{"id":35965,"date":"2019-02-28T19:29:27","date_gmt":"2019-02-28T19:29:27","guid":{"rendered":"https:\/\/silvaco.com\/%e6%9c%aa%e5%88%86%e7%b1%bb\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\/"},"modified":"2026-10-15T15:00:59","modified_gmt":"2026-10-15T22:00:59","slug":"simulation-of-reliability-and-nbti-aging-in-mos-microelectronics","status":"publish","type":"post","link":"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\/","title":{"rendered":"Simulation of Reliability and NBTI Aging in MOS Microelectronics"},"content":{"rendered":"<p><img fetchpriority=\"high\" decoding=\"async\" class=\"cleaned-enfold-image\" src=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" sizes=\"auto, (max-width: 1920px) 100vw, 1920px\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg 1920w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-300x31.jpg 300w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1030x108.jpg 1030w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-768x80.jpg 768w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1536x161.jpg 1536w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-1500x157.jpg 1500w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-705x74.jpg 705w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-43x5.jpg 43w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-63x7.jpg 63w, https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar-48x5.jpg 48w\" alt=\"Banner Blue\" width=\"1920\" height=\"201\" \/><\/p>\n<p>The continuous scaling of semiconductor devices is a driving force in the field of microelectronics. However, this miniaturization goes hand in hand with various undesired degradation effects, which make a prediction of the MOS device operation less reliable. In particular, the Negative Bias Temperature Instability (NBTI) has attracted much industrial attention due to its severe impact on the device performance. In order to understand, predict, and reduce these degradation effects, TCAD simulations are of high importance.<\/p>\n<p>This webinar will cover several of the most prominent reliability models (available in Silvaco\u2019s TCAD tools). We will review their basic features and key parameters and discuss their correct calibration and comparison to experimental results.<\/p>\n<h2>What attendees will learn:<\/h2>\n<ul id=\"web-bullet\">\n<li>Capabilities of Silvaco\u2019s TCAD solutions for reliability issues\n<ul>\n<li>Presentation of the most important models<\/li>\n<li>Discussion of their basic features and key parameters<\/li>\n<\/ul>\n<\/li>\n<li>How to perform TCAD simulations\n<ul>\n<li>Correct setup of a reliability simulation<\/li>\n<li>Correct comparison to the experimental data<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<h2>Presenter<\/h2>\n<p><img decoding=\"async\" class=\"alignleft wp-image-4518 size-thumbnail\" src=\"\/wp-content\/uploads\/2020\/02\/wolfgang_goes1-80x80.jpg\" alt=\"\" width=\"80\" height=\"80\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/wolfgang_goes1-80x80.jpg 80w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/wolfgang_goes1-36x36.jpg 36w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/wolfgang_goes1-180x180.jpg 180w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/wolfgang_goes1-37x37.jpg 37w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/wolfgang_goes1-55x55.jpg 55w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/wolfgang_goes1-48x48.jpg 48w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/02\/wolfgang_goes1.jpg 300w\" sizes=\"(max-width: 80px) 100vw, 80px\" \/>Dr. Wolfgang Goes is a development engineer in Silvaco\u2019s TCAD Division. Since joining Silvaco in 2016, he has worked primarily on Victory Device but also on Atlas and is responsible for trapping and reliability models.<\/p>\n<p>Dr. Goes holds an MSc in Technical Physics and a PhD in Electrical Engineering, both from the TU Vienna. He continued working there as a post-doc at the Institute for Microelectronics focusing on reliability issues in microelectronic devices.<\/p>\n<p><strong>When<\/strong>: February 28, 2019<br \/>\n<strong>Where<\/strong>: Online<br \/>\n<strong>Time<\/strong>: 10:00am-11:00am &#8211; (PST)<br \/>\n<strong>Language<\/strong>: English<\/p>\n<h3>WHO SHOULD ATTEND:<\/h3>\n<p>Academics, engineers, and management interested in investigations of degradation effects in semiconductor devices.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The continuous scaling of semiconductor devices is a driving force in the field of microelectronics. However, this miniaturization goes hand in hand with various undesired degradation effects, which make a prediction of the MOS device operation less reliable. In particular, the Negative Bias Temperature Instability (NBTI) has attracted much industrial attention due to its severe [&hellip;]<\/p>\n","protected":false},"author":12,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"inline_featured_image":false,"footnotes":""},"categories":[7729],"tags":[],"class_list":["post-35965","post","type-post","status-publish","format-standard","hentry","category-tcad-webinars-zh-hans","entry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v28.7 (Yoast SEO v28.7) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>Simulation of Reliability and NBTI Aging in MOS Microelectronics - Silvaco<\/title>\n<meta name=\"description\" content=\"Simulation of Reliability and NBTI Aging in MOS Microelectronics\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\/\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Simulation of Reliability and NBTI Aging in MOS Microelectronics\" \/>\n<meta property=\"og:description\" content=\"Simulation of Reliability and NBTI Aging in MOS Microelectronics\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/zh-hans\/tcad-zh-hans\/tcad-webinars-zh-hans\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\/\" \/>\n<meta property=\"og:site_name\" content=\"Silvaco\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2019-02-28T19:29:27+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-10-15T22:00:59+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/silvaco.com\/wp-content\/uploads\/2018\/12\/Webinar.jpg\" \/>\n<meta name=\"author\" content=\"Casey Molver\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\u4f5c\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Casey Molver\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u9884\u8ba1\u9605\u8bfb\u65f6\u95f4\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\\\/\"},\"author\":{\"name\":\"Casey Molver\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/#\\\/schema\\\/person\\\/2763eb741ca5ac04477fdff50ed84c80\"},\"headline\":\"Simulation of Reliability and NBTI Aging in MOS Microelectronics\",\"datePublished\":\"2019-02-28T19:29:27+00:00\",\"dateModified\":\"2026-10-15T22:00:59+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\\\/\"},\"wordCount\":266,\"image\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/silvaco.com\\\/wp-content\\\/uploads\\\/2018\\\/12\\\/Webinar.jpg\",\"articleSection\":[\"TCAD Webinars\"],\"inLanguage\":\"zh-CN\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\\\/\",\"url\":\"https:\\\/\\\/silvaco.com\\\/zh-hans\\\/tcad-zh-hans\\\/tcad-webinars-zh-hans\\\/simulation-of-reliability-and-nbti-aging-in-mos-microelectronics\\\/\",\"name\":\"Simulation of Reliability and NBTI Aging in MOS Microelectronics - 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