173401 0.000184839
0.000195999 0.000206891 0.000217522 0.000227899 0.00023803
0.000247921 0.00025758 0.000267013 0.000276226 0.000285226
0.000294019 0.000302609 0.000311004 0.000319208 0.000327226
0.000335064 0.000342726 0.000350217 0.000357541 0.000364703
0.000371708 0.000378558 0.000385259 0.000391813 0.000398225
0.000404499 0.000410637 0.000416643 0.000422521 0.000428273
0.000433903
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x1
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 1e-06
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
3.80123e-11 4.6391e-10 5.44037e-09 5.72854e-08 4.99958e-07
3.25601e-06 1.16931e-05 2.40073e-05 3.71745e-05 5.02471e-05
6.30419e-05 7.55355e-05 8.77291e-05 9.96274e-05 0.000111235
0.000122559 0.000133606 0.000144381 0.000154894 0.00016515
0.000175157 0.000184923 0.000194454 0.000203756 0.000212837
0.000221703 0.000230359 0.000238813 0.000247069 0.000255133
0.000263011 0.000270708 0.000278228 0.000285577 0.000292759
0.000299779 0.000306641 0.000313349 0.000319908 0.000326321
0.000332593 0.000338726 0.000344725 0.000350592 0.000356332
0.000361947 0.000367441 0.000372817 0.000378077 0.000383224
0.000388262
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x10
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 1e-05
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
2.77411e-12 3.44715e-11 4.12678e-10 4.45637e-09 4.00312e-08
2.73955e-07 1.05208e-06 2.24001e-06 3.52398e-06 4.80124e-06
6.05133e-06 7.27133e-06 8.46122e-06 9.62141e-06 1.07524e-05
1.18549e-05 1.29294e-05 1.39768e-05 1.49979e-05 1.59933e-05
1.69638e-05 1.79101e-05 1.8833e-05 1.97331e-05 2.06112e-05
2.14679e-05 2.23038e-05 2.31195e-05 2.39157e-05 2.46928e-05
2.54514e-05 2.61922e-05 2.69155e-05 2.76219e-05 2.83118e-05
2.89858e-05 2.96441e-05 3.02874e-05 3.0916e-05 3.15302e-05
3.21306e-05 3.27173e-05 3.32909e-05 3.38517e-05 3.43999e-05
3.49359e-05 3.54601e-05 3.59727e-05 3.64741e-05 3.69645e-05
3.74441e-05
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x2
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 2e-06
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.32522e-11 1.64608e-10 1.97276e-09 2.13903e-08 1.93056e-07
1.32934e-06 5.17416e-06 1.11327e-05 1.76061e-05 2.40539e-05
3.03676e-05 3.65316e-05 4.25457e-05 4.84119e-05 5.41327e-05
5.97112e-05 6.51507e-05 7.04547e-05 7.5627e-05 8.06712e-05
8.5591e-05 9.039e-05 9.50717e-05 9.96396e-05 0.000104097
0.000108447 0.000112693 0.000116838 0.000120884 0.000124835
0.000128694 0.000132462 0.000136143 0.000139738 0.000143251
0.000146684 0.000150038 0.000153316 0.00015652 0.000159652
0.000162714 0.000165707 0.000168634 0.000171496 0.000174295
0.000177032 0.000179709 0.000182328 0.000184891 0.000187397
0.000189849
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x5
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 5e-06
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
5.44466e-12 6.76715e-11 8.10708e-10 8.7691e-09 7.89192e-08
5.41512e-07 2.09024e-06 4.46681e-06 7.0398e-06 9.60036e-06
1.21068e-05 1.45532e-05 1.69394e-05 1.92662e-05 2.15347e-05
2.37462e-05 2.5902e-05 2.80035e-05 3.00522e-05 3.20496e-05
3.39973e-05 3.58967e-05 3.77491e-05 3.95561e-05 4.13189e-05
4.30389e-05 4.47173e-05 4.63553e-05 4.79541e-05 4.95149e-05
5.10386e-05 5.25265e-05 5.39795e-05 5.53986e-05 5.67848e-05
5.81389e-05 5.94618e-05 6.07545e-05 6.20177e-05 6.32522e-05
6.44588e-05 6.56382e-05 6.67912e-05 6.79185e-05 6.90207e-05
