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TFT_ex06.in : Insulator Trap Induced Measurement Sweep Hysteresis

TFT_ex06.in : Insulator Trap Induced Measurement Sweep Hysteresis

TFT_ex06.in : Insulator Trap Induced Measurement Sweep Hysteresis

Every software package contains a full set of examples suitable for that version and are installed with the software. If you see examples here that are not in your installation you should consider updating to a later version of the software. These examples can be used by beginners and advanced users for product evaluation, teaching purposes, and self-training.

Required Modules

Victory Process:

  • 2D Core Simulator

Victory Mesh:

  • 2D Meshing

Victory Device:

  • 2D Simulator
  • 2D TFT

This example shows the effect of measurement time on the results obtained for typical TFT DC I-V measurements. For some TFT devices, where the insulator contains traps that are within communication distance of the semiconductor channel, the time and bias dependent trapping and de-trapping events create a hysteresis effect in the IV curves. The time dependency of the insulator trapping and de-trapping events, creates a hysteresis effect, the magnitude of which depends on the time taken to take the measurements.

In order to greatly simplify the time dependency simulation of insulator trap induced effects, the device simulator has incorporated the Heiman model which is invoked by specifying the “heiman ” parameter in the inttrap statement. The Heiman model allows the simulation of insulator trap time dependency effects using simple DC solve statements. The maximum effective communication distance of the insulator traps with the semiconductor channel, is specified using the depth parameter in the “inttrap ” statement. The depth resolution of the insulator traps is specified by the hpoints parameter in the inttrap statement. Other than these Heiman related parameters, the rest of the inttrap statement is the same as a normal inttrap statement.

All that remains to take account of the measurement time dependency effects, caused by the insulator traps, is to specify the total measurement time on the solve statement. This is done using the timespan parameter on the solve statement. In this example, the “timespan ” parameter is set as a variable called measurementtime at the beginning of the Victory Device section of the input file, so that the input file can be easily modified to create a design of experiments using the measurement time as a variable.

Images

TFT_ex06_01.png

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