Analog Custom Design & Analysis
Design IP
SPICE Modeling
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TCAD
Variation & Yield Analysis
Machine Learning in the EDA-Specific Domain – 20 Years in the Making
Memory Statistical Characterization Solution with VarMan
Standard Cell Statistical Characterization with VarMan
Statistical Analysis Flow for Analog Design with VarMan
Variation aware design for advanced nodes and low power technologies
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Learn How to Use Victory Process TCAD Geometric Etch Models in FinFET and Memory Applications
/在： TCAD Webinars, Webinars /通过： Gigi BossMay 18, 2023
In this webinar, we present geometric etch models in the context of FinFET and memory applications. We demonstrate techniques to realize fin shaping, non-ideal etch profiles (bowing, twisting), and self-aligned processes (multi-patterning).
Learn About Advanced TFT-Based Flat Panel Design with SmartSpice
/在： SPICE Webinars, Webinars /通过： Gigi BossMarch 23, 2023
In this webinar, we will present the benefits of adopting SmartSpice’s unique 4-terminal TFT compact model, and we describe how SmartSpice Flex Modeling technology can be used to simulate image retention issues.
Learn How TCAD is a Key Enabler for Photodiode Development
/在： TCAD Webinars, Webinars /通过： Gigi BossFebruary 23, 2023
In this webinar, Sungwon Kong will discuss these technologies and how TCAD can be broadly applied to multiple detector topology and material sets, thereby enabling multiple end-user markets.