script_ex01 : Adding a Function to Existing Datasets
Requires: Utmost IV
Minimum Versions: Utmost IV 1.10.6.R
This example describes how to use a script to add a function to some datasets which have previously been generated.
The already measured data is contained in the script_ex01_in.uds file. When this data was measured, someone forgot to add the function to calculate the mosfet transistor transconductance to the idvg characteristic. Using a script, it is possible to correct this mistake. The Utmost IV script is shown here script_ex01.sjs.
The script file and the input data file must be saved into the directory from which you run the following command.
utmost4 -s script_ex01.sjs
When the script runs, the datasets will be read in from the input data file, then the new function will be added to each of the datasets. Finally, the datasets with the new function added will be written out to the output data file script_ex01_out.uds.
Files
script_ex01_in.uds
Utmost IV CSV Data Logfile Format Version 1 Copyright (c) 1984-2016 Silvaco, Inc. All rights reserved DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p2 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 2e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 6.579e-08 5.5956e-07 4.05282e-06 2.21062e-05 7.12745e-05 0.000142457 0.000219111 0.000295254 0.00036978 0.000442656 0.000513974 0.000583797 0.000652163 0.000719103 0.000784645 0.000848817 0.000911648 0.000973168 0.00103341 0.00109239 0.00115016 0.00120673 0.00126214 0.00131641 0.00136956 0.00142164 0.00147266 0.00152265 0.00157162 0.00161962 0.00166665 0.00171274 0.00175792 0.0018022 0.0018456 0.00188815 0.00192987 0.00197076 0.00201086 0.00205018 0.00208874 0.00212654 0.00216362 0.00219999 0.00223566 0.00227064 0.00230496 0.00233862 0.00237164 0.00240404 0.00243582 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p3 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 3e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 7.28462e-09 7.14297e-08 6.1896e-07 4.44087e-06 2.18595e-05 5.95822e-05 0.000106638 0.000155006 0.000202597 0.000249101 0.000294534 0.000338934 0.000382329 0.000424741 0.000466191 0.0005067 0.000546291 0.000584985 0.000622805 0.000659774 0.000695913 0.000731245 0.00076579 0.000799569 0.000832603 0.000864911 0.000896511 0.000927423 0.000957663 0.00098725 0.0010162 0.00104453 0.00107225 0.00109939 0.00112595 0.00115195 0.0011774 0.00120232 0.00122672 0.00125061 0.00127401 0.00129692 0.00131936 0.00134135 0.00136288 0.00138397 0.00140463 0.00142488 0.00144471 0.00146414 0.00148319 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p4 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 4e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.41701e-09 1.51223e-08 1.4722e-07 1.21519e-06 7.73149e-06 2.85842e-05 6.07036e-05 9.57e-05 0.000130551 0.000164665 0.000197983 0.000230524 0.000262307 0.000293348 0.000323664 0.00035327 0.000382182 0.000410419 0.000437997 0.000464935 0.000491249 0.000516956 0.000542073 0.000566616 0.0005906 0.000614041 0.000636953 0.000659351 0.000681249 0.000702659 0.000723596 0.00074407 0.000764095 0.000783682 0.000802843 0.000821588 0.000839928 0.000857874 0.000875435 0.000892621 0.000909441 0.000925905 0.000942021 0.000957798 0.000973244 0.000988367 0.00100318 0.00101768 0.00103187 0.00104578 0.0010594 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p5 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 