About Gigi Boss
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Entries by Gigi Boss
How Can I Re-Use Individual Monte-Carlo 3D Implant Profiles?
June 10, 2024in Simulation Standard /by Gigi BossIt is often the case that a design of experiments (DOE) is required to optimize the performance of a particular device. Sometimes this simply means tweaking the implant dose for threshold voltage or other minor adjustments, but in other cases it can mean tweaking such things as high energy deep well implants.
Join Silvaco at DAC 2024
May 30, 2024in Uncategorized /by Gigi BossMay 30, 2024
Comparison of Models for Fluorine Effect on Dopant Diffusion in CMOS Processes
May 23, 2024in Simulation Standard /by Gigi BossRecently a new diffusion model was introduced to Victory Process: the CMOS model. This model aims at taking on the challenges brought by the specificities of CMOS device processing such as steep temperature ramps, short annealings or shallow implantations.
Silvaco Announces Pricing of Initial Public Offering
May 8, 2024in Custom News, Library News, News, SPICE News, TCAD News, Variation News /by Gigi BossMay 8, 2024
Silvaco Announces Launch of Initial Public Offering
April 29, 2024in Custom News, Modeling News, News, SIPware News, SPICE News, TCAD News, Variation News /by Gigi BossApril 30, 2024
Silvaco Announces Expanded Partnership with Micron Technology
April 16, 2024in Custom News, Foundation IP News, Library News, Modeling News, News, Parasitics+Netlist News, SIPware News, SPICE News, TCAD News, Variation News /by Gigi BossApril 16, 2024
Setting up the Wafer Orientation: Applications to Ion Implantation
April 1, 2024in Simulation Standard /by Gigi BossProperly setting the wafer orientation in Victory Process (VP) is critical for various processes such as ion implantation, etching, and deposition. For ion implantation in particular, the determination of the wafer orientation becomes crucial, given its profound impact on profile variations in channeling and non-channeling directions.
Optoelectronic Component Design for Photonic Integrated Circuits
March 11, 2024in Simulation Standard /by Gigi BossPhotonic integrated circuits (PICs) are a key enabling technology for a broad range of current and next-generation products. Combining semiconductor materials and manufacturing processes common to microelectronics with the encoding, transmission and detection of light, PICs are transforming communication in datacenters by bringing bandwidth closer to compute cores, and are accelerating emerging applications like LiDAR for autonomy and quantum computing for the future of information processing.
Learn How STMicroelectronics Silicon Carbide (SiC) Research Team uses Silvaco TCAD to Analyze the Impact of Surface Defect Dot on Short Circuit Phenomena in SiC Devices
February 27, 2024in TCAD Webinars /by Gigi Boss March 28, 2024
During SiC device switching operations, it is possible that devices could be reaching abnormal overload conditions, which is why some applications require “robustness” specifications (e.g., Short Circuit and UIS tests). In this webinar we will show how the impact of a short circuit of a defect localized in the active area has been investigated by means of TCAD simulations performed with Silvaco software.
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