{"id":28956,"date":"2014-10-01T16:16:05","date_gmt":"2014-10-01T16:16:05","guid":{"rendered":"https:\/\/silvaco.com\/uncategorized\/displacement-damage\/"},"modified":"2021-07-08T18:18:30","modified_gmt":"2021-07-09T01:18:30","slug":"displacement-damage","status":"publish","type":"post","link":"https:\/\/silvaco.com\/ja\/simulation-standard\/displacement-damage\/","title":{"rendered":"Displacement Damage"},"content":{"rendered":"<div id='template_overview'  class='avia-section main_color avia-section-small avia-no-border-styling  avia-bg-style-scroll  avia-builder-el-0  el_before_av_section  avia-builder-el-first   container_wrap fullsize' style='background-color: #ffffff;  margin-top:0px; margin-bottom:0px; '  ><div class='container' ><main  role=\"main\" itemprop=\"mainContentOfPage\"  class='template-page content  av-content-full alpha units'><div class='post-entry post-entry-type-page post-entry-28956'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column_table av-equal-height-column-flextable -flextable' style='margin-top:20px; margin-bottom:0px; '><div class=\"flex_column av_three_fourth  flex_column_table_cell av-equal-height-column av-align-top first  avia-builder-el-1  el_before_av_one_fourth  avia-builder-el-first  \" style='padding:0px 0px 0px 0px ; border-radius:0px; '><section class=\"av_textblock_section \"  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/BlogPosting\" itemprop=\"blogPost\" ><div class='avia_textblock  '   itemprop=\"text\" ><h1 align=\"left\"><strong>Displacement Damage<\/strong><\/h1>\n<p>Two fundamental damage mechanisms take place when devices are exposed to particle fluences: ionization and lattice displacement or just displacement damage. Ionization has previously been addressed in other simulation standard articles. Neutrons, protons, alpha particles, heavy ions, and very high-energy photons cause lattice displacement, or just displacement damage. Particle bombardment can change the arrangement of the atoms in the crystal lattice creating lasting damage, and increase the number of\u00a0recombination (defect) centers depleting the\u00a0minority carriers and degrading the analog properties of the affected semiconductor\u00a0junctions. High dose rates of particles (particles\/area-s) can cause partial annealing (\u201chealing\u201d) of the damaged lattice, leading to a lower degree of damage than with the same doses delivered in low intensity over a longer time period.<\/p>\n<p>The displacement damage effects can vary depending on parameters such as, type of particle radiation, total dose and radiation flux, combination of types of radiation, and device operating frequency, operating voltage, actual state of the device during the instant of irradiation and intrinsic and extrinsic shielding. These issues makes thorough testing difficult, time consuming, and requiring a significant number of test samples. Silvaco\u2019s displacement damage capability with Victory Device can assist in reducing the cost of testing by pointing the way to required tests to reduce uncertainties.<\/p>\n<p>The damage associated with the collision between energetic particles and atoms within the crystal lattice is defects that can trap electrons and holes. The density of defects is represented by the equation below:<\/p>\n<\/div><\/section><\/div><div class='av-flex-placeholder'><\/div><div class=\"flex_column av_one_fourth  flex_column_table_cell av-equal-height-column av-align-top av-zero-column-padding   avia-builder-el-3  el_after_av_three_fourth  avia-builder-el-last  \" style='border-radius:0px; ' id=\"whitepaper\" ><p><div  class='avia-builder-widget-area clearfix  avia-builder-el-4  el_before_av_image  avia-builder-el-first '><div id=\"nav_menu-29\" class=\"widget clearfix widget_nav_menu\"><div class=\"menu-simulation-standard-side-menu-japanese-container\"><ul id=\"menu-simulation-standard-side-menu-japanese\" class=\"menu\"><li id=\"menu-item-26253\" class=\"menu-item menu-item-type-post_type menu-item-object-page menu-item-26253\"><a href=\"https:\/\/silvaco.com\/ja\/technical-library\/simulation-standard\/\">Simulation Standard<\/a><\/li>\n<\/ul><\/div><\/div><\/div><br \/>\n<div  class='avia-image-container  av-styling-    avia-builder-el-5  el_after_av_sidebar  el_before_av_button  avia-align-center '  itemprop=\"image\" itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/ImageObject\"  ><div class='avia-image-container-inner'><div class='avia-image-overlay-wrap'><a href=\"\/dynamicweb\/jsp\/downloads\/DownloadDocStepsAction.do?req=download&amp;nm=simstd_Q4_2014_a3.pdf\" class='avia_image' target=\"_blank\" rel=\"noopener noreferrer\"><img decoding=\"async\" width=\"232\" height=\"300\" class='wp-image-19559 avia-img-lazy-loading-not-19559 avia_image' src=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3-232x300.jpg\" alt='' title='simstd_Q4_2014_a3'  itemprop=\"thumbnailUrl\" srcset=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3-232x300.jpg 232w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3-768x994.jpg 768w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3-545x705.jpg 545w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3-29x37.jpg 29w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3-43x55.jpg 