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Analog Custom Design & Analysis
Design IP
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Variation & Yield Analysis
Machine Learning in the EDA-Specific Domain – 20 Years in the Making
Memory Statistical Characterization Solution with VarMan
Standard Cell Statistical Characterization with VarMan
Statistical Analysis Flow for Analog Design with VarMan
Variation aware design for advanced nodes and low power technologies
Applying Artificial Intelligence in Fab Technology Co-Optimization (FTCOTM)
/in TCAD Webinars, Webinars /by Gigi BossJuly 25, 2024
The common approach to optimize a fabrication process involves process and fab engineers creating and setting up Design of Experiments (DoEs) using a trial-and-error approach. This approach often leads to costly iterations since wafer fabrication is both expensive and time-consuming. The new approach described in this webinar, already in production use today, leverages artificial intelligence (AI) and machine learning (ML) to generate an accurate model of a fabrication step.
Learn How STMicroelectronics Silicon Carbide (SiC) Research Team uses Silvaco TCAD to Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices
/in TCAD Webinars, Webinars /by Gigi BossMarch 28, 2024
During SiC device switching operations, it is possible that devices could be reaching abnormal overload conditions, which is why some applications require “robustness” specifications (e.g., Short Circuit and UIS tests). In this webinar we will show how the impact of a short circuit of a defect localized in the active area has been investigated by means of TCAD simulations performed with Silvaco software.
GaN-based Power Devices Design and Development with Silvaco TCAD Solution
/in TCAD Webinars, Webinars /by Gigi BossFebruary 29, 2024
Physical-based simulation tools are essential for the development and insight to this new generation of wide bandgap electronic devices in FBH laboratories. In this webinar, we will give examples for the use of Silvaco TCAD simulation tools used to design, predict and analyze the electrical characterization of vertical and lateral GaN based power devices.