• Utmost IV

Utmost IV Device Characterization and SPICE Modeling

Utmost IV provides an easy-to-use environment for the characterization of semiconductor devices and the generation of accurate, high-quality SPICE models, macro-models and Verilog-A models for analog, mixed-signal, and RF applications.

Introduction

As device geometries get smaller, it is increasingly critical for designers to use accurate models and control statistical variations in device processing performance. Circuit designers need models that can accurately predict device behaviors, from DC to RF. Different process technologies require a variety of models that can be quickly adapted to the unique processes. With modeling measurements taking hours or even days, measurement control software must also work with probers and instruments to allow automated measurements across various temperatures.

Silvaco’s Utmost IV is the industry’s premier solution to address these challenges for the characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Utmost IV includes the following components:

Acquisition Module

This module is used to measure physical devices directly, using various types of electrical test equipment. Datasets can also be generated from TCAD or from SPICE simulators. This is particularly useful when comparing two SPICE models or when converting from one SPICE model type to another.

Optimization Module

This module is used to extract and optimize SPICE model parameters to obtain an accurate fit between simulated and measured device characteristics. The datasets stored in the database are used as targets for the model extraction. Compact, macro (subcircuit), and Verilog-A models can be generated for all device types.

Corner and Retargeting Module

This module enables the creation of corner models and the retargeting of existing models. It allows quick model tuning based on electrical test (ET) data tables and trend plots, using flexible target and measurement setup definitions.

Script Module

This module provides a scripting interface that allows the user to write custom JavaScript-based scripts to measure, extract, optimize, and create the model.

Quick-Start Templates

Optimization templates are available for the most commonly used MOSFET, TFT, HEMT, IGBT, BJT, and diode models. These templates are designed to speed up the setup procedure, and increase the user’s productivity. This is done through an easy to follow, step-by-step project configuration, with clear instructions along the way. This feature, which requires very little modeling experience, also enhances the ease of use.

Features

  • Store your data in either the file system or in a database
  • Automated measurement and SPICE model extraction of any device type
  • Full control of all measurement conditions
  • Over 100 different measurement instruments
  • Open architecture instrument drivers can be modified or created by user
  • Extract any compact, macro-model or Verilog-A SPICE model
  • Combine direct extraction and parameter optimization techniques
  • Simulate and optimize any combination of data including extracted data values
  • Family of advanced optimizers, including machine learning optimizers
  • High-speed multi-threaded SmartSpice interface
  • Supports SmartSpice, HSPICE, Eldo, Spectre, LTSpice, and QSpice simulators
  • Verilog-A model and extraction sequence co-development platform
  • Integration with TCAD tools provides process simulation to SPICE model development flow
  • Easy data import from TCAD simulation files or competitor data files

Benefits

  • Fast and accurate automated measurement software
  • Powerful, easy-to-use device characterization tool
  • Efficient, flexible, fastest, and most powerful industry standard SPICE modeling software
  • Seamless TCAD integration for complete custom design flow from TCAD to signoff verification and acceptance
  • Available on cross-platform architecture, for both Windows and Linux

Applications

  • Device characterization, SPICE model generation
  • DTCO process optimization provides bridge between the TCAD technology development and the circuit designer

SPICE 모델 생성 자료

Isato Ogawa,Tomoharu Yokoyama,Mutsumi Kimura,
“Simulation of neural network using ferroelectric capacitor,”
IEICE Technical Report Vol.117 No.372, No.373 , Dec 2017

Dondee Navarro*, Takeshi Sano*, and Yoshiharu Furui*,
“A Sequential Model Parameter Extraction Technique for Physics-Based IGBT Compact Models,”
IEEE Transactions on Electron Devices, Vol. 60, Issue 2, pp. 580-586, Feb. 2013.
*Silvaco engineer

Masataka Miyake, Dondee Navarro*, Uwe Feldmann, Hans Juergen Mattausch, Takashi Kojima, Takaoki Ogawa, and Takashi Ueta,
“HiSIM-IGBT: A Compact Si-IGBT Model for Power Electronic Circuit Design“,
IEEE Transactions on Electron Devices, Vol. 60, Issue 2, pp. 571 – 579, Feb. 2013.
*Silvaco engineer