{"id":36281,"date":"2014-03-27T16:12:35","date_gmt":"2014-03-27T16:12:35","guid":{"rendered":"https:\/\/silvaco.com\/%e6%9c%aa%e5%88%86%e7%b1%bb\/leakage-current-tcad-calibration-in-a-si-tfts\/"},"modified":"2026-10-15T15:00:16","modified_gmt":"2026-10-15T22:00:16","slug":"leakage-current-tcad-calibration-in-a-si-tfts","status":"publish","type":"post","link":"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/","title":{"rendered":"Leakage Current TCAD Calibration in a-Si TFTs"},"content":{"rendered":"<p><img fetchpriority=\"high\" decoding=\"async\" class=\"cleaned-enfold-image\" src=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" sizes=\"auto, (max-width: 1920px) 100vw, 1920px\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg 1920w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-300x31.jpg 300w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1030x108.jpg 1030w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-768x80.jpg 768w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1536x161.jpg 1536w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1500x157.jpg 1500w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-705x74.jpg 705w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-43x5.jpg 43w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-63x7.jpg 63w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-48x5.jpg 48w\" alt=\"Banner Blue\" width=\"1920\" height=\"201\" \/><\/p>\n<p>This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements. We will present a TCAD calibration procedure with emphasis on leakage current, which will help attendees to design and optimize a-Si TFT technology. In this webinar we will review generic and specific physical models used during TFT TCAD simulation including density of states (DOS) and band to band tunneling.<\/p>\n<h2>What attendees will learn:<\/h2>\n<ul id=\"web-bullet\">\n<li>Basic concepts of a-Si TFT TCAD simulation\n<ul id=\"web-bullet\">\n<li>Basic equations<\/li>\n<li>Physical parameters<\/li>\n<li>Density of states model<\/li>\n<\/ul>\n<\/li>\n<li>TCAD calibration procedure example\n<ul id=\"web-bullet\">\n<li>Process and Device simulations for IV curve generation<\/li>\n<li>Understanding and use of density of states models<\/li>\n<li>Understanding and use of probability of occupation function<\/li>\n<li>Correlation between density of states and current density<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<h3>To view our webinar register to view content.<\/h3>\n<h2>Presenter<\/h2>\n<p><img decoding=\"async\" class=\"alignleft wp-image-4400 size-thumbnail\" src=\"\/wp-content\/uploads\/2020\/02\/nktak1-80x80.jpg\" alt=\"\" width=\"80\" height=\"80\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/nktak1-80x80.jpg 80w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/nktak1-36x36.jpg 36w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/nktak1-180x180.jpg 180w\" sizes=\"(max-width: 80px) 100vw, 80px\" \/>Nam-Kyun Tak is a Senior TCAD Application Engineer at Silvaco. Since joining Silvaco in 2010, he has worked on TFT technology development. Prior to joining Silvaco, he worked for 6 years in Samsung Electronics, where he was involved in DRAM development.<\/p>\n<p>Nam-Kyun Tak received B.S. and M.S. degrees in electrical engineering and computer science from Kyungpook National University, Daegu, Korea.<\/p>\n<p><strong>When<\/strong>: March 6, 2014<br \/>\n<strong>Where<\/strong>: Online<br \/>\n<strong>Time<\/strong>: 10:00am-11:00am &#8211; (PST)<br \/>\n<strong>Language<\/strong>: English<\/p>\n<h3>WHO SHOULD ATTEND:<\/h3>\n<p>Academics, engineers and management looking for solutions to calibrate TCAD simulation data to measurement data of a-Si TFT devices.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements. We will present a TCAD calibration procedure with emphasis on leakage current, which will help attendees to design and optimize a-Si TFT technology. In this webinar we will review generic and [&hellip;]<\/p>\n","protected":false},"author":12,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"inline_featured_image":false,"footnotes":""},"categories":[7729],"tags":[],"class_list":["post-36281","post","type-post","status-publish","format-standard","hentry","category-tcad-webinars-zh-hans","entry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v28.7 (Yoast SEO v28.7) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>Leakage Current TCAD Calibration in a-Si TFTs - Silvaco<\/title>\n<meta name=\"description\" content=\"This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Leakage Current TCAD Calibration in a-Si TFTs\" \/>\n<meta property=\"og:description\" content=\"This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/leakage-current-tcad-calibration-in-a-si-tfts\/\" \/>\n<meta property=\"og:site_name\" content=\"Silvaco\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2014-03-27T16:12:35+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-10-15T22:00:16+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" \/>\n<meta name=\"author\" content=\"Casey Molver\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\u4f5c\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Casey Molver\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u9884\u8ba1\u9605\u8bfb\u65f6\u95f4\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/leakage-current-tcad-calibration-in-a-si-tfts\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/leakage-current-tcad-calibration-in-a-si-tfts\\\/\"},\"author\":{\"name\":\"Casey Molver\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/#\\\/schema\\\/person\\\/2763eb741ca5ac04477fdff50ed84c80\"},\"headline\":\"Leakage Current TCAD Calibration in a-Si TFTs\",\"datePublished\":\"2014-03-27T16:12:35+00:00\",\"dateModified\":\"2026-10-15T22:00:16+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/leakage-current-tcad-calibration-in-a-si-tfts\\\/\"},\"wordCount\":237,\"image\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/leakage-current-tcad-calibration-in-a-si-tfts\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/silvaco.com\\\/wp-content\\\/uploads\\\/2018\\\/12\\\/Webinar.jpg\",\"articleSection\":[\"TCAD Webinars\"],\"inLanguage\":\"zh-CN\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/leakage-current-tcad-calibration-in-a-si-tfts\\\/\",\"url\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/leakage-current-tcad-calibration-in-a-si-tfts\\\/\",\"name\":\"Leakage Current TCAD Calibration in a-Si TFTs - 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