엔트리 Ingrid Schwarz

Simulating Redeposition During Etch Using a Monte Carlo Plasma Etch Model

The shrinking critical dimensions of modern technology place a heavy requirement on optimizing the etching of narrow mask opening. In addition the aspect ratio of etches has been increased requiring deeper etches along with the small CDs. The simulation of these process requires more advanced techniques than the directional rate-based etching found in the current versions of Elite. A more complete treatment involving calculation of the plasma distribution is required.

HINTS & TIPS – July 1998

The traditional Noise models in SPICE used two parameters (AF and KF) to model the noise level and the frequency dependency of flicker noise in MOS devices. There are three different standard models and they can be activated using the noise level selector parameter NLEV in SPICE.

UTMOST File Format Extension

Following the log file conversion tool for TonyPlot introduced with UTMOST 12.3.14.R1, new file formats have been added to UTMOST III’s printing and plotting options to make manipulating UTMOST generated data even easier.

SmartSpice v.1.5.5 Release Notes

The latest Berkeley BSIM3v3.2 model of June 16 1998 has been integrated into SmartSpice 1.5.5. The Silvaco implementation of the Berkeley BSIM3v3.2 model can be invoked by specifying the model selector LEVEL=8 and the version selector VERSION=3.2 in the .MODEL definition. This version is now used as the default BSIM3v3 model. Older BSIM3v3 models can be invoked by specifying VERSION=3.0 or VERSION=3.1.