• 技术刊物 Simulation Standard

Simulation Standard

Silvaco面向半导体工艺和器件仿真工程师推出的技术刊物

BSIM4_U ( BSIM4 Universal Routine )

This routine is a multitarget/geometry routine used to extract all kind of characteristics. There is the possibility to trace three different targets. This routine is based on full SMU definition. This definition could be done for 3 different targets grouped together in 4 different setup. It means that 12 different bias conditions can be defined. One device is associated with one setup therefore with one, two or three targets.ApplicationThis routine is a multitarget/geometry routine used to extract all kind of characteristics. There is the possibility to trace three different targets. This routine is based on full SMU definition. This definition could be done for 3 different targets grouped together in 4 different setup. It means that 12 different bias conditions can be defined. One device is associated with one setup therefore with one, two or three targets.

Measure CJSWG (CJGATE) Capacitance using UTMOST III

For the UTMOST III versions greater than 17.2.0.R, the UTMOST users can measure the CJSWG (CJGATE) capacitance using the "CJ/CJSW" routine. The CJ/CJSW routine in MOS technology has been modified to measure the CJSWG (Peripheral portion of the junction capacitance under the gate) capacitance.

Cross-Sectional Viewer in Expert

Cross-Sectional Viewer is a tool within Expert to simulate the cross sectional view of ICs along an arbitrary drawn cut-line on the layout. Cross-sectional Viewer is a link between the layout and the resulting device. It allows the designer to examine cross-sections of the device being designed. Cross-sectional drawings are useful for understanding design rules, parasitic coupling and other design and fabrication problems.

Expert: Recent Improvements in Hierarchical Layout Inspection

The functionality of several features of Expert layout editor has been enhanced to deal with hierarchical layouts in more convenient ways.

Applicability of Distance Computation for Graphs to LVS Discrepancy Analysis

An important step in electronic circuit design is layout versus schematic verification (LVS)

Expert Hints, Tips, and Solutions: Object Scripting, Layer Color Palette, Big Measurements

Q: Often I need to measure big objects. It order to position the ruler precisely I must zoom in at one end, zoom out that zoom again in at the other end. Is it possible too make this operation more convenient? For example, can I start the measurement in one window and finish it in another one?