{"id":36049,"date":"2018-02-28T18:57:42","date_gmt":"2018-02-28T18:57:42","guid":{"rendered":"https:\/\/silvaco.com\/%e6%9c%aa%e5%88%86%e7%b1%bb\/standard-cell-statistical-characterization-with-varman\/"},"modified":"2026-10-15T14:59:40","modified_gmt":"2026-10-15T21:59:40","slug":"standard-cell-statistical-characterization-with-varman","status":"publish","type":"post","link":"https:\/\/silvaco.com\/zh-hans\/analog-custom-design-zh-hans\/variation-zh-hans\/variation-webinars-zh-hans\/standard-cell-statistical-characterization-with-varman\/","title":{"rendered":"Standard Cell Statistical Characterization with VarMan"},"content":{"rendered":"<p><img fetchpriority=\"high\" decoding=\"async\" class=\"cleaned-enfold-image\" src=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" sizes=\"auto, (max-width: 1920px) 100vw, 1920px\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg 1920w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-300x31.jpg 300w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1030x108.jpg 1030w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-768x80.jpg 768w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1536x161.jpg 1536w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1500x157.jpg 1500w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-705x74.jpg 705w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-43x5.jpg 43w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-63x7.jpg 63w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-48x5.jpg 48w\" alt=\"Banner Blue\" width=\"1920\" height=\"201\" \/><\/p>\n<p>With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining standard cell library performance. When combined with supply voltage and temperature variation, traditional approaches to finding 3-sigma process corners or performing 6-sigma verification becomes impractical due to the large number of simulations that are required. In this webinar we will review how VarMan, from Silvaco, addresses this problem. The VarMan suite of tools includes Fast Monte Carlo, Variability eXplorer, high-sigma Yield Estimation, high-sigma Performance Limit, and library VarMan. These unique tools greatly reduce the number of simulations required for standard cell library characterization and quality assurance, while maintaining high accuracy, which makes design and characterization in the presence of variation feasible.<\/p>\n<h2>What attendees will learn:<\/h2>\n<ul id=\"web-bullet\">\n<li>Key challenges of Standard Cell Statistical Characterization\n<ul>\n<li>Large number of process corners<\/li>\n<li>Difficulty in finding worst case conditions<\/li>\n<li>Large number of simulations required for high-sigma verification<\/li>\n<li>Situation complicated by local mismatch<\/li>\n<\/ul>\n<\/li>\n<li>Overview of statistics related to standard cell statistical characterization<\/li>\n<li>Application of VarMan to Standard Cell Library Characterization\n<ul>\n<li>Fast Monte Carlo<\/li>\n<li>Variability eXplorer<\/li>\n<li>High-sigma performance limit and yield analysis<\/li>\n<li>Library VarMan<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<h2>Presenter<\/h2>\n<p><img decoding=\"async\" class=\"alignright size-full wp-image-4231\" src=\"\/wp-content\/uploads\/2020\/02\/Prashant1.jpg\" alt=\"\" width=\"107\" height=\"157\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/Prashant1.jpg 107w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/Prashant1-25x37.jpg 25w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/Prashant1-37x55.jpg 37w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/Prashant1-33x48.jpg 33w\" sizes=\"(max-width: 107px) 100vw, 107px\" \/>Dr. Prashant Singh is an Applications Engineer with Silvaco Corporation.<br \/>\nAfter graduating with a B.Sc in Physics with Electrical Engineering at the Massachusetts Institute of Technology, Prashant Singh worked for the General Electric Company, where he completed the Edison Engineering Program, and obtained a M.Sc and Ph.D in Electrical Engineering from the Rensselaer Polytechnic Institute. After completing his Ph.D, Dr. Singh developed high speed optoelectronic components at Lucent Technologies, and high speed serial interfaces for LSI Corporation, Qlogic, Koolchip, and Invecas. Dr. Singh is currently an application engineer at Silvaco, with specializations in circuit verification and quality assurance.<\/p>\n<p><strong>When<\/strong>: February 28, 2018<br \/>\n<strong>Where<\/strong>: Online<br \/>\n<strong>Time<\/strong>: 10:00am-11:00am &#8211; (PST)<br \/>\n<strong>Language<\/strong>: English<\/p>\n<h3>WHO SHOULD ATTEND:<\/h3>\n<p>Design and verification engineers and management looking for solutions to increase the efficiency and accuracy of standard cell library characterization.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining standard cell library performance. When combined with supply voltage and temperature variation, traditional approaches to finding 3-sigma process corners or performing 6-sigma verification becomes impractical due to the large number of simulations that are required. In [&hellip;]<\/p>\n","protected":false},"author":12,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"inline_featured_image":false,"footnotes":""},"categories":[7752],"tags":[],"class_list":["post-36049","post","type-post","status-publish","format-standard","hentry","category-variation-webinars-zh-hans","entry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v28.7 (Yoast SEO v28.7) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>Standard Cell Statistical Characterization with VarMan - Silvaco<\/title>\n<meta name=\"description\" content=\"With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/zh-hans\/analog-custom-design-zh-hans\/variation-zh-hans\/variation-webinars-zh-hans\/standard-cell-statistical-characterization-with-varman\/\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Standard Cell Statistical Characterization with VarMan\" \/>\n<meta property=\"og:description\" content=\"With each new semiconductor process node, process variation, both global and local, play an increasingly significant role in determining\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/zh-hans\/analog-custom-design-zh-hans\/variation-zh-hans\/variation-webinars-zh-hans\/standard-cell-statistical-characterization-with-varman\/\" \/>\n<meta property=\"og:site_name\" content=\"Silvaco\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2018-02-28T18:57:42+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-10-15T21:59:40+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" \/>\n<meta name=\"author\" content=\"Casey Molver\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\u4f5c\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Casey Molver\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u9884\u8ba1\u9605\u8bfb\u65f6\u95f4\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/analog-custom-design-zh-hans\\\/variation-zh-hans\\\/variation-webinars-zh-hans\\\/standard-cell-statistical-characterization-with-varman\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/analog-custom-design-zh-hans\\\/variation-zh-hans\\\/variation-webinars-zh-hans\\\/standard-cell-statistical-characterization-with-varman\\\/\"},\"author\":{\"name\":\"Casey Molver\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/#\\\/schema\\\/person\\\/2763eb741ca5ac04477fdff50ed84c80\"},\"headline\":\"Standard Cell Statistical Characterization with VarMan\",\"datePublished\":\"2018-02-28T18:57:42+00:00\",\"dateModified\":\"2026-10-15T21:59:40+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/analog-custom-design-zh-hans\\\/variation-zh-hans\\\/variation-webinars-zh-hans\\\/standard-cell-statistical-characterization-with-varman\\\/\"},\"wordCount\":328,\"image\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/analog-custom-design-zh-hans\\\/variation-zh-hans\\\/variation-webinars-zh-hans\\\/standard-cell-statistical-characterization-with-varman\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/silvaco.com\\\/wp-content\\\/uploads\\\/2018\\\/12\\\/Webinar.jpg\",\"articleSection\":[\"Variation Webinars\"],\"inLanguage\":\"zh-CN\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/analog-custom-design-zh-hans\\\/variation-zh-hans\\\/variation-webinars-zh-hans\\\/standard-cell-statistical-characterization-with-varman\\\/\",\"url\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/analog-custom-design-zh-hans\\\/variation-zh-hans\\\/variation-webinars-zh-hans\\\/standard-cell-statistical-characterization-with-varman\\\/\",\"name\":\"Standard Cell Statistical Characterization with VarMan - 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