5e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 4.42307e-10 4.96559e-09 5.19488e-08 4.68374e-07 3.39868e-06 1.56594e-05 3.88916e-05 6.60058e-05 9.34278e-05 0.000120345 0.000146642 0.00017232 0.000197392 0.000221871 0.000245769 0.000269099 0.000291873 0.000314106 0.000335811 0.000357004 0.000377698 0.000397907 0.000417645 0.000436923 0.000455756 0.000474156 0.000492134 0.000509702 0.000526871 0.000543653 0.000560057 0.000576094 0.000591773 0.000607105 0.000622098 0.000636761 0.000651103 0.000665132 0.000678856 0.000692283 0.00070542 0.000718275 0.000730855 0.000743167 0.000755217 0.000767012 0.000778558 0.00078986 0.000800926 0.00081176 0.000822368 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p6 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 6e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.93162e-10 2.2388e-09 2.44938e-08 2.34203e-07 1.82941e-06 9.70117e-06 2.73224e-05 4.929e-05 7.18558e-05 9.40744e-05 0.00011579 0.000136994 0.000157695 0.000177902 0.000197625 0.000216874 0.00023566 0.000253995 0.000271891 0.000289359 0.000306412 0.000323062 0.000339318 0.000355193 0.000370698 0.000385842 0.000400635 0.000415088 0.00042921 0.000443009 0.000456496 0.000469677 0.000482563 0.000495159 0.000507475 0.000519518 0.000531294 0.000542811 0.000554076 0.000565094 0.000575873 0.000586419 0.000596736 0.000606832 0.000616712 0.00062638 0.000635843 0.000645105 0.000654171 0.000663047 0.000671735 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p7 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 7e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.06232e-10 1.25725e-09 1.41553e-08 1.40772e-07 1.15112e-06 6.6655e-06 2.06174e-05 3.90095e-05 5.81637e-05 7.7076e-05 9.55689e-05 0.000113626 0.000131253 0.000148457 0.000165246 0.000181629 0.000197615 0.000213215 0.000228439 0.000243296 0.000257798 0.000271953 0.000285773 0.000299266 0.000312441 0.000325308 0.000337876 0.000350152 0.000362144 0.000373862 0.000385311 0.000396501 0.000407437 0.000418126 0.000428576 0.000438792 0.000448781 0.000458549 0.000468102 0.000477445 0.000486583 0.000495522 0.000504267 0.000512823 0.000521194 0.000529386 0.000537402 0.000545248 0.000552926 0.000560442 0.000567799 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p8 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 8e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 6.83998e-11 8.21015e-10 9.42072e-09 9.62027e-08 8.10806e-07 4.96569e-06 1.64312e-05 3.2225e-05 4.88582e-05 6.53193e-05 8.14219e-05 9.71451e-05 0.000112493 0.00012747 0.000142085 0.000156345 0.000170258 0.000183832 0.000197078 0.000210003 0.000222617 0.000234928 0.000246945 0.000258677 0.000270132 0.000281317 0.00029224 0.000302908 0.000313329 0.00032351 0.000333457 0.000343177 0.000352675 0.000361959 0.000371033 0.000379904 0.000388576 0.000397056 0.000405347 0.000413456 0.000421387 0.000429143 0.000436731 0.000444154 0.000451416 0.000458522 0.000465475 0.000472279 0.000478938 0.000485455 0.000491834 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p9 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 9e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 4.90939e-11 5.95055e-10 6.91637e-09 7.19193e-08 6.18757e-07 3.93135e-06 1.36469e-05 2.74827e-05 4.21806e-05 5.67529e-05 7.10123e-05 8.49358e-05 9.85258e-05 0.000111787 0.000124727 0.00013735 0.000149665 0.00016168 0.000173401 0.000184839 0.000195999 0.000206891 