Analog Custom Design & Analysis
Design IP
SPICE Modeling
SPICE Simulation
TCAD
Variation & Yield Analysis
Machine Learning in the EDA-Specific Domain – 20 Years in the Making
Memory Statistical Characterization Solution with VarMan
Standard Cell Statistical Characterization with VarMan
Statistical Analysis Flow for Analog Design with VarMan
Variation aware design for advanced nodes and low power technologies
Silvaco uses cookies to improve your user experience and to provide you with content we believe will be of interest to you. Learn detailed information on Privacy Policy. By using this website, you consent to the use of our cookies.
Accept settingsSettingsWe may request cookies to be set on your device. We use cookies to let us know when you visit our websites, how you interact with us, to enrich your user experience, and to customize your relationship with our website.
Click on the different category headings to find out more. You can also change some of your preferences. Note that blocking some types of cookies may impact your experience on our websites and the services we are able to offer.
These cookies are strictly necessary to provide you with services available through our website and to use some of its features.
Because these cookies are strictly necessary to deliver the website, refuseing them will have impact how our site functions. You always can block or delete cookies by changing your browser settings and force blocking all cookies on this website. But this will always prompt you to accept/refuse cookies when revisiting our site.
We fully respect if you want to refuse cookies but to avoid asking you again and again kindly allow us to store a cookie for that. You are free to opt out any time or opt in for other cookies to get a better experience. If you refuse cookies we will remove all set cookies in our domain.
We provide you with a list of stored cookies on your computer in our domain so you can check what we stored. Due to security reasons we are not able to show or modify cookies from other domains. You can check these in your browser security settings.
These cookies collect information that is used either in aggregate form to help us understand how our website is being used or how effective our marketing campaigns are, or to help us customize our website and application for you in order to enhance your experience.
If you do not want that we track your visit to our site you can disable tracking in your browser here:
We also use different external services like Google Webfonts, Google Maps, and external Video providers. Since these providers may collect personal data like your IP address we allow you to block them here. Please be aware that this might heavily reduce the functionality and appearance of our site. Changes will take effect once you reload the page.
Google Webfont Settings:
Google Map Settings:
Google reCaptcha Settings:
Vimeo and Youtube video embeds:
The following cookies are also needed - You can choose if you want to allow them:
You can read about our cookies and privacy settings in detail on our Privacy Policy Page.
Privacy Policy
Learn About Victory Visual, Silvaco’s New Graphical Visualization Solution for TCAD
/in TCAD Webinars, Webinars /by Gigi BossSeptember 22, 2022
In this webinar we will introduce Victory Visual, a new graphical post-processing tool for use with all Silvaco TCAD simulators and an integral part of the TCAD Victory interactive tools suite.
Learn How Victory Atomistic TCAD Solution Can Help You Succeed at Prototyping Atomistic Nanoscale Devices
/in TCAD Webinars, Webinars /by Gigi BossSeptember 8, 2022
In this webinar, we present how ultra-scaled Field-Effect Transistor (FET) technology requires simulations at the atomic scale for designing the most advanced technological architectures at 5 nm node and below. We present in detail the Victory Atomistic solution for atomistic simulations.
Learn How to Efficiently Achieve Accurate Experimental Etch Profiles in FinFET and Memory Applications with Victory TCAD Solution
/in Webinars /by Gigi BossAugust 11, 2022
In this webinar, we present these geometric etch models in the context of FinFET and memory applications. We demonstrate techniques to realize fin shaping, non-ideal etch profiles (bowing, twisting), and self-aligned processes (multi-patterning).