Analog Custom Design & Analysis
Design IP
SPICE Modeling
SPICE Simulation
TCAD
Variation & Yield Analysis
Machine Learning in the EDA-Specific Domain – 20 Years in the Making
Memory Statistical Characterization Solution with VarMan
Standard Cell Statistical Characterization with VarMan
Statistical Analysis Flow for Analog Design with VarMan
Variation aware design for advanced nodes and low power technologies
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Learn About Advanced TFT-Based Flat Panel Design with SmartSpice
/在： SPICE Webinars, Webinars /通过： Gigi BossMarch 23, 2023
In this webinar, we will present the benefits of adopting SmartSpice’s unique 4-terminal TFT compact model, and we describe how SmartSpice Flex Modeling technology can be used to simulate image retention issues.
Learn How TCAD is a Key Enabler for Photodiode Development
/在： TCAD Webinars, Webinars /通过： Gigi BossFebruary 23, 2023
In this webinar, Sungwon Kong will discuss these technologies and how TCAD can be broadly applied to multiple detector topology and material sets, thereby enabling multiple end-user markets.
Learn How SilTerra Uses Cello and Viola for Standard Cells and I/O Library Optimization and Characterization
/在： SIPware Webinars, Webinars /通过： Gigi BossFebruary 16, 2023
In this webinar, we will share the challenges of optimizing and validating different libraries, and demonstrate how Cello, Viola, and SmartSpice contribute in a unique and dynamic way to realize fast and accurate optimization and characterization.