Standard Cell Statistical Characterization with VarMan With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining standard cell library performance. When

Statistical Analysis Flow for Analog Design with VarMan The impact of variation on analog design has become critical with the advanced nodes technology. The regular Monte Carlo approach for statistical

Variation aware design for advanced nodes and low power technologies Designers’ characterization and verification tasks have become more critical due to scaled down process technologies such as FinFET or FDSOI,