7.00984e-05 7.11524e-05 7.21832e-05 7.31914e-05 7.41775e-05
7.51422e-05
DataSetFinishscript_ex01_out.uds — view contents
Utmost IV CSV Data Logfile
Format Version 1
Copyright (c) 1984-2016 Silvaco, Inc. All rights reserved
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p2
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 2e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
6.579e-08 5.5956e-07 4.05282e-06 2.21062e-05 7.12745e-05
0.000142457 0.000219111 0.000295254 0.00036978 0.000442656
0.000513974 0.000583797 0.000652163 0.000719103 0.000784645
0.000848817 0.000911648 0.000973168 0.00103341 0.00109239
0.00115016 0.00120673 0.00126214 0.00131641 0.00136956
0.00142164 0.00147266 0.00152265 0.00157162 0.00161962
0.00166665 0.00171274 0.00175792 0.0018022 0.0018456
0.00188815 0.00192987 0.00197076 0.00201086 0.00205018
0.00208874 0.00212654 0.00216362 0.00219999 0.00223566
0.00227064 0.00230496 0.00233862 0.00237164 0.00240404
0.00243582
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p3
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 3e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
7.28462e-09 7.14297e-08 6.1896e-07 4.44087e-06 2.18595e-05
5.95822e-05 0.000106638 0.000155006 0.000202597 0.000249101
0.000294534 0.000338934 0.000382329 0.000424741 0.000466191
0.0005067 0.000546291 0.000584985 0.000622805 0.000659774
0.000695913 0.000731245 0.00076579 0.000799569 0.000832603
0.000864911 0.000896511 0.000927423 0.000957663 0.00098725
0.0010162 0.00104453 0.00107225 0.00109939 0.00112595
0.00115195 0.0011774 0.00120232 0.00122672 0.00125061
0.00127401 0.00129692 0.00131936 0.00134135 0.00136288
0.00138397 0.00140463 0.00142488 0.00144471 0.00146414
0.00148319
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p4
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 4e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.41701e-09 1.51223e-08 1.4722e-07 1.21519e-06 7.73149e-06
2.85842e-05 6.07036e-05 9.57e-05 0.000130551 0.000164665
0.000197983 0.000230524 0.000262307 0.000293348 0.000323664
0.00035327 0.000382182 0.000410419 0.000437997 0.000464935
0.000491249 0.000516956 0.000542073 0.000566616 0.0005906
0.000614041 0.000636953 0.000659351 0.000681249 0.000702659
0.000723596 0.00074407 0.000764095 0.000783682 0.000802843
0.000821588 0.000839928 0.000857874 0.000875435 0.000892621
0.000909441 0.000925905 0.000942021 0.000957798 0.000973244
0.000988367 0.00100318 0.00101768 0.00103187 0.00104578
0.0010594
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p5
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 5e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
4.42307e-10 4.96559e-09 5.19488e-08 4.68374e-07 3.39868e-06
1.56594e-05 3.88916e-05 6.60058e-05 9.34278e-05 0.000120345
0.000146642 0.00017232 0.000197392 0.000221871 0.000245769
0.000269099 0.000291873 0.000314106 0.000335811 0.000357004
0.000377698 0.000397907 0.000417645 0.000436923 0.000455756
0.000474156 0.000492134 0.000509702 0.000526871 0.000543653
0.000560057 0.000576094 0.000591773 0.000607105 0.000622098
0.000636761 0.000651103 0.000665132 0.000678856 0.000692283
0.00070542 0.000718275 0.000730855 0.000743167 0.000755217
0.000767012 0.000778558 0.00078986 0.000800926 0.00081176
0.000822368
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p6
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 6e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.93162e-10 2.2388e-09 2.44938e-08 2.34203e-07 1.82941e-06
