{"id":36247,"date":"2015-02-17T15:41:40","date_gmt":"2015-02-17T15:41:40","guid":{"rendered":"https:\/\/silvaco.com\/%e6%9c%aa%e5%88%86%e7%b1%bb\/simulating-total-dose-prompt-dose-damaging-fluence-and-seu-using-tcad-2\/"},"modified":"2021-10-13T10:01:35","modified_gmt":"2021-10-13T17:01:35","slug":"simulating-total-dose-prompt-dose-damaging-fluence-and-seu-using-tcad-2","status":"publish","type":"post","link":"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulating-total-dose-prompt-dose-damaging-fluence-and-seu-using-tcad-2\/","title":{"rendered":"Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD"},"content":{"rendered":"<div id='template_slider'  class='avia-fullwidth-slider main_color avia-shadow   avia-builder-el-0  el_before_av_section  avia-builder-el-first   container_wrap fullsize' style=' '  ><div   data-size='no scaling'  data-lightbox_size='large'  data-animation='slide'  data-conditional_play=''  data-ids='3925'  data-video_counter='0'  data-autoplay='false'  data-bg_slider='false'  data-slide_height=''  data-handle='av_slideshow_full'  data-interval='5'  data-class=' '  data-el_id=''  data-css_id=''  data-scroll_down=''  data-control_layout='av-control-default'  data-custom_markup=''  data-perma_caption=''  data-autoplay_stopper=''  data-image_attachment=''  data-min_height='110px'  data-lazy_loading='disabled'  data-src=''  data-position='top left'  data-repeat='no-repeat'  data-attach='scroll'  data-stretch=''  class='avia-slideshow avia-slideshow-1  av-control-default av-default-height-applied avia-slideshow-no scaling av_slideshow_full   avia-slide-slider '  itemprop=\"image\" itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/ImageObject\" ><ul class='avia-slideshow-inner ' style='padding-bottom: 10.46875%;' ><li  class=' av-single-slide slide-1 ' ><div data-rel='slideshow-1' class='avia-slide-wrap '   ><div class = \"caption_fullwidth av-slideshow-caption caption_bottom\"><div class = \"container caption_container\"><div class = \"slideshow_caption\"><div class = \"slideshow_inner_caption\"><div class = \"slideshow_align_caption\"><h2  style='font-size:50px; ' class='avia-caption-title   av-small-font-size-overwrite av-small-font-size-36 av-mini-font-size-overwrite av-mini-font-size-24'  itemprop=\"name\" >Webinars<\/h2><\/div><\/div><\/div><\/div><\/div><img decoding=\"async\" class=\"wp-image-18676 avia-img-lazy-loading-not-18676\"  src=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" width=\"1920\" height=\"201\" title='Banner Blue' alt=''  itemprop=\"thumbnailUrl\"  style='min-height:110px; min-width:1051px; ' srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg 1920w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-300x31.jpg 300w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1030x108.jpg 1030w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-768x80.jpg 768w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1536x161.jpg 1536w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1500x157.jpg 1500w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-705x74.jpg 705w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-43x5.jpg 43w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-63x7.jpg 63w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-48x5.jpg 48w\" sizes=\"(max-width: 1920px) 100vw, 1920px\" \/><\/div><\/li><\/ul><\/div><\/div>\n<div id='av_section_1'  class='avia-section main_color avia-section-small avia-no-border-styling  avia-bg-style-scroll  avia-builder-el-1  el_after_av_slideshow_full  avia-builder-el-last   container_wrap fullsize' style='background-color: #ffffff;  margin-top:0px; margin-bottom:0px; '  ><div class='container' ><div class='template-page content  av-content-full alpha units'><div class='post-entry post-entry-type-page post-entry-36247'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column_table av-equal-height-column-flextable -flextable' style='margin-top:20px; margin-bottom:0px; '><div class=\"flex_column av_three_fourth  flex_column_table_cell av-equal-height-column av-align-top first  avia-builder-el-2  el_before_av_one_fourth  avia-builder-el-first  \" style='padding:0px 0px 0px 0px ; border-radius:0px; '><section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><h1>Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD<\/h1>\n<p>This webinar will provide specific approaches for simulating electronic device behavioral changes, including oxide charging and physical damage, during their exposure to four of the most common radiation environments that occur during operation in space or near any other high energy particle or photonic source. High energy particles include XRays, Gamma Rays, energetic electrons, protons or neutrons, that emanate from nuclear events and other sources. The attendees will be shown how to simulate these radiation effects on devices for both high and low dose rates, using physics based TCAD simulations.<\/p>\n<h2>What attendees will learn:<\/h2>\n<ul id=\"web-bullet\">\n<li>Introduction to a newly available and recently declassified Total Dose model<\/li>\n<li>Description of the physical mechanisms accounted for in the Total Dose Model, including radiation induced de-trapping of trapped oxide holes.<\/li>\n<li>How certain bias conditions during radiation can reduce the trapped hole concentration in radiation hardened oxides, leading to radiation induced threshold voltage recovery (this is NOT the normal &#8220;rebound&#8221; effect caused by the slow formation of interface traps).<\/li>\n<li>How to simulate a particle fluence that creates damage in the semiconductor<\/li>\n<li>How to simulate transient, very high dose rate &#8220;prompt&#8221; events.