{"id":38433,"date":"2022-02-01T11:40:04","date_gmt":"2022-02-01T19:40:04","guid":{"rendered":"https:\/\/silvaco.com\/%eb%b6%84%eb%a5%98%eb%90%98%ec%a7%80-%ec%95%8a%ec%9d%8c\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\/"},"modified":"2026-10-15T13:56:01","modified_gmt":"2026-10-15T20:56:01","slug":"simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode","status":"publish","type":"post","link":"https:\/\/silvaco.com\/ko\/simulation-standard-ko\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\/","title":{"rendered":"Relating Platinum Diffusion to Minority Carrier Lifetime Control in PiN Diode: Coupled TCAD Process and Device Simulation"},"content":{"rendered":"<h1>Relating Platinum Diffusion to Minority Carrier Lifetime Control in PiN Diode: Coupled TCAD Process and Device Simulation<\/h1>\n<h3><\/h3>\n<h3><strong>Introduction<\/strong><\/h3>\n<p>Platinum and gold are widely used as an effective method to control lifetime in silicon-based devices [1, 2, 3]. Platinum and gold are introduced as recombination centers to improve switching performance. Thermal diffusion is primarily used as the common method to introduce platinum or gold dopants into silicon. There is interest to better understand how the processing conditions for Pt\/Au diffusion can affect switching behavior. Control and shaping of the profile is critical to obtain optimum device performance. In this article, Silvaco Victory TCAD tools [4] [5] are used to predict the effect of platinum on a PiN diode\u2019s reverse recovery time (Trr). The simulated platinum profile from process simulation is automatically fed into the device simulator, and the relationship between platinum diffusion processing parameters and Trr is effortlessly studied.<\/p>\n<p><img loading=\"lazy\" width=\"250\" height=\"325\" src=\"https:\/\/silvaco.com\/wp-content\/uploads\/2022\/02\/Q1_SS_Feb2022_thumbnail.png\" class=\"cleaned-enfold-image\" alt=\"\" decoding=\"async\" loading=\"lazy\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2022\/02\/Q1_SS_Feb2022_thumbnail.png 250w, https:\/\/silvaco.com\/wp-content\/uploads\/2022\/02\/Q1_SS_Feb2022_thumbnail-231x300.png 231w, https:\/\/silvaco.com\/wp-content\/uploads\/2022\/02\/Q1_SS_Feb2022_thumbnail-28x37.png 28w, https:\/\/silvaco.com\/wp-content\/uploads\/2022\/02\/Q1_SS_Feb2022_thumbnail-42x55.png 42w, https:\/\/silvaco.com\/wp-content\/uploads\/2022\/02\/Q1_SS_Feb2022_thumbnail-37x48.png 37w\" sizes=\"auto, (max-width: 250px) 100vw, 250px\" \/><\/p>\n<p><a href=\"https:\/\/silvaco.com\/dynamicweb\/jsp\/downloads\/DownloadDocStepsAction.do?req=download&#038;nm=simstd_Q1_SS_Feb2022.pdf\" class=\"BGT-btn\" target=\"_blank\" rel=\"noopener noreferrer\">Download Simulation Standard<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Platinum and gold are widely used as an effective method to control lifetime in silicon-based devices [1, 2, 3]. Platinum and gold are introduced as recombination centers to improve switching performance. Thermal diffusion is primarily used as the common method to introduce platinum or gold dopants into silicon. There is interest to better understand how the processing conditions for Pt\/Au diffusion can affect switching behavior. Control and shaping of the profile is critical to obtain optimum device performance. In this article, Silvaco Victory TCAD tools [4] [5] are used to predict the effect of platinum on a PiN diode\u2019s reverse recovery time (Trr). The simulated platinum profile from process simulation is automatically fed into the device simulator, and the relationship between platinum diffusion processing parameters and Trr is effortlessly studied.<\/p>\n","protected":false},"author":8,"featured_media":47937,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"inline_featured_image":false,"footnotes":""},"categories":[7486],"tags":[],"class_list":["post-38433","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-simulation-standard-ko","entry","has-media"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v28.7 (Yoast SEO v28.7) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>Relating Platinum Diffusion to Minority Carrier Lifetime Control in PiN Diode: Coupled TCAD Process and Device Simulation - Silvaco<\/title>\n<meta name=\"description\" content=\"Platinum and gold are widely used as an effective methodto control lifetime in silicon-based devices [1, 2, 3]. Platinumand gold are introduc\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/ko\/simulation-standard-ko\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\/\" \/>\n<meta property=\"og:locale\" content=\"ko_KR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Relating Platinum Diffusion to Minority Carrier Lifetime Control in PiN Diode: Coupled TCAD Process and Device Simulation\" \/>\n<meta property=\"og:description\" content=\"Platinum and gold are widely used as an effective methodto control lifetime in silicon-based devices [1, 2, 3]. Platinumand gold are introduc\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/ko\/simulation-standard-ko\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\/\" \/>\n<meta property=\"og:site_name\" content=\"Silvaco\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2022-02-01T19:40:04+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-10-15T20:56:01+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/silvaco.com\/wp-content\/uploads\/2022\/02\/Q1_SS_Feb2022_thumbnail.png\" \/>\n\t<meta property=\"og:image:width\" content=\"250\" \/>\n\t<meta property=\"og:image:height\" content=\"325\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"author\" content=\"Gigi Boss\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\uae00\uc4f4\uc774\" \/>\n\t<meta name=\"twitter:data1\" content=\"Gigi Boss\" \/>\n\t<meta name=\"twitter:label2\" content=\"\uc608\uc0c1 \ub418\ub294 \ud310\ub3c5 \uc2dc\uac04\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/\"},\"author\":{\"name\":\"Gigi Boss\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/#\\\/schema\\\/person\\\/e59da4b32c2c3bc2d85b6ad830d40fbe\"},\"headline\":\"Relating Platinum Diffusion to Minority Carrier Lifetime Control in PiN Diode: Coupled TCAD Process and Device Simulation\",\"datePublished\":\"2022-02-01T19:40:04+00:00\",\"dateModified\":\"2026-10-15T20:56:01+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/\"},\"wordCount\":165,\"image\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/silvaco.com\\\/wp-content\\\/uploads\\\/2022\\\/02\\\/Q1_SS_Feb2022_thumbnail.png\",\"articleSection\":[\"Simulation Standard\"],\"inLanguage\":\"ko-KR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/\",\"url\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/\",\"name\":\"Relating Platinum Diffusion to Minority Carrier Lifetime Control in PiN Diode: Coupled TCAD Process and Device Simulation - Silvaco\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ko\\\/simulation-standard-ko\\\/simulation-standard-tcad-simulation-of-the-effect-of-platinum-in-silicon-pin-diode\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/silvaco.com\\\/wp-content\\\/uploads\\\/2022\\\/02\\\/Q1_SS_Feb2022_thumbnail.png\",\"datePublished\":\"2022-02-01T19:40:04+00:00\",\"dateModified\":\"2026-10-15T20:56:01+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/#\\\/schema\\\/person\\\/e59da4b32c2c3bc2d85b6ad830d40fbe\"},\"description\":\"Platinum and gold are widely used as an effective methodto control lifetime in silicon-based devices [1, 2, 3]. 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