{"id":36281,"date":"2014-03-27T16:12:35","date_gmt":"2014-03-27T16:12:35","guid":{"rendered":"https:\/\/silvaco.com\/%e6%9c%aa%e5%88%86%e7%b1%bb\/leakage-current-tcad-calibration-in-a-si-tfts\/"},"modified":"2021-10-13T10:21:12","modified_gmt":"2021-10-13T17:21:12","slug":"leakage-current-tcad-calibration-in-a-si-tfts","status":"publish","type":"post","link":"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/","title":{"rendered":"Leakage Current TCAD Calibration in a-Si TFTs"},"content":{"rendered":"<div id='template_slider'  class='avia-fullwidth-slider main_color avia-shadow   avia-builder-el-0  el_before_av_section  avia-builder-el-first   container_wrap fullsize' style=' '  ><div   data-size='no scaling'  data-lightbox_size='large'  data-animation='slide'  data-conditional_play=''  data-ids='3925'  data-video_counter='0'  data-autoplay='false'  data-bg_slider='false'  data-slide_height=''  data-handle='av_slideshow_full'  data-interval='5'  data-class=' '  data-el_id=''  data-css_id=''  data-scroll_down=''  data-control_layout='av-control-default'  data-custom_markup=''  data-perma_caption=''  data-autoplay_stopper=''  data-image_attachment=''  data-min_height='110px'  data-lazy_loading='disabled'  data-src=''  data-position='top left'  data-repeat='no-repeat'  data-attach='scroll'  data-stretch=''  class='avia-slideshow avia-slideshow-1  av-control-default av-default-height-applied avia-slideshow-no scaling av_slideshow_full   avia-slide-slider '  itemprop=\"image\" itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/ImageObject\" ><ul class='avia-slideshow-inner ' style='padding-bottom: 10.46875%;' ><li  class=' av-single-slide slide-1 ' ><div data-rel='slideshow-1' class='avia-slide-wrap '   ><div class = \"caption_fullwidth av-slideshow-caption caption_bottom\"><div class = \"container caption_container\"><div class = \"slideshow_caption\"><div class = \"slideshow_inner_caption\"><div class = \"slideshow_align_caption\"><h2  style='font-size:50px; ' class='avia-caption-title   av-small-font-size-overwrite av-small-font-size-36 av-mini-font-size-overwrite av-mini-font-size-24'  itemprop=\"name\" >Webinars<\/h2><\/div><\/div><\/div><\/div><\/div><img decoding=\"async\" class=\"wp-image-18676 avia-img-lazy-loading-not-18676\"  src=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" width=\"1920\" height=\"201\" title='Banner Blue' alt=''  itemprop=\"thumbnailUrl\"  style='min-height:110px; min-width:1051px; ' srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg 1920w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-300x31.jpg 300w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1030x108.jpg 1030w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-768x80.jpg 768w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1536x161.jpg 1536w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1500x157.jpg 1500w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-705x74.jpg 705w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-43x5.jpg 43w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-63x7.jpg 63w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-48x5.jpg 48w\" sizes=\"(max-width: 1920px) 100vw, 1920px\" \/><\/div><\/li><\/ul><\/div><\/div>\n<div id='av_section_1'  class='avia-section main_color avia-section-small avia-no-border-styling  avia-bg-style-scroll  avia-builder-el-1  el_after_av_slideshow_full  avia-builder-el-last   container_wrap fullsize' style='background-color: #ffffff;  margin-top:0px; margin-bottom:0px; '  ><div class='container' ><div class='template-page content  av-content-full alpha units'><div class='post-entry post-entry-type-page post-entry-36281'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column_table av-equal-height-column-flextable -flextable' style='margin-top:20px; margin-bottom:0px; '><div class=\"flex_column av_three_fourth  flex_column_table_cell av-equal-height-column av-align-top first  avia-builder-el-2  el_before_av_one_fourth  avia-builder-el-first  \" style='padding:0px 0px 0px 0px ; border-radius:0px; '><section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><h1>Leakage Current TCAD Calibration in a-Si TFTs<\/h1>\n<p>This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements. We will present a TCAD calibration procedure with emphasis on leakage current, which will help attendees to design and optimize a-Si TFT technology. In this webinar we will review generic and specific physical models used during TFT TCAD simulation including density of states (DOS) and band to band tunneling.<\/p>\n<h2>What attendees will learn:<\/h2>\n<ul id=\"web-bullet\">\n<li>Basic concepts of a-Si TFT TCAD simulation\n<ul id=\"web-bullet\">\n<li>Basic equations<\/li>\n<li>Physical parameters<\/li>\n<li>Density of states model<\/li>\n<\/ul>\n<\/li>\n<li>TCAD calibration procedure example\n<ul id=\"web-bullet\">\n<li>Process and Device simulations for IV curve generation<\/li>\n<li>Understanding and use of density of states models<\/li>\n<li>Understanding and use of probability of occupation function<\/li>\n<li>Correlation between density of states and current density<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<\/div><\/section><br \/>\n<div  style='background:#c7e1e5;color:#595959;border-color:#e0e0e0;' class='av_promobox  avia-button-yes   avia-builder-el-4  el_after_av_textblock  el_before_av_hr '><div class='avia-promocontent'><\/p>\n<h3>To view our webinar register to view content.