0.000217522 0.000227899 0.00023803 0.000247921 0.00025758 0.000267013 0.000276226 0.000285226 0.000294019 0.000302609 0.000311004 0.000319208 0.000327226 0.000335064 0.000342726 0.000350217 0.000357541 0.000364703 0.000371708 0.000378558 0.000385259 0.000391813 0.000398225 0.000404499 0.000410637 0.000416643 0.000422521 0.000428273 0.000433903 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x1 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 1e-06 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 3.80123e-11 4.6391e-10 5.44037e-09 5.72854e-08 4.99958e-07 3.25601e-06 1.16931e-05 2.40073e-05 3.71745e-05 5.02471e-05 6.30419e-05 7.55355e-05 8.77291e-05 9.96274e-05 0.000111235 0.000122559 0.000133606 0.000144381 0.000154894 0.00016515 0.000175157 0.000184923 0.000194454 0.000203756 0.000212837 0.000221703 0.000230359 0.000238813 0.000247069 0.000255133 0.000263011 0.000270708 0.000278228 0.000285577 0.000292759 0.000299779 0.000306641 0.000313349 0.000319908 0.000326321 0.000332593 0.000338726 0.000344725 0.000350592 0.000356332 0.000361947 0.000367441 0.000372817 0.000378077 0.000383224 0.000388262 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x10 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 1e-05 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 2.77411e-12 3.44715e-11 4.12678e-10 4.45637e-09 4.00312e-08 2.73955e-07 1.05208e-06 2.24001e-06 3.52398e-06 4.80124e-06 6.05133e-06 7.27133e-06 8.46122e-06 9.62141e-06 1.07524e-05 1.18549e-05 1.29294e-05 1.39768e-05 1.49979e-05 1.59933e-05 1.69638e-05 1.79101e-05 1.8833e-05 1.97331e-05 2.06112e-05 2.14679e-05 2.23038e-05 2.31195e-05 2.39157e-05 2.46928e-05 2.54514e-05 2.61922e-05 2.69155e-05 2.76219e-05 2.83118e-05 2.89858e-05 2.96441e-05 3.02874e-05 3.0916e-05 3.15302e-05 3.21306e-05 3.27173e-05 3.32909e-05 3.38517e-05 3.43999e-05 3.49359e-05 3.54601e-05 3.59727e-05 3.64741e-05 3.69645e-05 3.74441e-05 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x2 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 2e-06 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.32522e-11 1.64608e-10 1.97276e-09 2.13903e-08 1.93056e-07 1.32934e-06 5.17416e-06 1.11327e-05 1.76061e-05 2.40539e-05 3.03676e-05 3.65316e-05 4.25457e-05 4.84119e-05 5.41327e-05 5.97112e-05 6.51507e-05 7.04547e-05 7.5627e-05 8.06712e-05 8.5591e-05 9.039e-05 9.50717e-05 9.96396e-05 0.000104097 0.000108447 0.000112693 0.000116838 0.000120884 0.000124835 0.000128694 0.000132462 0.000136143 0.000139738 0.000143251 0.000146684 0.000150038 0.000153316 0.00015652 0.000159652 0.000162714 0.000165707 0.000168634 0.000171496 0.000174295 0.000177032 0.000179709 0.000182328 0.000184891 0.000187397 0.000189849 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x5 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 5e-06 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 5.44466e-12 6.76715e-11 8.10708e-10 8.7691e-09 7.89192e-08 5.41512e-07 2.09024e-06 4.46681e-06 7.0398e-06 9.60036e-06 1.21068e-05 1.45532e-05 1.69394e-05 1.92662e-05 2.15347e-05 2.37462e-05 2.5902e-05 2.80035e-05 3.00522e-05 3.20496e-05 3.39973e-05 3.58967e-05 3.77491e-05 3.95561e-05 4.13189e-05 4.30389e-05 4.47173e-05 4.63553e-05 4.79541e-05 4.95149e-05 5.10386e-05 5.25265e-05 5.39795e-05 5.53986e-05 5.67848e-05 5.81389e-05 5.94618e-05 6.07545e-05 6.20177e-05 6.32522e-05 6.44588e-05 6.56382e-05 6.67912e-05 6.79185e-05 6.90207e-05 7.00984e-05 7.11524e-05 7.21832e-05 7.31914e-05 7.41775e-05 7.51422e-05 DataSetFinish
