Analog Custom Design & Analysis
Design IP
SPICE Modeling
SPICE Simulation
TCAD
Variation & Yield Analysis
Machine Learning in the EDA-Specific Domain – 20 Years in the Making
Memory Statistical Characterization Solution with VarMan
Standard Cell Statistical Characterization with VarMan
Statistical Analysis Flow for Analog Design with VarMan
Variation aware design for advanced nodes and low power technologies
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Learn How to Efficiently Achieve Accurate Experimental Etch Profiles in FinFET and Memory Applications with Victory TCAD Solution
/in Webinars /by Gigi BossAugust 11, 2022
In this webinar, we present these geometric etch models in the context of FinFET and memory applications. We demonstrate techniques to realize fin shaping, non-ideal etch profiles (bowing, twisting), and self-aligned processes (multi-patterning).
Learn How Silvaco Flow Helps Designing and Simulating Pixel Arrays in Flat Panel Displays and Detectors
/in Webinars /by Gigi BossJune 30, 2022
In this webinar, we highlight how leading display and detector companies exploit the capabilities of Silvaco tools for schematic and layout editing, very accurate field solver-based parasitic extraction required by modern TFT technology, back-annotation of parasitic RC elements into the netlist, and fast and accurate SPICE simulations of large arrays of pixels.
How to Eliminate Image Retention Issues with SmartSpice Flex Modeling
/in Custom Webinars, SPICE Webinars, Webinars /by Gigi BossJune 9, 2022
In this webinar, we will introduce a solution to the long-standing issue in the display community of Image Retention and how to simulate this effect at the SPICE level.