<\/h3>\n<p>\n<\/div><div  class='avia-button-wrap avia-button-right ' ><a href='\/dynamicweb\/jsp\/downloads\/DownloadDocStepsAction.do?req=silen-download&amp;nm=Leakage_Current_TCAD_Calibration_in_a-Si_TFTs_imovie.mp4&amp;prefixname=video'  class='avia-button  avia-color-grey   avia-icon_select-no avia-size-medium avia-position-right '   ><span class='avia_iconbox_title' >Register to View Archive<\/span><\/a><\/div><\/div><br \/>\n<div   class='hr hr-default   avia-builder-el-5  el_after_av_promobox  el_before_av_textblock '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><h2>Presenter<\/h2>\n<\/div><\/section><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><p><img loading=\"lazy\" decoding=\"async\" class=\"alignleft wp-image-4400 size-thumbnail\" src=\"\/wp-content\/uploads\/2020\/02\/nktak1-80x80.jpg\" alt=\"\" width=\"80\" height=\"80\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/nktak1-80x80.jpg 80w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/nktak1-36x36.jpg 36w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/nktak1-180x180.jpg 180w\" sizes=\"(max-width: 80px) 100vw, 80px\" \/>Nam-Kyun Tak is a Senior TCAD Application Engineer at Silvaco. Since joining Silvaco in 2010, he has worked on TFT technology development. Prior to joining Silvaco, he worked for 6 years in Samsung Electronics, where he was involved in DRAM development.<\/p>\n<p>Nam-Kyun Tak received B.S. and M.S. degrees in electrical engineering and computer science from Kyungpook National University, Daegu, Korea.<\/p>\n<\/div><\/section><br \/>\n<div   class='hr hr-default   avia-builder-el-8  el_after_av_textblock  avia-builder-el-last '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><\/p><\/div><div class='av-flex-placeholder'><\/div><div class=\"flex_column av_one_fourth  flex_column_table_cell av-equal-height-column av-align-top   avia-builder-el-9  el_after_av_three_fourth  avia-builder-el-last  \" style='padding:0px 0px 0px 0px ; border-radius:0px; '><p><section class=\"av_textblock_section \"  id=\"date\"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><p><strong>When<\/strong>: March 6, 2014<br \/>\n<strong>Where<\/strong>: Online<br \/>\n<strong>Time<\/strong>: 10:00am-11:00am &#8211; (PST)<br \/>\n<strong>Language<\/strong>: English<\/p>\n<\/div><\/section><br \/>\n<div   class='hr hr-default   avia-builder-el-11  el_after_av_textblock  el_before_av_button '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><br \/>\n<div  class='avia-button-wrap avia-button-center  avia-builder-el-12  el_after_av_hr  el_before_av_hr ' ><a href='\/dynamicweb\/jsp\/downloads\/DownloadDocStepsAction.do?req=silen-download&amp;nm=Leakage_Current_TCAD_Calibration_in_a-Si_TFTs_imovie.mp4&amp;prefixname=video'  class='avia-button  avia-color-grey   avia-icon_select-no avia-size-small avia-position-center '   ><span class='avia_iconbox_title' >Register to View Archive<\/span><\/a><\/div><br \/>\n<div   class='hr hr-default   avia-builder-el-13  el_after_av_button  el_before_av_textblock '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><h3>WHO SHOULD ATTEND:<\/h3>\n<\/div><\/section><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><p>Academics, engineers and management looking for solutions to calibrate TCAD simulation data to measurement data of a-Si TFT devices.<\/p>\n<\/div><\/section><\/p><\/div><\/div><!--close column table wrapper. Autoclose: 1 -->\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":5,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[7729],"tags":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v24.0 (Yoast SEO v24.0) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Leakage Current TCAD Calibration in a-Si TFTs - Silvaco<\/title>\n<meta name=\"description\" content=\"This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Leakage Current TCAD Calibration in a-Si TFTs\" \/>\n<meta property=\"og:description\" content=\"This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/\" \/>\n<meta property=\"og:site_name\" content=\"Silvaco\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2014-03-27T16:12:35+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2021-10-13T17:21:12+00:00\" \/>\n<meta name=\"author\" content=\"Ingrid Schwarz\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\u4f5c\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Ingrid Schwarz\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u9884\u8ba1\u9605\u8bfb\u65f6\u95f4\" \/>\n\t<meta name=\"twitter:data2\" content=\"7 \u5206\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/\",\"url\":\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/\",\"name\":\"Leakage Current TCAD Calibration in a-Si TFTs - 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