New Device Model Card Approach

Introduction

Normally a single active device model is extracted to cover a range of device geometries and temperature. Sometimes this single scalable model is not sufficient to describe all the changes in output characteristics over the range of geometry and temperature required. The total range of geometry and temperature is then broken up into regions and a model produced for each of these sub-sets of devices. This is the basis of a binned model and can lead to discontinuities at the bin boundaries as the model card is changed. To get round this problem SmartSpice has introduced a new functionality to allow the user to go back towards a single scalable model card via the use of a function rather than a single parameter value. This new powerful algorithm allows the user to specify a formula linking in other device model card parameters as so giving a continuous multi-dimensional function. This then gets round the problems of binning and gives the potential of a more accurate model fit to the device output characteristics.