{"id":62637,"date":"2025-09-19T10:51:36","date_gmt":"2025-09-19T17:51:36","guid":{"rendered":"https:\/\/silvaco.com\/uncategorized\/dynamic-testing-for-power-mosfet\/"},"modified":"2026-10-15T13:53:19","modified_gmt":"2026-10-15T20:53:19","slug":"dynamic-testing-for-power-mosfet","status":"publish","type":"post","link":"https:\/\/silvaco.com\/ja\/simulation-standard\/dynamic-testing-for-power-mosfet\/","title":{"rendered":"Dynamic Testing for Power MOSFET"},"content":{"rendered":"

Dynamic Testing for Power MOSFET<\/b><\/h1>\n

Introduction<\/b><\/h3>\n

\"\"The application of device TCAD, extended to circuit analysis by means of a mixed-mode device simulation scheme, is a powerful design method to address the dynamic behavior of a power electronics module. In this paper we demonstrate the application of the Silvaco TCAD suite from the technology process to circuit analysis for a planar SiC MOSFET (DMOS).<\/p>\n

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In this paper we demonstrate the application of the Silvaco TCAD suite from the technology process to circuit analysis for a planar SiC MOSFET (DMOS).<\/p>\n","protected":false},"author":8,"featured_media":62541,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"inline_featured_image":false,"footnotes":""},"categories":[7570],"tags":[],"class_list":["post-62637","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-simulation-standard","entry","has-media"],"yoast_head":"\nDynamic Testing for Power MOSFET - Silvaco<\/title>\n<meta name=\"description\" content=\"Dynamic Testing for Power MOSFET - The application of device TCAD, extended to circuit analysis by means of a mixed-mode device simulation\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/ja\/simulation-standard\/dynamic-testing-for-power-mosfet\/\" \/>\n<meta property=\"og:locale\" content=\"ja_JP\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Dynamic Testing for Power MOSFET\" \/>\n<meta property=\"og:description\" content=\"Dynamic Testing for Power MOSFET - The application of device TCAD, extended to circuit analysis by means of a mixed-mode device simulation\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/ja\/simulation-standard\/dynamic-testing-for-power-mosfet\/\" \/>\n<meta property=\"og:site_name\" content=\"Silvaco\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2025-09-19T17:51:36+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-10-15T20:53:19+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/silvaco.com\/wp-content\/uploads\/2025\/09\/SS_Q3_SEP2025.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"250\" \/>\n\t<meta property=\"og:image:height\" content=\"318\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Gigi Boss\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\u57f7\u7b46\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Gigi Boss\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u63a8\u5b9a\u8aad\u307f\u53d6\u308a\u6642\u9593\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/simulation-standard\\\/dynamic-testing-for-power-mosfet\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/simulation-standard\\\/dynamic-testing-for-power-mosfet\\\/\"},\"author\":{\"name\":\"Gigi Boss\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/#\\\/schema\\\/person\\\/9a8ef04795e92c2c823a9515651814a0\"},\"headline\":\"Dynamic Testing for Power MOSFET\",\"datePublished\":\"2025-09-19T17:51:36+00:00\",\"dateModified\":\"2026-10-15T20:53:19+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/simulation-standard\\\/dynamic-testing-for-power-mosfet\\\/\"},\"wordCount\":74,\"image\":{\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/simulation-standard\\\/dynamic-testing-for-power-mosfet\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/silvaco.com\\\/wp-content\\\/uploads\\\/2025\\\/09\\\/SS_Q3_SEP2025.jpg\",\"articleSection\":[\"Simulation Standard\"],\"inLanguage\":\"ja\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/simulation-standard\\\/dynamic-testing-for-power-mosfet\\\/\",\"url\":\"https:\\\/\\\/silvaco.com\\\/ja\\\/simulation-standard\\\/dynamic-testing-for-power-mosfet\\\/\",\"name\":\"Dynamic Testing for Power MOSFET - 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