9.70117e-06 2.73224e-05 4.929e-05 7.18558e-05 9.40744e-05
0.00011579 0.000136994 0.000157695 0.000177902 0.000197625
0.000216874 0.00023566 0.000253995 0.000271891 0.000289359
0.000306412 0.000323062 0.000339318 0.000355193 0.000370698
0.000385842 0.000400635 0.000415088 0.00042921 0.000443009
0.000456496 0.000469677 0.000482563 0.000495159 0.000507475
0.000519518 0.000531294 0.000542811 0.000554076 0.000565094
0.000575873 0.000586419 0.000596736 0.000606832 0.000616712
0.00062638 0.000635843 0.000645105 0.000654171 0.000663047
0.000671735
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p7
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 7e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.06232e-10 1.25725e-09 1.41553e-08 1.40772e-07 1.15112e-06
6.6655e-06 2.06174e-05 3.90095e-05 5.81637e-05 7.7076e-05
9.55689e-05 0.000113626 0.000131253 0.000148457 0.000165246
0.000181629 0.000197615 0.000213215 0.000228439 0.000243296
0.000257798 0.000271953 0.000285773 0.000299266 0.000312441
0.000325308 0.000337876 0.000350152 0.000362144 0.000373862
0.000385311 0.000396501 0.000407437 0.000418126 0.000428576
0.000438792 0.000448781 0.000458549 0.000468102 0.000477445
0.000486583 0.000495522 0.000504267 0.000512823 0.000521194
0.000529386 0.000537402 0.000545248 0.000552926 0.000560442
0.000567799
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p8
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 8e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
6.83998e-11 8.21015e-10 9.42072e-09 9.62027e-08 8.10806e-07
4.96569e-06 1.64312e-05 3.2225e-05 4.88582e-05 6.53193e-05
8.14219e-05 9.71451e-05 0.000112493 0.00012747 0.000142085
0.000156345 0.000170258 0.000183832 0.000197078 0.000210003
0.000222617 0.000234928 0.000246945 0.000258677 0.000270132
0.000281317 0.00029224 0.000302908 0.000313329 0.00032351
0.000333457 0.000343177 0.000352675 0.000361959 0.000371033
0.000379904 0.000388576 0.000397056 0.000405347 0.000413456
0.000421387 0.000429143 0.000436731 0.000444154 0.000451416
0.000458522 0.000465475 0.000472279 0.000478938 0.000485455
0.000491834
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x0p9
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 9e-07
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
4.90939e-11 5.95055e-10 6.91637e-09 7.19193e-08 6.18757e-07
3.93135e-06 1.36469e-05 2.74827e-05 4.21806e-05 5.67529e-05
7.10123e-05 8.49358e-05 9.85258e-05 0.000111787 0.000124727
0.00013735 0.000149665 0.00016168 0.000173401 0.000184839
0.000195999 0.000206891 0.000217522 0.000227899 0.00023803
0.000247921 0.00025758 0.000267013 0.000276226 0.000285226
0.000294019 0.000302609 0.000311004 0.000319208 0.000327226
0.000335064 0.000342726 0.000350217 0.000357541 0.000364703
0.000371708 0.000378558 0.000385259 0.000391813 0.000398225
0.000404499 0.000410637 0.000416643 0.000422521 0.000428273
0.000433903
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x1
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 1e-06
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
3.80123e-11 4.6391e-10 5.44037e-09 5.72854e-08 4.99958e-07
3.25601e-06 1.16931e-05 2.40073e-05 3.71745e-05 5.02471e-05
6.30419e-05 7.55355e-05 8.77291e-05 9.96274e-05 0.000111235
0.000122559 0.000133606 0.000144381 0.000154894 0.00016515
0.000175157 0.000184923 0.000194454 0.000203756 0.000212837
0.000221703 0.000230359 0.000238813 0.000247069 0.000255133