43w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3-37x48.jpg 37w, https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3.jpg 782w\" sizes=\"(max-width: 232px) 100vw, 232px\" \/><\/a><\/div><\/div><\/div><br \/>\n<div  class='avia-button-wrap avia-button-center  avia-builder-el-6  el_after_av_image  avia-builder-el-last ' ><a href='\/dynamicweb\/jsp\/downloads\/DownloadDocStepsAction.do?req=download&amp;nm=simstd_Q4_2014_a3.pdf' class='avia-button  avia-color-grey   avia-icon_select-yes-right-icon avia-size-small avia-position-center ' target=\"_blank\" rel=\"noopener noreferrer\"><span class='avia_iconbox_title' >Download Simulation Standard<\/span><span class='avia_button_icon avia_button_icon_right' aria-hidden='true' data-av_icon='\ue875' data-av_iconfont='entypo-fontello'><\/span><\/a><\/div><\/p><\/div><\/div><!--close column table wrapper. Autoclose: 1 --><\/div><\/div><\/main><!-- close content main element --><\/div><\/div><div id='av_section_2'  class='avia-section main_color avia-section-small avia-no-border-styling  avia-bg-style-scroll  avia-builder-el-7  el_after_av_section  avia-builder-el-last   container_wrap fullsize' style='background-color: #ffffff;  margin-top:0px; margin-bottom:0px; '  ><div class='container' ><div class='template-page content  av-content-full alpha units'><div class='post-entry post-entry-type-page post-entry-28956'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column_table av-equal-height-column-flextable -flextable' style='margin-top:20px; margin-bottom:0px; '><div class=\"flex_column av_one_full  flex_column_table_cell av-equal-height-column av-align-top first  avia-builder-el-8  avia-builder-el-no-sibling  \" style='padding:0px 0px 0px 0px ; border-radius:0px; '><\/div><\/div><!--close column table wrapper. Autoclose: 1 -->\n<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Two fundamental damage mechanisms take place when devices are exposed to particle fluences: ionization and lattice displacement or just displacement damage. Ionization has previously been addressed in other simulation standard articles. Neutrons, protons, alpha particles, heavy ions, and very high-energy photons cause lattice displacement, or just displacement damage. Particle bombardment can change the arrangement of the atoms in the crystal lattice creating lasting damage, and increase the number of\u00a0recombination (defect) centers depleting the\u00a0minority carriers and degrading the analog properties of the affected semiconductor\u00a0junctions. High dose rates of particles (particles\/area-s) can cause partial annealing (\u201chealing\u201d) of the damaged lattice, leading to a lower degree of damage than with the same doses delivered in low intensity over a longer time period.<\/p>\n","protected":false},"author":5,"featured_media":19559,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[7570],"tags":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v24.0 (Yoast SEO v24.0) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Displacement Damage - \u30b7\u30eb\u30d0\u30b3\u30fb\u30b8\u30e3\u30d1\u30f3 : Silvaco Japan<\/title>\n<meta name=\"description\" content=\"Two fundamental damage mechanisms take place when devices are exposed to particle fluences: ionization and lattice displacement or just displacement damage.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/silvaco.com\/ja\/simulation-standard\/displacement-damage\/\" \/>\n<meta property=\"og:locale\" content=\"ja_JP\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Displacement Damage\" \/>\n<meta property=\"og:description\" content=\"Two fundamental damage mechanisms take place when devices are exposed to particle fluences: ionization and lattice displacement or just displacement damage.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/silvaco.com\/ja\/simulation-standard\/displacement-damage\/\" \/>\n<meta property=\"og:site_name\" content=\"\u30b7\u30eb\u30d0\u30b3\u30fb\u30b8\u30e3\u30d1\u30f3 : Silvaco Japan\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SilvacoSoftware\/\" \/>\n<meta property=\"article:published_time\" content=\"2014-10-01T16:16:05+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2021-07-09T01:18:30+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/silvaco.com\/wp-content\/uploads\/2020\/03\/simstd_Q4_2014_a3.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"782\" \/>\n\t<meta property=\"og:image:height\" content=\"1012\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Ingrid Schwarz\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:creator\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:site\" content=\"@SilvacoSoftware\" \/>\n<meta name=\"twitter:label1\" content=\"\u57f7\u7b46\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Ingrid Schwarz\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u63a8\u5b9a\u8aad\u307f\u53d6\u308a\u6642\u9593\" \/>\n\t<meta name=\"twitter:data2\" content=\"5\u5206\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/silvaco.com\/ja\/simulation-standard\/displacement-damage\/\",\"url\":\"https:\/\/silvaco.com\/ja\/simulation-standard\/displacement-damage\/\",\"name\":\"Displacement Damage - 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