<\/li>\n<li>Simulating other, more traditional high energy Single Particle Events (SEE)<\/li>\n<li>Examples include, threshold voltage shift and inter device leakage from Total Dose oxide charging, Image Sensor Damage from a fluence of protons, Prompt Dose effects on a circuit, Single Event Burnout (SEB) of a power PiN diode, Single Event Upset (SEU) of a 22nm SRAM<\/li>\n<\/ul>\n<\/div><\/section><br \/>\n<div   class='hr hr-default   avia-builder-el-4  el_after_av_textblock  el_before_av_textblock '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><h2>Presenter<\/h2>\n<\/div><\/section><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><p><img loading=\"lazy\" decoding=\"async\" class=\"alignleft wp-image-4463 size-full\" src=\"\/wp-content\/uploads\/2020\/02\/derek1.jpg\" alt=\"\" width=\"180\" height=\"217\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/derek1.jpg 180w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/derek1-31x37.jpg 31w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/derek1-46x55.jpg 46w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/derek1-40x48.jpg 40w\" sizes=\"(max-width: 180px) 100vw, 180px\" \/>Dr. Derek Kimpton, Principal Applications Engineer at Silvaco, spent four years characterizing radiation effects on devices at Plessey Semiconductors in Lincoln, England. Whilst there he published the paper in Solid-State Electronics on a new and predictive total dose oxide charging model, that is the basis for the code implemented in Silvaco&#8217;s latest TCAD Victory Device simulator.<\/p>\n<p>Prior to his over 17 years at Silvaco, Dr. Kimpton received both a B.Sc. in Electronics and Ph.D. in GaInAs MOSFET fabrication from Kings College, London with an industrial year in the Optical Fiber division at GEC Hirst Research Center, in England. He also worked on the synthesis of silicon germanium (SiGe) by implantation of germanium as a Research Fellow at Middlesex University, England.<\/p>\n<\/div><\/section><br \/>\n<div   class='hr hr-default   avia-builder-el-7  el_after_av_textblock  avia-builder-el-last '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><\/p><\/div><div class='av-flex-placeholder'><\/div><div class=\"flex_column av_one_fourth  flex_column_table_cell av-equal-height-column av-align-top   avia-builder-el-8  el_after_av_three_fourth  avia-builder-el-last  \" style='padding:0px 0px 0px 0px ; border-radius:0px; '><p><section class=\"av_textblock_section \"  id=\"date\"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><p><strong>When<\/strong>: February 17, 2015<br \/>\n<strong>Where<\/strong>: Online<br \/>\n<strong>Time<\/strong>: 10:00am-11:00am &#8211; (PST)<br \/>\n<strong>Language<\/strong>: English<\/p>\n<\/div><\/section><br \/>\n<div   class='hr hr-default   avia-builder-el-10  el_after_av_textblock  el_before_av_button '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><br \/>\n<div  class='avia-button-wrap avia-button-center  avia-builder-el-11  el_after_av_hr  el_before_av_hr ' ><a href='\/dynamicweb\/jsp\/downloads\/DownloadDocStepsAction.do?req=silen-download&amp;nm=Simulating_Total_Dose_Prompt_Dose_Damaging_Fluence_and_SEU_using_TCAD.mp4&amp;prefixname=video'  class='avia-button  avia-color-grey   avia-icon_select-no avia-size-small avia-position-center '   ><span class='avia_iconbox_title' >Register to View Archive<\/span><\/a><\/div><br \/>\n<div   class='hr hr-default   avia-builder-el-12  el_after_av_button  el_before_av_textblock '><span class='hr-inner ' ><span class='hr-inner-style'><\/span><\/span><\/div><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><h3>WHO SHOULD ATTEND:<\/h3>\n<\/div><\/section><br \/>\n<section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><div>\n<p>All in the radiation effects community, with an interest in the simulation of radiation effects on electronic devices using physics based (TCAD) tools.<\/p>\n<\/div>\n<\/div><\/section><\/p><\/div><\/div><!--close column table wrapper. Autoclose: 1 -->\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":5,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[7729],"tags":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v24.0 (Yoast SEO v24.0) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD - Silvaco<\/title>\n<meta name=\"description\" content=\"This webinar will provide specific approaches for simulating electronic device behavioral changes, including oxide charging and physical damage\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulating-total-dose-prompt-dose-damaging-fluence-and-seu-using-tcad-2\/\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD\" \/>\n<meta property=\"og:description\" content=\"This webinar will provide specific approaches for simulating electronic device behavioral changes, including oxide charging and physical damage\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulating-total-dose-prompt-dose-damaging-fluence-and-seu-using-tcad-2\/\" \/>\n<meta property=\"og:site_name\" content=\"Silvaco\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2015-02-17T15:41:40+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2021-10-13T17:01:35+00:00\" \/>\n<meta name=\"author\" content=\"Ingrid Schwarz\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\u4f5c\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Ingrid Schwarz\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u9884\u8ba1\u9605\u8bfb\u65f6\u95f4\" \/>\n\t<meta name=\"twitter:data2\" content=\"7 \u5206\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulating-total-dose-prompt-dose-damaging-fluence-and-seu-using-tcad-2\/\",\"url\":\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulating-total-dose-prompt-dose-damaging-fluence-and-seu-using-tcad-2\/\",\"name\":\"Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD - 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