script_ex01_out.uds
Utmost IV CSV Data Logfile Format Version 1 Copyright (c) 1984-2016 Silvaco, Inc. All rights reserved DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p2 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 2e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 6.579e-08 5.5956e-07 4.05282e-06 2.21062e-05 7.12745e-05 0.000142457 0.000219111 0.000295254 0.00036978 0.000442656 0.000513974 0.000583797 0.000652163 0.000719103 0.000784645 0.000848817 0.000911648 0.000973168 0.00103341 0.00109239 0.00115016 0.00120673 0.00126214 0.00131641 0.00136956 0.00142164 0.00147266 0.00152265 0.00157162 0.00161962 0.00166665 0.00171274 0.00175792 0.0018022 0.0018456 0.00188815 0.00192987 0.00197076 0.00201086 0.00205018 0.00208874 0.00212654 0.00216362 0.00219999 0.00223566 0.00227064 0.00230496 0.00233862 0.00237164 0.00240404 0.00243582 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p3 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 3e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 7.28462e-09 7.14297e-08 6.1896e-07 4.44087e-06 2.18595e-05 5.95822e-05 0.000106638 0.000155006 0.000202597 0.000249101 0.000294534 0.000338934 0.000382329 0.000424741 0.000466191 0.0005067 0.000546291 0.000584985 0.000622805 0.000659774 0.000695913 0.000731245 0.00076579 0.000799569 0.000832603 0.000864911 0.000896511 0.000927423 0.000957663 0.00098725 0.0010162 0.00104453 0.00107225 0.00109939 0.00112595 0.00115195 0.0011774 0.00120232 0.00122672 0.00125061 0.00127401 0.00129692 0.00131936 0.00134135 0.00136288 0.00138397 0.00140463 0.00142488 0.00144471 0.00146414 0.00148319 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p4 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 4e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.41701e-09 1.51223e-08 1.4722e-07 1.21519e-06 7.73149e-06 2.85842e-05 6.07036e-05 9.57e-05 0.000130551 0.000164665 0.000197983 0.000230524 0.000262307 0.000293348 0.000323664 0.00035327 0.000382182 0.000410419 0.000437997 0.000464935 0.000491249 0.000516956 0.000542073 0.000566616 0.0005906 0.000614041 0.000636953 0.000659351 0.000681249 0.000702659 0.000723596 0.00074407 0.000764095 0.000783682 0.000802843 0.000821588 0.000839928 0.000857874 0.000875435 0.000892621 0.000909441 0.000925905 0.000942021 0.000957798 0.000973244 0.000988367 0.00100318 0.00101768 0.00103187 0.00104578 0.0010594 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p5 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 5e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 4.42307e-10 4.96559e-09 5.19488e-08 4.68374e-07 3.39868e-06 1.56594e-05 3.88916e-05 6.60058e-05 9.34278e-05 0.000120345 0.000146642 0.00017232 0.000197392 0.000221871 0.000245769 0.000269099 0.000291873 0.000314106 0.000335811 0.000357004 0.000377698 0.000397907 0.000417645 0.000436923 0.000455756 0.000474156 0.000492134 0.000509702 0.000526871 0.000543653 0.000560057 0.000576094 0.000591773 0.000607105 0.000622098 0.000636761 0.000651103 0.000665132 0.000678856 0.000692283 0.00070542 0.000718275 0.000730855 0.000743167 0.000755217 0.000767012 0.000778558 0.00078986 0.000800926 0.00081176 0.000822368 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p6 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 6e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.93162e-10 2.2388e-09 2.44938e-08 2.34203e-07 