실바코, 마이크론 테크놀로지와 파트너십 확대 발표
2024년 4월 16일
실바코, 글로벌 사용자 이벤트 (SURGE) 성공적으로 마무리
2023년 12월 21일
Improvement of Parasitic Capacitance Extraction Rules for Large-Scale Layout and Its Accuracy Verification Method
September 17, 2020 | 13:00 – 13:30 (JST)
The accuracy of rule-based full-chip parasitic capacitance extraction tools including Silvaco's Hipex is highly dependent on the description of the rule files.
Jivaro 기생성분 추출로 회로 시뮬레이션의 시간 단축 실현
2020년 1월 17일 | 3:00am-3:30am - (한국 시각)
Jivaro에 대한 간략한 소개 후, 더 나은 넷리스트 감소를 위해 필요한 기능과 제어 기법을 제시하여 시뮬레이션 흐름을 개선하기 위한 방법론을 살펴봅니다.
기생성분 감축
Jivaro Parasitic Reduction for Fast, Accurate Simulation
Jivaro is a unique stand-alone solution dedicated to the reduction of parasitic networks. It helps back-end verification teams speed up post-layout SPICE simulation of huge extracted parasitic circuits, while keeping high accuracy.
기생성분 감축 및 분석
Jivaro is a unique stand-alone solution dedicated to the reduction of parasitic networks. It helps back-end verification teams speed up post-layout SPICE simulation of huge extracted parasitic circuits, while keeping high accuracy.Viso analyzes the electrical properties of RC parasitic networks which crucially impact circuit behavior in nanometer processes. These impacts affect circuit gain, delay, maximum clock rate, cross-coupling, level of ESD protection and other features, which can cripple a design. Viso’s parasitics-focused approach enables quick analysis of interconnect in order to pinpoint problems. It provides timing estimation and accurate comparison of different extracted netlists.Belledonne is used for layout comparison via extracted netlist. It compares two different extracted netlists and is mainly used for layout parasitic extraction (LPE) flow qualification.
Validation of CLEVER Interconnect Parasitics with 0.18 µm Process Measurements Benoit Froment and Herve Jaouen – SGS-Thomson Microelectronics
CLEVER can perform accurate field solver extractions of resistance and capacitance from 3D structures generated from realistic process simulation. Comparison of CLEVER results with measurements made by SGS-Thomson Microelectronics were done to validate the simulator.