0.000263011 0.000270708 0.000278228 0.000285577 0.000292759
0.000299779 0.000306641 0.000313349 0.000319908 0.000326321
0.000332593 0.000338726 0.000344725 0.000350592 0.000356332
0.000361947 0.000367441 0.000372817 0.000378077 0.000383224
0.000388262
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x10
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 1e-05
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
2.77411e-12 3.44715e-11 4.12678e-10 4.45637e-09 4.00312e-08
2.73955e-07 1.05208e-06 2.24001e-06 3.52398e-06 4.80124e-06
6.05133e-06 7.27133e-06 8.46122e-06 9.62141e-06 1.07524e-05
1.18549e-05 1.29294e-05 1.39768e-05 1.49979e-05 1.59933e-05
1.69638e-05 1.79101e-05 1.8833e-05 1.97331e-05 2.06112e-05
2.14679e-05 2.23038e-05 2.31195e-05 2.39157e-05 2.46928e-05
2.54514e-05 2.61922e-05 2.69155e-05 2.76219e-05 2.83118e-05
2.89858e-05 2.96441e-05 3.02874e-05 3.0916e-05 3.15302e-05
3.21306e-05 3.27173e-05 3.32909e-05 3.38517e-05 3.43999e-05
3.49359e-05 3.54601e-05 3.59727e-05 3.64741e-05 3.69645e-05
3.74441e-05
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x2
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 2e-06
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
1.32522e-11 1.64608e-10 1.97276e-09 2.13903e-08 1.93056e-07
1.32934e-06 5.17416e-06 1.11327e-05 1.76061e-05 2.40539e-05
3.03676e-05 3.65316e-05 4.25457e-05 4.84119e-05 5.41327e-05
5.97112e-05 6.51507e-05 7.04547e-05 7.5627e-05 8.06712e-05
8.5591e-05 9.039e-05 9.50717e-05 9.96396e-05 0.000104097
0.000108447 0.000112693 0.000116838 0.000120884 0.000124835
0.000128694 0.000132462 0.000136143 0.000139738 0.000143251
0.000146684 0.000150038 0.000153316 0.00015652 0.000159652
0.000162714 0.000165707 0.000168634 0.000171496 0.000174295
0.000177032 0.000179709 0.000182328 0.000184891 0.000187397
0.000189849
DataSetFinish
DataSetStart
DataSetName, idvglin
MeasurementType, DC
BatchName, script01_ex01
WaferName, wafer1
DieName, x0y0
DeviceName, n10x5
Temperature, 27
FabDate, 18 Jan 2013
UserDate, 18 Jan 2013
WaferDiameter, 0.2
DieLayout, FOUR_CROSSING
DieSize, 0.02, 0.02
Attribute, L, 5e-06
Attribute, W, 1e-05
NodeNames, d g s b
Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0
Constant, V, D, 0.1, 0.1, 0
Constant, V, B, 0, 0.1, 0
Constant, V, S, 0, 0.1, 0
Target, I, D
Function, gm, derivative (vg, id)
Plot, idvg, XY (LIN LIN), VG, ID
DataArray, ID
5.44466e-12 6.76715e-11 8.10708e-10 8.7691e-09 7.89192e-08
5.41512e-07 2.09024e-06 4.46681e-06 7.0398e-06 9.60036e-06
1.21068e-05 1.45532e-05 1.69394e-05 1.92662e-05 2.15347e-05
2.37462e-05 2.5902e-05 2.80035e-05 3.00522e-05 3.20496e-05
3.39973e-05 3.58967e-05 3.77491e-05 3.95561e-05 4.13189e-05
4.30389e-05 4.47173e-05 4.63553e-05 4.79541e-05 4.95149e-05
5.10386e-05 5.25265e-05 5.39795e-05 5.53986e-05 5.67848e-05
5.81389e-05 5.94618e-05 6.07545e-05 6.20177e-05 6.32522e-05
6.44588e-05 6.56382e-05 6.67912e-05 6.79185e-05 6.90207e-05
7.00984e-05 7.11524e-05 7.21832e-05 7.31914e-05 7.41775e-05
7.51422e-05
DataSetFinishscript_ex01.sjs — view contents
(
function ()
{
var i, myDir, numDataSets;
var dataSets = [];
var inputFileName = "script_ex01_in.uds";
var outputFileName = "script_ex01_out.uds";
myDir = Silvaco.Utmost4.openCurrentWorkingDirectory ();
dataSets = myDir.readDataSets (inputFileName);
numDataSets = dataSets.length;
for (i = 0; i < numDataSets; ++i)
dataSets[i].addFunction ("gm", "derivative (vg, id)");
myDir.saveDataSets (outputFileName, dataSets);
}
)()