1.82941e-06 9.70117e-06 2.73224e-05 4.929e-05 7.18558e-05 9.40744e-05 0.00011579 0.000136994 0.000157695 0.000177902 0.000197625 0.000216874 0.00023566 0.000253995 0.000271891 0.000289359 0.000306412 0.000323062 0.000339318 0.000355193 0.000370698 0.000385842 0.000400635 0.000415088 0.00042921 0.000443009 0.000456496 0.000469677 0.000482563 0.000495159 0.000507475 0.000519518 0.000531294 0.000542811 0.000554076 0.000565094 0.000575873 0.000586419 0.000596736 0.000606832 0.000616712 0.00062638 0.000635843 0.000645105 0.000654171 0.000663047 0.000671735 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p7 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 7e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.06232e-10 1.25725e-09 1.41553e-08 1.40772e-07 1.15112e-06 6.6655e-06 2.06174e-05 3.90095e-05 5.81637e-05 7.7076e-05 9.55689e-05 0.000113626 0.000131253 0.000148457 0.000165246 0.000181629 0.000197615 0.000213215 0.000228439 0.000243296 0.000257798 0.000271953 0.000285773 0.000299266 0.000312441 0.000325308 0.000337876 0.000350152 0.000362144 0.000373862 0.000385311 0.000396501 0.000407437 0.000418126 0.000428576 0.000438792 0.000448781 0.000458549 0.000468102 0.000477445 0.000486583 0.000495522 0.000504267 0.000512823 0.000521194 0.000529386 0.000537402 0.000545248 0.000552926 0.000560442 0.000567799 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p8 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 8e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 6.83998e-11 8.21015e-10 9.42072e-09 9.62027e-08 8.10806e-07 4.96569e-06 1.64312e-05 3.2225e-05 4.88582e-05 6.53193e-05 8.14219e-05 9.71451e-05 0.000112493 0.00012747 0.000142085 0.000156345 0.000170258 0.000183832 0.000197078 0.000210003 0.000222617 0.000234928 0.000246945 0.000258677 0.000270132 0.000281317 0.00029224 0.000302908 0.000313329 0.00032351 0.000333457 0.000343177 0.000352675 0.000361959 0.000371033 0.000379904 0.000388576 0.000397056 0.000405347 0.000413456 0.000421387 0.000429143 0.000436731 0.000444154 0.000451416 0.000458522 0.000465475 0.000472279 0.000478938 0.000485455 0.000491834 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x0p9 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 9e-07 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 4.90939e-11 5.95055e-10 6.91637e-09 7.19193e-08 6.18757e-07 3.93135e-06 1.36469e-05 2.74827e-05 4.21806e-05 5.67529e-05 7.10123e-05 8.49358e-05 9.85258e-05 0.000111787 0.000124727 0.00013735 0.000149665 0.00016168 0.000173401 0.000184839 0.000195999 0.000206891 0.000217522 0.000227899 0.00023803 0.000247921 0.00025758 0.000267013 0.000276226 0.000285226 0.000294019 0.000302609 0.000311004 0.000319208 0.000327226 0.000335064 0.000342726 0.000350217 0.000357541 0.000364703 0.000371708 0.000378558 0.000385259 0.000391813 0.000398225 0.000404499 0.000410637 0.000416643 0.000422521 0.000428273 0.000433903 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x1 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 1e-06 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 3.80123e-11 4.6391e-10 5.44037e-09 5.72854e-08 4.99958e-07 3.25601e-06 1.16931e-05 2.40073e-05 3.71745e-05 5.02471e-05 6.30419e-05 7.55355e-05 8.77291e-05 9.96274e-05 0.000111235 0.000122559 0.000133606 0.000144381 0.000154894 0.00016515 0.000175157 0.000184923 0.000194454 0.000203756 0.000212837 0.000221703 0.000230359 0.000238813 0.000247069 0.000255133 0.000263011 