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simstd_Q4_2014_a3.pdfPublication Date:
Oct 01, 2014Size:
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Two fundamental damage mechanisms take place when devices are exposed to particle fluences: ionization and lattice displacement or just displacement damage. Ionization has previously been addressed in other simulation standard articles. Neutrons, protons, alpha particles, heavy ions, and very high-energy photons cause lattice displacement, or just displacement damage.Registration
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