0.000270708 0.000278228 0.000285577 0.000292759 0.000299779 0.000306641 0.000313349 0.000319908 0.000326321 0.000332593 0.000338726 0.000344725 0.000350592 0.000356332 0.000361947 0.000367441 0.000372817 0.000378077 0.000383224 0.000388262 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x10 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 1e-05 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 2.77411e-12 3.44715e-11 4.12678e-10 4.45637e-09 4.00312e-08 2.73955e-07 1.05208e-06 2.24001e-06 3.52398e-06 4.80124e-06 6.05133e-06 7.27133e-06 8.46122e-06 9.62141e-06 1.07524e-05 1.18549e-05 1.29294e-05 1.39768e-05 1.49979e-05 1.59933e-05 1.69638e-05 1.79101e-05 1.8833e-05 1.97331e-05 2.06112e-05 2.14679e-05 2.23038e-05 2.31195e-05 2.39157e-05 2.46928e-05 2.54514e-05 2.61922e-05 2.69155e-05 2.76219e-05 2.83118e-05 2.89858e-05 2.96441e-05 3.02874e-05 3.0916e-05 3.15302e-05 3.21306e-05 3.27173e-05 3.32909e-05 3.38517e-05 3.43999e-05 3.49359e-05 3.54601e-05 3.59727e-05 3.64741e-05 3.69645e-05 3.74441e-05 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x2 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 2e-06 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 1.32522e-11 1.64608e-10 1.97276e-09 2.13903e-08 1.93056e-07 1.32934e-06 5.17416e-06 1.11327e-05 1.76061e-05 2.40539e-05 3.03676e-05 3.65316e-05 4.25457e-05 4.84119e-05 5.41327e-05 5.97112e-05 6.51507e-05 7.04547e-05 7.5627e-05 8.06712e-05 8.5591e-05 9.039e-05 9.50717e-05 9.96396e-05 0.000104097 0.000108447 0.000112693 0.000116838 0.000120884 0.000124835 0.000128694 0.000132462 0.000136143 0.000139738 0.000143251 0.000146684 0.000150038 0.000153316 0.00015652 0.000159652 0.000162714 0.000165707 0.000168634 0.000171496 0.000174295 0.000177032 0.000179709 0.000182328 0.000184891 0.000187397 0.000189849 DataSetFinish DataSetStart DataSetName, idvglin MeasurementType, DC BatchName, script01_ex01 WaferName, wafer1 DieName, x0y0 DeviceName, n10x5 Temperature, 27 FabDate, 18 Jan 2013 UserDate, 18 Jan 2013 WaferDiameter, 0.2 DieLayout, FOUR_CROSSING DieSize, 0.02, 0.02 Attribute, L, 5e-06 Attribute, W, 1e-05 NodeNames, d g s b Sweep, 1, V, G, LIN, 0, 5, 0.1, CALCULATED, 0.1, 0 Constant, V, D, 0.1, 0.1, 0 Constant, V, B, 0, 0.1, 0 Constant, V, S, 0, 0.1, 0 Target, I, D Function, gm, derivative (vg, id) Plot, idvg, XY (LIN LIN), VG, ID DataArray, ID 5.44466e-12 6.76715e-11 8.10708e-10 8.7691e-09 7.89192e-08 5.41512e-07 2.09024e-06 4.46681e-06 7.0398e-06 9.60036e-06 1.21068e-05 1.45532e-05 1.69394e-05 1.92662e-05 2.15347e-05 2.37462e-05 2.5902e-05 2.80035e-05 3.00522e-05 3.20496e-05 3.39973e-05 3.58967e-05 3.77491e-05 3.95561e-05 4.13189e-05 4.30389e-05 4.47173e-05 4.63553e-05 4.79541e-05 4.95149e-05 5.10386e-05 5.25265e-05 5.39795e-05 5.53986e-05 5.67848e-05 5.81389e-05 5.94618e-05 6.07545e-05 6.20177e-05 6.32522e-05 6.44588e-05 6.56382e-05 6.67912e-05 6.79185e-05 6.90207e-05 7.00984e-05 7.11524e-05 7.21832e-05 7.31914e-05 7.41775e-05 7.51422e-05 DataSetFinish
script_ex01.sjs
(
function ()
{
var i, myDir, numDataSets;
var dataSets = [];
var inputFileName = "script_ex01_in.uds";
var outputFileName = "script_ex01_out.uds";
myDir = Silvaco.Utmost4.openCurrentWorkingDirectory ();
dataSets = myDir.readDataSets (inputFileName);
numDataSets = dataSets.length;
for (i = 0; i < numDataSets; ++i)
dataSets[i].addFunction ("gm", "derivative (vg, id)");
myDir.saveDataSets (outputFileName, dataSets);
}
)()
Graphics